Selecting optimum concepts for a system and its subsystems in the conceptual design stage involves uncertainties due to imperfect information about customer preferences (market shares), cost of the system developed from each concept, and feasibility of new technology used in the new system. When analytical relationships between system performance and system inputs or parameters are unknown in the early system development stage, one approach to quantify the goodness of a concept is to use rating scales. This paper studies the effects of variations (precisions) in rating scales and in cost estimation for evaluating the goodness of system module concepts (e.g., sub-systems, assemblies, subassemblies, and parts). This paper presents a global sensitivity analysis (GSA) in perceptual concept evaluation, three probability measures for evaluating and selecting optimum concepts in GSA, and one-set-of-factors-at-a-time GSA to identify the sets of factors that cause significant variations in concept evaluation outcomes.
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ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 4–7, 2007
Las Vegas, Nevada, USA
Conference Sponsors:
- Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4804-3
PROCEEDINGS PAPER
Sensitivity Analysis in Perceptual Evaluation of System Module Concepts
Shun Takai
,
Shun Takai
University of Missouri at Rolla, Rolla, MO
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Kosuke Ishii
Kosuke Ishii
Stanford University, Stanford, CA
Search for other works by this author on:
Shun Takai
University of Missouri at Rolla, Rolla, MO
Kosuke Ishii
Stanford University, Stanford, CA
Paper No:
DETC2007-35073, pp. 205-216; 12 pages
Published Online:
May 20, 2009
Citation
Takai, S, & Ishii, K. "Sensitivity Analysis in Perceptual Evaluation of System Module Concepts." Proceedings of the ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 3: 19th International Conference on Design Theory and Methodology; 1st International Conference on Micro- and Nanosystems; and 9th International Conference on Advanced Vehicle Tire Technologies, Parts A and B. Las Vegas, Nevada, USA. September 4–7, 2007. pp. 205-216. ASME. https://doi.org/10.1115/DETC2007-35073
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