Existing physical artifacts including sculpture, mechanical parts, and anatomical structures are commonly acquired by modern surface and volumetric scanning technologies for archival, visualization, and diagnostic purposes. While the native representations for such data are largely sufficient for visualization purposes, more advanced field simulation currently requires extensive manual conversions into simplified surface and volume meshes compatible with the traditional finite element analysis pipeline. These conversions are tedious, error-prone, and require expertise in the mesh construction process. We demonstrate automated field simulation on acquired artifacts, bypassing the difficult geometric and topological meshing problems through a meshfree paradigm based on approximate distance fields computed from the native acquired data through sampling.
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ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 4–7, 2007
Las Vegas, Nevada, USA
Conference Sponsors:
- Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4803-5
PROCEEDINGS PAPER
Scan and Solve: Acquiring the Physics of Artifacts
Michael K. Freytag,
Michael K. Freytag
University of Wisconsin at Madison, Madison, WI
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Vadim Shapiro,
Vadim Shapiro
University of Wisconsin at Madison, Madison, WI
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Igor Tsukanov
Igor Tsukanov
University of Wisconsin at Madison, Madison, WI
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Michael K. Freytag
University of Wisconsin at Madison, Madison, WI
Vadim Shapiro
University of Wisconsin at Madison, Madison, WI
Igor Tsukanov
University of Wisconsin at Madison, Madison, WI
Paper No:
DETC2007-35701, pp. 345-356; 12 pages
Published Online:
May 20, 2009
Citation
Freytag, MK, Shapiro, V, & Tsukanov, I. "Scan and Solve: Acquiring the Physics of Artifacts." Proceedings of the ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 2: 27th Computers and Information in Engineering Conference, Parts A and B. Las Vegas, Nevada, USA. September 4–7, 2007. pp. 345-356. ASME. https://doi.org/10.1115/DETC2007-35701
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