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Proceedings Papers

Proceedings Volume Cover
ASME 2023 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 20–23, 2023
Boston, Massachusetts, USA
Conference Sponsors:
  • Design Engineering Division
  • Computers and Information in Engineering Division
ISBN:
978-0-7918-8729-5
In This Volume
Volume 2: 43rd Computers and Information in Engineering Conference (CIE)

Front Matter

IDETC-CIE 2023; V002T00A001https://doi.org/10.1115/DETC2023-FM2

43rd Computers and Information in Engineering Conference (CIE)

AMS: Advanced Modeling and Simulation (AMS General)

IDETC-CIE 2023; V002T02A001https://doi.org/10.1115/DETC2023-110455
IDETC-CIE 2023; V002T02A002https://doi.org/10.1115/DETC2023-111589
IDETC-CIE 2023; V002T02A003https://doi.org/10.1115/DETC2023-114851
IDETC-CIE 2023; V002T02A004https://doi.org/10.1115/DETC2023-115077
IDETC-CIE 2023; V002T02A005https://doi.org/10.1115/DETC2023-116401
IDETC-CIE 2023; V002T02A006https://doi.org/10.1115/DETC2023-116790
IDETC-CIE 2023; V002T02A007https://doi.org/10.1115/DETC2023-116989

AMS: Inverse Problems in Science and Engineering

IDETC-CIE 2023; V002T02A008https://doi.org/10.1115/DETC2023-117030
IDETC-CIE 2023; V002T02A009https://doi.org/10.1115/DETC2023-117250

AMS: Computational Multiphysics Applications

IDETC-CIE 2023; V002T02A010https://doi.org/10.1115/DETC2023-117114

AMS: Uncertainty Quantification in Simulation and Model Verification & Validation

IDETC-CIE 2023; V002T02A011https://doi.org/10.1115/DETC2023-110704
IDETC-CIE 2023; V002T02A012https://doi.org/10.1115/DETC2023-116555

AMS: Simulation in Advanced Manufacturing

IDETC-CIE 2023; V002T02A013https://doi.org/10.1115/DETC2023-115074
IDETC-CIE 2023; V002T02A014https://doi.org/10.1115/DETC2023-115261

AMS: Material Characterization Methods and Applications

IDETC-CIE 2023; V002T02A015https://doi.org/10.1115/DETC2023-115184
IDETC-CIE 2023; V002T02A016https://doi.org/10.1115/DETC2023-116824
IDETC-CIE 2023; V002T02A017https://doi.org/10.1115/DETC2023-117512

CAPPD: Computer-Aided Product and Process Development (CAPPD General)

IDETC-CIE 2023; V002T02A018https://doi.org/10.1115/DETC2023-110983
IDETC-CIE 2023; V002T02A019https://doi.org/10.1115/DETC2023-114868
IDETC-CIE 2023; V002T02A020https://doi.org/10.1115/DETC2023-115128
IDETC-CIE 2023; V002T02A021https://doi.org/10.1115/DETC2023-116347
IDETC-CIE 2023; V002T02A022https://doi.org/10.1115/DETC2023-116501
IDETC-CIE 2023; V002T02A023https://doi.org/10.1115/DETC2023-116583
IDETC-CIE 2023; V002T02A024https://doi.org/10.1115/DETC2023-116587
IDETC-CIE 2023; V002T02A025https://doi.org/10.1115/DETC2023-116742
IDETC-CIE 2023; V002T02A026https://doi.org/10.1115/DETC2023-116880
IDETC-CIE 2023; V002T02A027https://doi.org/10.1115/DETC2023-117063
IDETC-CIE 2023; V002T02A028https://doi.org/10.1115/DETC2023-117130

CAPPD: Human-in-the Loop Product Design and Automation

IDETC-CIE 2023; V002T02A029https://doi.org/10.1115/DETC2023-115282
IDETC-CIE 2023; V002T02A030https://doi.org/10.1115/DETC2023-116758
IDETC-CIE 2023; V002T02A031https://doi.org/10.1115/DETC2023-117162

CAPPD: Digital Human Modelling for Design and Manufacturing

IDETC-CIE 2023; V002T02A032https://doi.org/10.1115/DETC2023-108975
IDETC-CIE 2023; V002T02A033https://doi.org/10.1115/DETC2023-116427
IDETC-CIE 2023; V002T02A034https://doi.org/10.1115/DETC2023-116839

CAPPD: Product and Process Design Automation for Industry 4.0

IDETC-CIE 2023; V002T02A035https://doi.org/10.1115/DETC2023-116492
IDETC-CIE 2023; V002T02A036https://doi.org/10.1115/DETC2023-116674
IDETC-CIE 2023; V002T02A037https://doi.org/10.1115/DETC2023-116849
IDETC-CIE 2023; V002T02A038https://doi.org/10.1115/DETC2023-117157

CAPPD: Data-Driven Product Design and Fabrication

IDETC-CIE 2023; V002T02A039https://doi.org/10.1115/DETC2023-109720
IDETC-CIE 2023; V002T02A040https://doi.org/10.1115/DETC2023-111426
IDETC-CIE 2023; V002T02A041https://doi.org/10.1115/DETC2023-116668
IDETC-CIE 2023; V002T02A042https://doi.org/10.1115/DETC2023-116842

SEIKM: Systems Engineering Information Knowledge Management (SEIKM General)

IDETC-CIE 2023; V002T02A043https://doi.org/10.1115/DETC2023-116524
IDETC-CIE 2023; V002T02A044https://doi.org/10.1115/DETC2023-117193

SEIKM: Design Informatics

IDETC-CIE 2023; V002T02A045https://doi.org/10.1115/DETC2023-114687
IDETC-CIE 2023; V002T02A046https://doi.org/10.1115/DETC2023-114927
IDETC-CIE 2023; V002T02A047https://doi.org/10.1115/DETC2023-116352
IDETC-CIE 2023; V002T02A048https://doi.org/10.1115/DETC2023-117127

SEIKM: Systems Engineering and Complex Systems

IDETC-CIE 2023; V002T02A049https://doi.org/10.1115/DETC2023-114783
IDETC-CIE 2023; V002T02A050https://doi.org/10.1115/DETC2023-116689

SEIKM: Knowledge Capture, Reuse, and Management

IDETC-CIE 2023; V002T02A051https://doi.org/10.1115/DETC2023-108860
IDETC-CIE 2023; V002T02A052https://doi.org/10.1115/DETC2023-112226
Topics: Design
IDETC-CIE 2023; V002T02A053https://doi.org/10.1115/DETC2023-116566

SEIKM: Smart Manufacturing Informatics

IDETC-CIE 2023; V002T02A054https://doi.org/10.1115/DETC2023-109137
IDETC-CIE 2023; V002T02A055https://doi.org/10.1115/DETC2023-117184

SEIKM: Advanced Manufacturing for Bioeconomy and Circular Economy

IDETC-CIE 2023; V002T02A056https://doi.org/10.1115/DETC2023-111686
IDETC-CIE 2023; V002T02A057https://doi.org/10.1115/DETC2023-113755
Topics: Ontologies
IDETC-CIE 2023; V002T02A058https://doi.org/10.1115/DETC2023-116866
IDETC-CIE 2023; V002T02A059https://doi.org/10.1115/DETC2023-117486

VES: Designing User Experiences for Virtual Environments

IDETC-CIE 2023; V002T02A060https://doi.org/10.1115/DETC2023-109088
Topics: Design

VES: Virtual Systems for Engineering Applications

IDETC-CIE 2023; V002T02A061https://doi.org/10.1115/DETC2023-115081
IDETC-CIE 2023; V002T02A062https://doi.org/10.1115/DETC2023-115124
IDETC-CIE 2023; V002T02A063https://doi.org/10.1115/DETC2023-116561

AMS/CAPPD Joint Topic: Digital Twin: Advanced Human Modeling and Simulation in Engineering

IDETC-CIE 2023; V002T02A064https://doi.org/10.1115/DETC2023-112424
IDETC-CIE 2023; V002T02A065https://doi.org/10.1115/DETC2023-114841
IDETC-CIE 2023; V002T02A066https://doi.org/10.1115/DETC2023-114984
IDETC-CIE 2023; V002T02A067https://doi.org/10.1115/DETC2023-115207
IDETC-CIE 2023; V002T02A068https://doi.org/10.1115/DETC2023-117336

AMS/SEIKIM Joint Topic: Digital Twin Modeling and Analytics for Advanced Manufacturing

IDETC-CIE 2023; V002T02A069https://doi.org/10.1115/DETC2023-110284
IDETC-CIE 2023; V002T02A070https://doi.org/10.1115/DETC2023-114848
IDETC-CIE 2023; V002T02A071https://doi.org/10.1115/DETC2023-115242
IDETC-CIE 2023; V002T02A072https://doi.org/10.1115/DETC2023-115285
IDETC-CIE 2023; V002T02A073https://doi.org/10.1115/DETC2023-116425

AMS/SEIKIM Joint Topic: Physics-Informed Machine Learning for Design and Advanced Manufacturing

IDETC-CIE 2023; V002T02A074https://doi.org/10.1115/DETC2023-116329
IDETC-CIE 2023; V002T02A075https://doi.org/10.1115/DETC2023-116470

SEIKM-AMS: Artificial Intelligence and Machine Learning in Design and Manufacturing

IDETC-CIE 2023; V002T02A076https://doi.org/10.1115/DETC2023-114997
IDETC-CIE 2023; V002T02A077https://doi.org/10.1115/DETC2023-116337
IDETC-CIE 2023; V002T02A078https://doi.org/10.1115/DETC2023-116458

AMS-CAPPD-SEIKM: Design, Simulation and Optimization for Additive Manufacturing

IDETC-CIE 2023; V002T02A079https://doi.org/10.1115/DETC2023-114883
IDETC-CIE 2023; V002T02A080https://doi.org/10.1115/DETC2023-114953
IDETC-CIE 2023; V002T02A081https://doi.org/10.1115/DETC2023-114959
IDETC-CIE 2023; V002T02A082https://doi.org/10.1115/DETC2023-114987
IDETC-CIE 2023; V002T02A083https://doi.org/10.1115/DETC2023-116415
IDETC-CIE 2023; V002T02A084https://doi.org/10.1115/DETC2023-116710
IDETC-CIE 2023; V002T02A085https://doi.org/10.1115/DETC2023-117055
IDETC-CIE 2023; V002T02A086https://doi.org/10.1115/DETC2023-117072

AI & ML Approaches for Engineering

IDETC-CIE 2023; V002T02A087https://doi.org/10.1115/DETC2023-114624
IDETC-CIE 2023; V002T02A088https://doi.org/10.1115/DETC2023-114811
IDETC-CIE 2023; V002T02A089https://doi.org/10.1115/DETC2023-115076
IDETC-CIE 2023; V002T02A090https://doi.org/10.1115/DETC2023-115260
IDETC-CIE 2023; V002T02A091https://doi.org/10.1115/DETC2023-116483
IDETC-CIE 2023; V002T02A092https://doi.org/10.1115/DETC2023-116789
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