Abstract

In this paper, a two dimensional wavelet analysis using Daubechies D14 wavelets has been used to decompose an Atomic Force Microscope image of the surface of a two dimensional calibration grid. Operating the microscope in open loop mode results in image distortions due to nonlinearities of the scanning mechanism which are subsequently reduced under closed loop control. Such distortions in the image are not readily apparent even using Fourier transform techniques and may be overlooked in a routine calibration. Through an appropriate choice of sample length so that the periodicity of the grid is coincident with the bandpass cut-off of the wavelet transform, it is shown in this paper that distortions can be clearly identified in individual levels of the wavelet reconstruction.

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