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Proceedings Papers

Volume 1: 37th Computers and Information in Engineering Conference

37th Computers and Information in Engineering Conference

Advanced Modeling and Simulation

IDETC-CIE 2017; V001T02A001https://doi.org/10.1115/DETC2017-67589
IDETC-CIE 2017; V001T02A002https://doi.org/10.1115/DETC2017-67593
IDETC-CIE 2017; V001T02A003https://doi.org/10.1115/DETC2017-67811
IDETC-CIE 2017; V001T02A004https://doi.org/10.1115/DETC2017-67831
IDETC-CIE 2017; V001T02A005https://doi.org/10.1115/DETC2017-68044

Computer-Aided Product and Process Development

IDETC-CIE 2017; V001T02A006https://doi.org/10.1115/DETC2017-67031
IDETC-CIE 2017; V001T02A007https://doi.org/10.1115/DETC2017-67227
IDETC-CIE 2017; V001T02A008https://doi.org/10.1115/DETC2017-67503
IDETC-CIE 2017; V001T02A009https://doi.org/10.1115/DETC2017-67564
IDETC-CIE 2017; V001T02A010https://doi.org/10.1115/DETC2017-67630
IDETC-CIE 2017; V001T02A011https://doi.org/10.1115/DETC2017-68121
IDETC-CIE 2017; V001T02A012https://doi.org/10.1115/DETC2017-68269
IDETC-CIE 2017; V001T02A013https://doi.org/10.1115/DETC2017-68390
IDETC-CIE 2017; V001T02A014https://doi.org/10.1115/DETC2017-68391

Design Informatics

IDETC-CIE 2017; V001T02A015https://doi.org/10.1115/DETC2017-67082
IDETC-CIE 2017; V001T02A016https://doi.org/10.1115/DETC2017-67427
IDETC-CIE 2017; V001T02A017https://doi.org/10.1115/DETC2017-67493
IDETC-CIE 2017; V001T02A018https://doi.org/10.1115/DETC2017-67910
IDETC-CIE 2017; V001T02A019https://doi.org/10.1115/DETC2017-68352

Design, Simulation and Optimization for Additive Manufacturing

IDETC-CIE 2017; V001T02A020https://doi.org/10.1115/DETC2017-67282
IDETC-CIE 2017; V001T02A021https://doi.org/10.1115/DETC2017-67538
IDETC-CIE 2017; V001T02A022https://doi.org/10.1115/DETC2017-67572
IDETC-CIE 2017; V001T02A023https://doi.org/10.1115/DETC2017-67591
IDETC-CIE 2017; V001T02A024https://doi.org/10.1115/DETC2017-67596
IDETC-CIE 2017; V001T02A025https://doi.org/10.1115/DETC2017-67597
IDETC-CIE 2017; V001T02A026https://doi.org/10.1115/DETC2017-67600
IDETC-CIE 2017; V001T02A027https://doi.org/10.1115/DETC2017-67633
IDETC-CIE 2017; V001T02A028https://doi.org/10.1115/DETC2017-67807
IDETC-CIE 2017; V001T02A029https://doi.org/10.1115/DETC2017-67888
IDETC-CIE 2017; V001T02A030https://doi.org/10.1115/DETC2017-68149
IDETC-CIE 2017; V001T02A031https://doi.org/10.1115/DETC2017-68157
IDETC-CIE 2017; V001T02A032https://doi.org/10.1115/DETC2017-68289
IDETC-CIE 2017; V001T02A033https://doi.org/10.1115/DETC2017-68293
IDETC-CIE 2017; V001T02A034https://doi.org/10.1115/DETC2017-68330
IDETC-CIE 2017; V001T02A035https://doi.org/10.1115/DETC2017-68446
IDETC-CIE 2017; V001T02A036https://doi.org/10.1115/DETC2017-68457

Emotional Engineering

IDETC-CIE 2017; V001T02A037https://doi.org/10.1115/DETC2017-67050
IDETC-CIE 2017; V001T02A038https://doi.org/10.1115/DETC2017-67244
IDETC-CIE 2017; V001T02A039https://doi.org/10.1115/DETC2017-67340
IDETC-CIE 2017; V001T02A040https://doi.org/10.1115/DETC2017-67435
IDETC-CIE 2017; V001T02A041https://doi.org/10.1115/DETC2017-67555
IDETC-CIE 2017; V001T02A042https://doi.org/10.1115/DETC2017-68089

Human Modeling-Methods and Applications in Engineering

IDETC-CIE 2017; V001T02A043https://doi.org/10.1115/DETC2017-67224
IDETC-CIE 2017; V001T02A044https://doi.org/10.1115/DETC2017-67452
IDETC-CIE 2017; V001T02A045https://doi.org/10.1115/DETC2017-67456
IDETC-CIE 2017; V001T02A046https://doi.org/10.1115/DETC2017-67783
IDETC-CIE 2017; V001T02A047https://doi.org/10.1115/DETC2017-67801
IDETC-CIE 2017; V001T02A048https://doi.org/10.1115/DETC2017-67901
IDETC-CIE 2017; V001T02A049https://doi.org/10.1115/DETC2017-67933
IDETC-CIE 2017; V001T02A050https://doi.org/10.1115/DETC2017-67985
IDETC-CIE 2017; V001T02A051https://doi.org/10.1115/DETC2017-68064
IDETC-CIE 2017; V001T02A052https://doi.org/10.1115/DETC2017-68151

Knowledge Capture, Reuse, and Management

IDETC-CIE 2017; V001T02A053https://doi.org/10.1115/DETC2017-67230
IDETC-CIE 2017; V001T02A054https://doi.org/10.1115/DETC2017-67511
IDETC-CIE 2017; V001T02A055https://doi.org/10.1115/DETC2017-67562
IDETC-CIE 2017; V001T02A056https://doi.org/10.1115/DETC2017-67817
IDETC-CIE 2017; V001T02A057https://doi.org/10.1115/DETC2017-67964
IDETC-CIE 2017; V001T02A058https://doi.org/10.1115/DETC2017-68024
IDETC-CIE 2017; V001T02A059https://doi.org/10.1115/DETC2017-68195
IDETC-CIE 2017; V001T02A060https://doi.org/10.1115/DETC2017-68451

Methods, Processes and Strategies

IDETC-CIE 2017; V001T02A061https://doi.org/10.1115/DETC2017-67240
IDETC-CIE 2017; V001T02A062https://doi.org/10.1115/DETC2017-67246
IDETC-CIE 2017; V001T02A063https://doi.org/10.1115/DETC2017-67560
IDETC-CIE 2017; V001T02A064https://doi.org/10.1115/DETC2017-67738
IDETC-CIE 2017; V001T02A065https://doi.org/10.1115/DETC2017-67790
IDETC-CIE 2017; V001T02A066https://doi.org/10.1115/DETC2017-67850
IDETC-CIE 2017; V001T02A067https://doi.org/10.1115/DETC2017-67878
IDETC-CIE 2017; V001T02A068https://doi.org/10.1115/DETC2017-68228

Simulation in Advanced Manufacturing

IDETC-CIE 2017; V001T02A069https://doi.org/10.1115/DETC2017-67155
IDETC-CIE 2017; V001T02A070https://doi.org/10.1115/DETC2017-67758
IDETC-CIE 2017; V001T02A071https://doi.org/10.1115/DETC2017-67839
IDETC-CIE 2017; V001T02A072https://doi.org/10.1115/DETC2017-68134
IDETC-CIE 2017; V001T02A073https://doi.org/10.1115/DETC2017-68192

Smart Manufacturing Informatics

IDETC-CIE 2017; V001T02A074https://doi.org/10.1115/DETC2017-67143
IDETC-CIE 2017; V001T02A075https://doi.org/10.1115/DETC2017-67652
IDETC-CIE 2017; V001T02A076https://doi.org/10.1115/DETC2017-67680
IDETC-CIE 2017; V001T02A077https://doi.org/10.1115/DETC2017-67987
IDETC-CIE 2017; V001T02A078https://doi.org/10.1115/DETC2017-68186

Systems Engineering

IDETC-CIE 2017; V001T02A079https://doi.org/10.1115/DETC2017-67257

Systems Engineering Information Knowledge Management

IDETC-CIE 2017; V001T02A080https://doi.org/10.1115/DETC2017-67273
IDETC-CIE 2017; V001T02A081https://doi.org/10.1115/DETC2017-67930
IDETC-CIE 2017; V001T02A082https://doi.org/10.1115/DETC2017-67983
IDETC-CIE 2017; V001T02A083https://doi.org/10.1115/DETC2017-68013
IDETC-CIE 2017; V001T02A084https://doi.org/10.1115/DETC2017-68105

Uncertainty Quantification in Simulation and Model Verification and Validation

IDETC-CIE 2017; V001T02A085https://doi.org/10.1115/DETC2017-67438
IDETC-CIE 2017; V001T02A086https://doi.org/10.1115/DETC2017-67556
IDETC-CIE 2017; V001T02A087https://doi.org/10.1115/DETC2017-68112
IDETC-CIE 2017; V001T02A088https://doi.org/10.1115/DETC2017-68416
IDETC-CIE 2017; V001T02A089https://doi.org/10.1115/DETC2017-68429

Virtual Environments and Systems

IDETC-CIE 2017; V001T02A090https://doi.org/10.1115/DETC2017-67519
IDETC-CIE 2017; V001T02A091https://doi.org/10.1115/DETC2017-67528
IDETC-CIE 2017; V001T02A092https://doi.org/10.1115/DETC2017-68231
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