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Proceedings Papers

Volume 2: 32nd Computers and Information in Engineering Conference, Parts A and B

32nd Computers and Information in Engineering Conference

3D Interaction Techniques

IDETC-CIE 2012; 3-12doi:https://doi.org/10.1115/DETC2012-70822
IDETC-CIE 2012; 13-17doi:https://doi.org/10.1115/DETC2012-70891
IDETC-CIE 2012; 19-28doi:https://doi.org/10.1115/DETC2012-71427
IDETC-CIE 2012; 29-37doi:https://doi.org/10.1115/DETC2012-71543

Advanced Modeling and Simulation, General

IDETC-CIE 2012; 39-46doi:https://doi.org/10.1115/DETC2012-70009
IDETC-CIE 2012; 47-52doi:https://doi.org/10.1115/DETC2012-70042
IDETC-CIE 2012; 53-65doi:https://doi.org/10.1115/DETC2012-70224
IDETC-CIE 2012; 67-73doi:https://doi.org/10.1115/DETC2012-70312
IDETC-CIE 2012; 75-80doi:https://doi.org/10.1115/DETC2012-70337
IDETC-CIE 2012; 81-87doi:https://doi.org/10.1115/DETC2012-70341
IDETC-CIE 2012; 89-95doi:https://doi.org/10.1115/DETC2012-70466
IDETC-CIE 2012; 97-109doi:https://doi.org/10.1115/DETC2012-70652
IDETC-CIE 2012; 111-123doi:https://doi.org/10.1115/DETC2012-70748
IDETC-CIE 2012; 125-130doi:https://doi.org/10.1115/DETC2012-70781
IDETC-CIE 2012; 131-136doi:https://doi.org/10.1115/DETC2012-70787
IDETC-CIE 2012; 137-146doi:https://doi.org/10.1115/DETC2012-70804
IDETC-CIE 2012; 147-156doi:https://doi.org/10.1115/DETC2012-70856
IDETC-CIE 2012; 157-163doi:https://doi.org/10.1115/DETC2012-70893
IDETC-CIE 2012; 165-176doi:https://doi.org/10.1115/DETC2012-71055
IDETC-CIE 2012; 177-186doi:https://doi.org/10.1115/DETC2012-71193
IDETC-CIE 2012; 187-196doi:https://doi.org/10.1115/DETC2012-71308
IDETC-CIE 2012; 197-206doi:https://doi.org/10.1115/DETC2012-71508
IDETC-CIE 2012; 207-215doi:https://doi.org/10.1115/DETC2012-71518
IDETC-CIE 2012; 217-222doi:https://doi.org/10.1115/DETC2012-71549

Computer-Aided Product and Process Development, General

IDETC-CIE 2012; 223-230doi:https://doi.org/10.1115/DETC2012-70109
IDETC-CIE 2012; 231-236doi:https://doi.org/10.1115/DETC2012-70245
IDETC-CIE 2012; 237-246doi:https://doi.org/10.1115/DETC2012-70373
IDETC-CIE 2012; 247-255doi:https://doi.org/10.1115/DETC2012-70408
IDETC-CIE 2012; 257-265doi:https://doi.org/10.1115/DETC2012-70573
IDETC-CIE 2012; 267-275doi:https://doi.org/10.1115/DETC2012-70576
IDETC-CIE 2012; 277-286doi:https://doi.org/10.1115/DETC2012-70604
IDETC-CIE 2012; 287-296doi:https://doi.org/10.1115/DETC2012-70712
IDETC-CIE 2012; 297-306doi:https://doi.org/10.1115/DETC2012-70760
IDETC-CIE 2012; 307-313doi:https://doi.org/10.1115/DETC2012-70778
IDETC-CIE 2012; 315-328doi:https://doi.org/10.1115/DETC2012-70780
IDETC-CIE 2012; 329-338doi:https://doi.org/10.1115/DETC2012-70814
IDETC-CIE 2012; 339-347doi:https://doi.org/10.1115/DETC2012-70821
IDETC-CIE 2012; 349-356doi:https://doi.org/10.1115/DETC2012-70872
IDETC-CIE 2012; 357-366doi:https://doi.org/10.1115/DETC2012-70890
IDETC-CIE 2012; 367-374doi:https://doi.org/10.1115/DETC2012-70923
IDETC-CIE 2012; 375-382doi:https://doi.org/10.1115/DETC2012-70940
IDETC-CIE 2012; 383-392doi:https://doi.org/10.1115/DETC2012-70995
IDETC-CIE 2012; 393-402doi:https://doi.org/10.1115/DETC2012-71118
IDETC-CIE 2012; 403-409doi:https://doi.org/10.1115/DETC2012-71133
IDETC-CIE 2012; 411-424doi:https://doi.org/10.1115/DETC2012-71483
IDETC-CIE 2012; 425-437doi:https://doi.org/10.1115/DETC2012-71523
IDETC-CIE 2012; 439-447doi:https://doi.org/10.1115/DETC2012-71548

Computer-Aided Tolerance Analysis

IDETC-CIE 2012; 449-459doi:https://doi.org/10.1115/DETC2012-70398
IDETC-CIE 2012; 461-468doi:https://doi.org/10.1115/DETC2012-71369
IDETC-CIE 2012; 469-474doi:https://doi.org/10.1115/DETC2012-71418

Design Informatics

IDETC-CIE 2012; 475-486doi:https://doi.org/10.1115/DETC2012-70050
IDETC-CIE 2012; 487-496doi:https://doi.org/10.1115/DETC2012-70440
IDETC-CIE 2012; 497-507doi:https://doi.org/10.1115/DETC2012-70444
IDETC-CIE 2012; 509-518doi:https://doi.org/10.1115/DETC2012-70653
IDETC-CIE 2012; 519-528doi:https://doi.org/10.1115/DETC2012-70756
IDETC-CIE 2012; 529-539doi:https://doi.org/10.1115/DETC2012-70833
IDETC-CIE 2012; 541-549doi:https://doi.org/10.1115/DETC2012-71084

Emotional Engineering

IDETC-CIE 2012; 551-558doi:https://doi.org/10.1115/DETC2012-70059
IDETC-CIE 2012; 559-566doi:https://doi.org/10.1115/DETC2012-70186
IDETC-CIE 2012; 567-572doi:https://doi.org/10.1115/DETC2012-70263
IDETC-CIE 2012; 573-580doi:https://doi.org/10.1115/DETC2012-70296
IDETC-CIE 2012; 581-589doi:https://doi.org/10.1115/DETC2012-70374
IDETC-CIE 2012; 591-601doi:https://doi.org/10.1115/DETC2012-70543
Topics: Design
IDETC-CIE 2012; 603-610doi:https://doi.org/10.1115/DETC2012-70595
IDETC-CIE 2012; 611-619doi:https://doi.org/10.1115/DETC2012-70628
IDETC-CIE 2012; 621-626doi:https://doi.org/10.1115/DETC2012-70830
IDETC-CIE 2012; 627-635doi:https://doi.org/10.1115/DETC2012-70859
IDETC-CIE 2012; 637-644doi:https://doi.org/10.1115/DETC2012-71001
IDETC-CIE 2012; 645-652doi:https://doi.org/10.1115/DETC2012-71110

Engineering Applications of Brain Science and Human Models

IDETC-CIE 2012; 653-657doi:https://doi.org/10.1115/DETC2012-70171
IDETC-CIE 2012; 659-662doi:https://doi.org/10.1115/DETC2012-70172
IDETC-CIE 2012; 663-671doi:https://doi.org/10.1115/DETC2012-70365
IDETC-CIE 2012; 673-680doi:https://doi.org/10.1115/DETC2012-70667
IDETC-CIE 2012; 681-687doi:https://doi.org/10.1115/DETC2012-70816
IDETC-CIE 2012; 689-694doi:https://doi.org/10.1115/DETC2012-70868
IDETC-CIE 2012; 695-701doi:https://doi.org/10.1115/DETC2012-71068
IDETC-CIE 2012; 703-708doi:https://doi.org/10.1115/DETC2012-71273
IDETC-CIE 2012; 709-714doi:https://doi.org/10.1115/DETC2012-71291
IDETC-CIE 2012; 715-725doi:https://doi.org/10.1115/DETC2012-71481

Geometric Techniques in Modeling and Simulating Machining Processes

IDETC-CIE 2012; 727-735doi:https://doi.org/10.1115/DETC2012-70278
IDETC-CIE 2012; 737-750doi:https://doi.org/10.1115/DETC2012-70549
IDETC-CIE 2012; 751-760doi:https://doi.org/10.1115/DETC2012-70550
IDETC-CIE 2012; 761-770doi:https://doi.org/10.1115/DETC2012-70603

High Performance Computing

IDETC-CIE 2012; 771-778doi:https://doi.org/10.1115/DETC2012-70083
IDETC-CIE 2012; 779-784doi:https://doi.org/10.1115/DETC2012-70256
IDETC-CIE 2012; 785-791doi:https://doi.org/10.1115/DETC2012-70281
IDETC-CIE 2012; 793-799doi:https://doi.org/10.1115/DETC2012-70818
IDETC-CIE 2012; 801-805doi:https://doi.org/10.1115/DETC2012-71121
IDETC-CIE 2012; 807-817doi:https://doi.org/10.1115/DETC2012-71236
IDETC-CIE 2012; 819-829doi:https://doi.org/10.1115/DETC2012-71267
IDETC-CIE 2012; 831-838doi:https://doi.org/10.1115/DETC2012-71315
IDETC-CIE 2012; 839-846doi:https://doi.org/10.1115/DETC2012-71352

Inverse Problems in Science and Engineering

IDETC-CIE 2012; 847-852doi:https://doi.org/10.1115/DETC2012-70025
IDETC-CIE 2012; 853-860doi:https://doi.org/10.1115/DETC2012-70194
IDETC-CIE 2012; 861-872doi:https://doi.org/10.1115/DETC2012-70343
IDETC-CIE 2012; 873-882doi:https://doi.org/10.1115/DETC2012-70584
IDETC-CIE 2012; 883-891doi:https://doi.org/10.1115/DETC2012-71050
IDETC-CIE 2012; 893-903doi:https://doi.org/10.1115/DETC2012-71088
IDETC-CIE 2012; 905-915doi:https://doi.org/10.1115/DETC2012-71119
IDETC-CIE 2012; 917-925doi:https://doi.org/10.1115/DETC2012-71245

Knowledge-Capture, Reuse, and Management

IDETC-CIE 2012; 927-935doi:https://doi.org/10.1115/DETC2012-70240
IDETC-CIE 2012; 937-945doi:https://doi.org/10.1115/DETC2012-70754
IDETC-CIE 2012; 947-958doi:https://doi.org/10.1115/DETC2012-71189

Material Characterization

IDETC-CIE 2012; 959-966doi:https://doi.org/10.1115/DETC2012-70681
IDETC-CIE 2012; 967-972doi:https://doi.org/10.1115/DETC2012-70704
IDETC-CIE 2012; 973-979doi:https://doi.org/10.1115/DETC2012-70909
IDETC-CIE 2012; 981-987doi:https://doi.org/10.1115/DETC2012-70969
IDETC-CIE 2012; 989-997doi:https://doi.org/10.1115/DETC2012-71007
IDETC-CIE 2012; 999-1009doi:https://doi.org/10.1115/DETC2012-71064
IDETC-CIE 2012; 1011-1020doi:https://doi.org/10.1115/DETC2012-71082
IDETC-CIE 2012; 1021-1031doi:https://doi.org/10.1115/DETC2012-71109
IDETC-CIE 2012; 1033-1042doi:https://doi.org/10.1115/DETC2012-71173

Model-Based Design and Verification of Complex and Large-Scale Systems

IDETC-CIE 2012; 1043-1054doi:https://doi.org/10.1115/DETC2012-70135
IDETC-CIE 2012; 1055-1064doi:https://doi.org/10.1115/DETC2012-70180
IDETC-CIE 2012; 1065-1076doi:https://doi.org/10.1115/DETC2012-70483
IDETC-CIE 2012; 1077-1086doi:https://doi.org/10.1115/DETC2012-70534
IDETC-CIE 2012; 1087-1096doi:https://doi.org/10.1115/DETC2012-70542
IDETC-CIE 2012; 1097-1103doi:https://doi.org/10.1115/DETC2012-70710
IDETC-CIE 2012; 1105-1110doi:https://doi.org/10.1115/DETC2012-70791
IDETC-CIE 2012; 1111-1119doi:https://doi.org/10.1115/DETC2012-71051
IDETC-CIE 2012; 1121-1130doi:https://doi.org/10.1115/DETC2012-71266
IDETC-CIE 2012; 1131-1141doi:https://doi.org/10.1115/DETC2012-71378
IDETC-CIE 2012; 1143-1152doi:https://doi.org/10.1115/DETC2012-71464

Modeling Tools and Metrics for Sustainable Manufacturing

IDETC-CIE 2012; 1153-1162doi:https://doi.org/10.1115/DETC2012-70455
IDETC-CIE 2012; 1163-1172doi:https://doi.org/10.1115/DETC2012-70843
IDETC-CIE 2012; 1173-1181doi:https://doi.org/10.1115/DETC2012-71020

Systems Engineering

IDETC-CIE 2012; 1183-1191doi:https://doi.org/10.1115/DETC2012-70241
IDETC-CIE 2012; 1193-1204doi:https://doi.org/10.1115/DETC2012-70249
IDETC-CIE 2012; 1205-1216doi:https://doi.org/10.1115/DETC2012-70272
IDETC-CIE 2012; 1217-1227doi:https://doi.org/10.1115/DETC2012-70378
IDETC-CIE 2012; 1229-1236doi:https://doi.org/10.1115/DETC2012-70390
IDETC-CIE 2012; 1237-1246doi:https://doi.org/10.1115/DETC2012-70799
IDETC-CIE 2012; 1247-1261doi:https://doi.org/10.1115/DETC2012-70876

Systems Engineering, Information and Knowledge Management, General

IDETC-CIE 2012; 1263-1276doi:https://doi.org/10.1115/DETC2012-71005
IDETC-CIE 2012; 1277-1286doi:https://doi.org/10.1115/DETC2012-71156
IDETC-CIE 2012; 1287-1294doi:https://doi.org/10.1115/DETC2012-71430

Topology Optimization

IDETC-CIE 2012; 1295-1301doi:https://doi.org/10.1115/DETC2012-70282
IDETC-CIE 2012; 1303-1312doi:https://doi.org/10.1115/DETC2012-70422
IDETC-CIE 2012; 1313-1319doi:https://doi.org/10.1115/DETC2012-71026
IDETC-CIE 2012; 1321-1328doi:https://doi.org/10.1115/DETC2012-71546

Virtual Environments and Systems, General

IDETC-CIE 2012; 1329-1340doi:https://doi.org/10.1115/DETC2012-70338
IDETC-CIE 2012; 1341-1350doi:https://doi.org/10.1115/DETC2012-70347
IDETC-CIE 2012; 1351-1359doi:https://doi.org/10.1115/DETC2012-70388
IDETC-CIE 2012; 1361-1370doi:https://doi.org/10.1115/DETC2012-70651
IDETC-CIE 2012; 1371-1376doi:https://doi.org/10.1115/DETC2012-70666
IDETC-CIE 2012; 1377-1384doi:https://doi.org/10.1115/DETC2012-70800
IDETC-CIE 2012; 1385-1394doi:https://doi.org/10.1115/DETC2012-70811
IDETC-CIE 2012; 1395-1402doi:https://doi.org/10.1115/DETC2012-70842
IDETC-CIE 2012; 1403-1412doi:https://doi.org/10.1115/DETC2012-70866
IDETC-CIE 2012; 1413-1418doi:https://doi.org/10.1115/DETC2012-70951
IDETC-CIE 2012; 1419-1425doi:https://doi.org/10.1115/DETC2012-70991
IDETC-CIE 2012; 1427-1435doi:https://doi.org/10.1115/DETC2012-71040
IDETC-CIE 2012; 1437-1447doi:https://doi.org/10.1115/DETC2012-71097
Topics: Design
IDETC-CIE 2012; 1449-1459doi:https://doi.org/10.1115/DETC2012-71120
IDETC-CIE 2012; 1461-1471doi:https://doi.org/10.1115/DETC2012-71243
IDETC-CIE 2012; 1473-1479doi:https://doi.org/10.1115/DETC2012-71325
IDETC-CIE 2012; 1481-1490doi:https://doi.org/10.1115/DETC2012-71326
IDETC-CIE 2012; 1491-1500doi:https://doi.org/10.1115/DETC2012-71370

VR in Product Conceptualization and Design

IDETC-CIE 2012; 1501-1508doi:https://doi.org/10.1115/DETC2012-70375
IDETC-CIE 2012; 1509-1516doi:https://doi.org/10.1115/DETC2012-70740
IDETC-CIE 2012; 1517-1525doi:https://doi.org/10.1115/DETC2012-70998
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