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Proceedings Papers

ASME 2013 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 4–7, 2013
Portland, Oregon, USA
Conference Sponsors:
  • Design Engineering Division
  • Computers and Information in Engineering Division
ISBN:
978-0-7918-5585-0
Volume 2A: 33rd Computers and Information in Engineering Conference

33rd Computers and Information in Engineering Conference

Advanced Modeling and Simulation

IDETC-CIE 2013; V02AT02A001doi:https://doi.org/10.1115/DETC2013-12074
IDETC-CIE 2013; V02AT02A002doi:https://doi.org/10.1115/DETC2013-12269
IDETC-CIE 2013; V02AT02A003doi:https://doi.org/10.1115/DETC2013-12393
IDETC-CIE 2013; V02AT02A004doi:https://doi.org/10.1115/DETC2013-12494
IDETC-CIE 2013; V02AT02A005doi:https://doi.org/10.1115/DETC2013-12612
IDETC-CIE 2013; V02AT02A006doi:https://doi.org/10.1115/DETC2013-12634
IDETC-CIE 2013; V02AT02A007doi:https://doi.org/10.1115/DETC2013-12656
IDETC-CIE 2013; V02AT02A008doi:https://doi.org/10.1115/DETC2013-12674
IDETC-CIE 2013; V02AT02A009doi:https://doi.org/10.1115/DETC2013-12675
IDETC-CIE 2013; V02AT02A010doi:https://doi.org/10.1115/DETC2013-12714
IDETC-CIE 2013; V02AT02A011doi:https://doi.org/10.1115/DETC2013-12731
IDETC-CIE 2013; V02AT02A012doi:https://doi.org/10.1115/DETC2013-12766
IDETC-CIE 2013; V02AT02A013doi:https://doi.org/10.1115/DETC2013-12965
IDETC-CIE 2013; V02AT02A014doi:https://doi.org/10.1115/DETC2013-13082
IDETC-CIE 2013; V02AT02A015doi:https://doi.org/10.1115/DETC2013-13480
IDETC-CIE 2013; V02AT02A016doi:https://doi.org/10.1115/DETC2013-13484
IDETC-CIE 2013; V02AT02A017doi:https://doi.org/10.1115/DETC2013-13491
IDETC-CIE 2013; V02AT02A018doi:https://doi.org/10.1115/DETC2013-13521
IDETC-CIE 2013; V02AT02A019doi:https://doi.org/10.1115/DETC2013-13716

AMS: Computational Multiphysics Applications

IDETC-CIE 2013; V02AT02A020doi:https://doi.org/10.1115/DETC2013-12112
IDETC-CIE 2013; V02AT02A021doi:https://doi.org/10.1115/DETC2013-12362
IDETC-CIE 2013; V02AT02A022doi:https://doi.org/10.1115/DETC2013-12879
IDETC-CIE 2013; V02AT02A023doi:https://doi.org/10.1115/DETC2013-13018

AMS: Material Characterization Methods and Applications

IDETC-CIE 2013; V02AT02A024doi:https://doi.org/10.1115/DETC2013-13013
IDETC-CIE 2013; V02AT02A025doi:https://doi.org/10.1115/DETC2013-13015
IDETC-CIE 2013; V02AT02A026doi:https://doi.org/10.1115/DETC2013-13136
IDETC-CIE 2013; V02AT02A027doi:https://doi.org/10.1115/DETC2013-13370

AMS: Uncertainty Quantification in Simulation and Model Verification and Validation

IDETC-CIE 2013; V02AT02A028doi:https://doi.org/10.1115/DETC2013-12740
IDETC-CIE 2013; V02AT02A029doi:https://doi.org/10.1115/DETC2013-13221
IDETC-CIE 2013; V02AT02A030doi:https://doi.org/10.1115/DETC2013-13323
IDETC-CIE 2013; V02AT02A031doi:https://doi.org/10.1115/DETC2013-13598

Computer-Aided Product and Process Development

IDETC-CIE 2013; V02AT02A032doi:https://doi.org/10.1115/DETC2013-12109
IDETC-CIE 2013; V02AT02A033doi:https://doi.org/10.1115/DETC2013-12120
Topics: Design
IDETC-CIE 2013; V02AT02A034doi:https://doi.org/10.1115/DETC2013-12250
IDETC-CIE 2013; V02AT02A035doi:https://doi.org/10.1115/DETC2013-12258
IDETC-CIE 2013; V02AT02A036doi:https://doi.org/10.1115/DETC2013-12276
IDETC-CIE 2013; V02AT02A037doi:https://doi.org/10.1115/DETC2013-12277
IDETC-CIE 2013; V02AT02A038doi:https://doi.org/10.1115/DETC2013-12279
IDETC-CIE 2013; V02AT02A039doi:https://doi.org/10.1115/DETC2013-12300
IDETC-CIE 2013; V02AT02A040doi:https://doi.org/10.1115/DETC2013-12359
IDETC-CIE 2013; V02AT02A041doi:https://doi.org/10.1115/DETC2013-12368
IDETC-CIE 2013; V02AT02A042doi:https://doi.org/10.1115/DETC2013-12391
IDETC-CIE 2013; V02AT02A043doi:https://doi.org/10.1115/DETC2013-12408
IDETC-CIE 2013; V02AT02A044doi:https://doi.org/10.1115/DETC2013-12453
IDETC-CIE 2013; V02AT02A045doi:https://doi.org/10.1115/DETC2013-12455
IDETC-CIE 2013; V02AT02A046doi:https://doi.org/10.1115/DETC2013-12467
IDETC-CIE 2013; V02AT02A047doi:https://doi.org/10.1115/DETC2013-12477
IDETC-CIE 2013; V02AT02A048doi:https://doi.org/10.1115/DETC2013-12480
IDETC-CIE 2013; V02AT02A049doi:https://doi.org/10.1115/DETC2013-12484
IDETC-CIE 2013; V02AT02A050doi:https://doi.org/10.1115/DETC2013-12504
IDETC-CIE 2013; V02AT02A051doi:https://doi.org/10.1115/DETC2013-12508
IDETC-CIE 2013; V02AT02A052doi:https://doi.org/10.1115/DETC2013-12541
IDETC-CIE 2013; V02AT02A053doi:https://doi.org/10.1115/DETC2013-12542
IDETC-CIE 2013; V02AT02A054doi:https://doi.org/10.1115/DETC2013-12560
IDETC-CIE 2013; V02AT02A055doi:https://doi.org/10.1115/DETC2013-12563
IDETC-CIE 2013; V02AT02A056doi:https://doi.org/10.1115/DETC2013-12655
IDETC-CIE 2013; V02AT02A057doi:https://doi.org/10.1115/DETC2013-12779
IDETC-CIE 2013; V02AT02A058doi:https://doi.org/10.1115/DETC2013-12807
IDETC-CIE 2013; V02AT02A059doi:https://doi.org/10.1115/DETC2013-12866
IDETC-CIE 2013; V02AT02A060doi:https://doi.org/10.1115/DETC2013-12917
IDETC-CIE 2013; V02AT02A061doi:https://doi.org/10.1115/DETC2013-12983
IDETC-CIE 2013; V02AT02A062doi:https://doi.org/10.1115/DETC2013-12994
IDETC-CIE 2013; V02AT02A063doi:https://doi.org/10.1115/DETC2013-13019
IDETC-CIE 2013; V02AT02A064doi:https://doi.org/10.1115/DETC2013-13024
IDETC-CIE 2013; V02AT02A065doi:https://doi.org/10.1115/DETC2013-13061
IDETC-CIE 2013; V02AT02A066doi:https://doi.org/10.1115/DETC2013-13073
IDETC-CIE 2013; V02AT02A067doi:https://doi.org/10.1115/DETC2013-13077
IDETC-CIE 2013; V02AT02A068doi:https://doi.org/10.1115/DETC2013-13088
IDETC-CIE 2013; V02AT02A069doi:https://doi.org/10.1115/DETC2013-13155
IDETC-CIE 2013; V02AT02A070doi:https://doi.org/10.1115/DETC2013-13242
IDETC-CIE 2013; V02AT02A071doi:https://doi.org/10.1115/DETC2013-13258
IDETC-CIE 2013; V02AT02A072doi:https://doi.org/10.1115/DETC2013-13260
IDETC-CIE 2013; V02AT02A073doi:https://doi.org/10.1115/DETC2013-13351
IDETC-CIE 2013; V02AT02A074doi:https://doi.org/10.1115/DETC2013-13453
IDETC-CIE 2013; V02AT02A075doi:https://doi.org/10.1115/DETC2013-13472
IDETC-CIE 2013; V02AT02A076doi:https://doi.org/10.1115/DETC2013-13589
IDETC-CIE 2013; V02AT02A077doi:https://doi.org/10.1115/DETC2013-13694
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