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Proceedings Papers

Volume 1: 37th Computers and Information in Engineering Conference

37th Computers and Information in Engineering Conference

Advanced Modeling and Simulation

IDETC-CIE 2017; V001T02A001doi:https://doi.org/10.1115/DETC2017-67589
IDETC-CIE 2017; V001T02A002doi:https://doi.org/10.1115/DETC2017-67593
IDETC-CIE 2017; V001T02A003doi:https://doi.org/10.1115/DETC2017-67811
IDETC-CIE 2017; V001T02A004doi:https://doi.org/10.1115/DETC2017-67831
IDETC-CIE 2017; V001T02A005doi:https://doi.org/10.1115/DETC2017-68044

Computer-Aided Product and Process Development

IDETC-CIE 2017; V001T02A006doi:https://doi.org/10.1115/DETC2017-67031
IDETC-CIE 2017; V001T02A007doi:https://doi.org/10.1115/DETC2017-67227
IDETC-CIE 2017; V001T02A008doi:https://doi.org/10.1115/DETC2017-67503
IDETC-CIE 2017; V001T02A009doi:https://doi.org/10.1115/DETC2017-67564
IDETC-CIE 2017; V001T02A010doi:https://doi.org/10.1115/DETC2017-67630
IDETC-CIE 2017; V001T02A011doi:https://doi.org/10.1115/DETC2017-68121
IDETC-CIE 2017; V001T02A012doi:https://doi.org/10.1115/DETC2017-68269
IDETC-CIE 2017; V001T02A013doi:https://doi.org/10.1115/DETC2017-68390
IDETC-CIE 2017; V001T02A014doi:https://doi.org/10.1115/DETC2017-68391

Design Informatics

IDETC-CIE 2017; V001T02A015doi:https://doi.org/10.1115/DETC2017-67082
IDETC-CIE 2017; V001T02A016doi:https://doi.org/10.1115/DETC2017-67427
IDETC-CIE 2017; V001T02A017doi:https://doi.org/10.1115/DETC2017-67493
IDETC-CIE 2017; V001T02A018doi:https://doi.org/10.1115/DETC2017-67910
IDETC-CIE 2017; V001T02A019doi:https://doi.org/10.1115/DETC2017-68352

Design, Simulation and Optimization for Additive Manufacturing

IDETC-CIE 2017; V001T02A020doi:https://doi.org/10.1115/DETC2017-67282
IDETC-CIE 2017; V001T02A021doi:https://doi.org/10.1115/DETC2017-67538
IDETC-CIE 2017; V001T02A022doi:https://doi.org/10.1115/DETC2017-67572
IDETC-CIE 2017; V001T02A023doi:https://doi.org/10.1115/DETC2017-67591
IDETC-CIE 2017; V001T02A024doi:https://doi.org/10.1115/DETC2017-67596
IDETC-CIE 2017; V001T02A025doi:https://doi.org/10.1115/DETC2017-67597
IDETC-CIE 2017; V001T02A026doi:https://doi.org/10.1115/DETC2017-67600
IDETC-CIE 2017; V001T02A027doi:https://doi.org/10.1115/DETC2017-67633
IDETC-CIE 2017; V001T02A028doi:https://doi.org/10.1115/DETC2017-67807
IDETC-CIE 2017; V001T02A029doi:https://doi.org/10.1115/DETC2017-67888
IDETC-CIE 2017; V001T02A030doi:https://doi.org/10.1115/DETC2017-68149
IDETC-CIE 2017; V001T02A031doi:https://doi.org/10.1115/DETC2017-68157
IDETC-CIE 2017; V001T02A032doi:https://doi.org/10.1115/DETC2017-68289
IDETC-CIE 2017; V001T02A033doi:https://doi.org/10.1115/DETC2017-68293
IDETC-CIE 2017; V001T02A034doi:https://doi.org/10.1115/DETC2017-68330
IDETC-CIE 2017; V001T02A035doi:https://doi.org/10.1115/DETC2017-68446
IDETC-CIE 2017; V001T02A036doi:https://doi.org/10.1115/DETC2017-68457

Emotional Engineering

IDETC-CIE 2017; V001T02A037doi:https://doi.org/10.1115/DETC2017-67050
IDETC-CIE 2017; V001T02A038doi:https://doi.org/10.1115/DETC2017-67244
IDETC-CIE 2017; V001T02A039doi:https://doi.org/10.1115/DETC2017-67340
IDETC-CIE 2017; V001T02A040doi:https://doi.org/10.1115/DETC2017-67435
IDETC-CIE 2017; V001T02A041doi:https://doi.org/10.1115/DETC2017-67555
IDETC-CIE 2017; V001T02A042doi:https://doi.org/10.1115/DETC2017-68089

Human Modeling-Methods and Applications in Engineering

IDETC-CIE 2017; V001T02A043doi:https://doi.org/10.1115/DETC2017-67224
IDETC-CIE 2017; V001T02A044doi:https://doi.org/10.1115/DETC2017-67452
IDETC-CIE 2017; V001T02A045doi:https://doi.org/10.1115/DETC2017-67456
IDETC-CIE 2017; V001T02A046doi:https://doi.org/10.1115/DETC2017-67783
IDETC-CIE 2017; V001T02A047doi:https://doi.org/10.1115/DETC2017-67801
IDETC-CIE 2017; V001T02A048doi:https://doi.org/10.1115/DETC2017-67901
IDETC-CIE 2017; V001T02A049doi:https://doi.org/10.1115/DETC2017-67933
IDETC-CIE 2017; V001T02A050doi:https://doi.org/10.1115/DETC2017-67985
IDETC-CIE 2017; V001T02A051doi:https://doi.org/10.1115/DETC2017-68064
IDETC-CIE 2017; V001T02A052doi:https://doi.org/10.1115/DETC2017-68151

Knowledge Capture, Reuse, and Management

IDETC-CIE 2017; V001T02A053doi:https://doi.org/10.1115/DETC2017-67230
IDETC-CIE 2017; V001T02A054doi:https://doi.org/10.1115/DETC2017-67511
IDETC-CIE 2017; V001T02A055doi:https://doi.org/10.1115/DETC2017-67562
IDETC-CIE 2017; V001T02A056doi:https://doi.org/10.1115/DETC2017-67817
IDETC-CIE 2017; V001T02A057doi:https://doi.org/10.1115/DETC2017-67964
IDETC-CIE 2017; V001T02A058doi:https://doi.org/10.1115/DETC2017-68024
IDETC-CIE 2017; V001T02A059doi:https://doi.org/10.1115/DETC2017-68195
IDETC-CIE 2017; V001T02A060doi:https://doi.org/10.1115/DETC2017-68451

Methods, Processes and Strategies

IDETC-CIE 2017; V001T02A061doi:https://doi.org/10.1115/DETC2017-67240
IDETC-CIE 2017; V001T02A062doi:https://doi.org/10.1115/DETC2017-67246
IDETC-CIE 2017; V001T02A063doi:https://doi.org/10.1115/DETC2017-67560
IDETC-CIE 2017; V001T02A064doi:https://doi.org/10.1115/DETC2017-67738
IDETC-CIE 2017; V001T02A065doi:https://doi.org/10.1115/DETC2017-67790
IDETC-CIE 2017; V001T02A066doi:https://doi.org/10.1115/DETC2017-67850
IDETC-CIE 2017; V001T02A067doi:https://doi.org/10.1115/DETC2017-67878
IDETC-CIE 2017; V001T02A068doi:https://doi.org/10.1115/DETC2017-68228

Simulation in Advanced Manufacturing

IDETC-CIE 2017; V001T02A069doi:https://doi.org/10.1115/DETC2017-67155
IDETC-CIE 2017; V001T02A070doi:https://doi.org/10.1115/DETC2017-67758
IDETC-CIE 2017; V001T02A071doi:https://doi.org/10.1115/DETC2017-67839
IDETC-CIE 2017; V001T02A072doi:https://doi.org/10.1115/DETC2017-68134
IDETC-CIE 2017; V001T02A073doi:https://doi.org/10.1115/DETC2017-68192

Smart Manufacturing Informatics

IDETC-CIE 2017; V001T02A074doi:https://doi.org/10.1115/DETC2017-67143
IDETC-CIE 2017; V001T02A075doi:https://doi.org/10.1115/DETC2017-67652
IDETC-CIE 2017; V001T02A076doi:https://doi.org/10.1115/DETC2017-67680
IDETC-CIE 2017; V001T02A077doi:https://doi.org/10.1115/DETC2017-67987
IDETC-CIE 2017; V001T02A078doi:https://doi.org/10.1115/DETC2017-68186

Systems Engineering

IDETC-CIE 2017; V001T02A079doi:https://doi.org/10.1115/DETC2017-67257

Systems Engineering Information Knowledge Management

IDETC-CIE 2017; V001T02A080doi:https://doi.org/10.1115/DETC2017-67273
IDETC-CIE 2017; V001T02A081doi:https://doi.org/10.1115/DETC2017-67930
IDETC-CIE 2017; V001T02A082doi:https://doi.org/10.1115/DETC2017-67983
IDETC-CIE 2017; V001T02A083doi:https://doi.org/10.1115/DETC2017-68013
IDETC-CIE 2017; V001T02A084doi:https://doi.org/10.1115/DETC2017-68105

Uncertainty Quantification in Simulation and Model Verification and Validation

IDETC-CIE 2017; V001T02A085doi:https://doi.org/10.1115/DETC2017-67438
IDETC-CIE 2017; V001T02A086doi:https://doi.org/10.1115/DETC2017-67556
IDETC-CIE 2017; V001T02A087doi:https://doi.org/10.1115/DETC2017-68112
IDETC-CIE 2017; V001T02A088doi:https://doi.org/10.1115/DETC2017-68416
IDETC-CIE 2017; V001T02A089doi:https://doi.org/10.1115/DETC2017-68429

Virtual Environments and Systems

IDETC-CIE 2017; V001T02A090doi:https://doi.org/10.1115/DETC2017-67519
IDETC-CIE 2017; V001T02A091doi:https://doi.org/10.1115/DETC2017-67528
IDETC-CIE 2017; V001T02A092doi:https://doi.org/10.1115/DETC2017-68231
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