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Proceedings Papers

Proceedings Volume Cover
ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 28–31, 2011
Washington, DC, USA
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
978-0-7918-5484-6
Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference

5th International Conference on Micro- and Nanosystems

Symposium on BIO MEMS/NEMS

IDETC-CIE 2011; 11-15doi:https://doi.org/10.1115/DETC2011-47178
IDETC-CIE 2011; 17-24doi:https://doi.org/10.1115/DETC2011-47320
IDETC-CIE 2011; 25-32doi:https://doi.org/10.1115/DETC2011-47528
IDETC-CIE 2011; 33-39doi:https://doi.org/10.1115/DETC2011-47532
IDETC-CIE 2011; 41-49doi:https://doi.org/10.1115/DETC2011-47653
IDETC-CIE 2011; 51-62doi:https://doi.org/10.1115/DETC2011-48005
IDETC-CIE 2011; 63-69doi:https://doi.org/10.1115/DETC2011-48379

Symposium on Dynamics of MEMS and NEMS

IDETC-CIE 2011; 71-77doi:https://doi.org/10.1115/DETC2011-47116
IDETC-CIE 2011; 79-85doi:https://doi.org/10.1115/DETC2011-47125
IDETC-CIE 2011; 87-100doi:https://doi.org/10.1115/DETC2011-47260
IDETC-CIE 2011; 101-106doi:https://doi.org/10.1115/DETC2011-47271
IDETC-CIE 2011; 107-116doi:https://doi.org/10.1115/DETC2011-47289
IDETC-CIE 2011; 117-123doi:https://doi.org/10.1115/DETC2011-47461
IDETC-CIE 2011; 125-134doi:https://doi.org/10.1115/DETC2011-47506
IDETC-CIE 2011; 135-144doi:https://doi.org/10.1115/DETC2011-47575
IDETC-CIE 2011; 145-151doi:https://doi.org/10.1115/DETC2011-47615
IDETC-CIE 2011; 153-158doi:https://doi.org/10.1115/DETC2011-47791
IDETC-CIE 2011; 159-166doi:https://doi.org/10.1115/DETC2011-47978
IDETC-CIE 2011; 167-176doi:https://doi.org/10.1115/DETC2011-48008
IDETC-CIE 2011; 177-186doi:https://doi.org/10.1115/DETC2011-48199
IDETC-CIE 2011; 187-190doi:https://doi.org/10.1115/DETC2011-48286
IDETC-CIE 2011; 191-196doi:https://doi.org/10.1115/DETC2011-48373
IDETC-CIE 2011; 197-207doi:https://doi.org/10.1115/DETC2011-48501
IDETC-CIE 2011; 209-218doi:https://doi.org/10.1115/DETC2011-48544
IDETC-CIE 2011; 219-226doi:https://doi.org/10.1115/DETC2011-48552
IDETC-CIE 2011; 227-233doi:https://doi.org/10.1115/DETC2011-48562
IDETC-CIE 2011; 235-243doi:https://doi.org/10.1115/DETC2011-48597
IDETC-CIE 2011; 245-253doi:https://doi.org/10.1115/DETC2011-48601
IDETC-CIE 2011; 255-261doi:https://doi.org/10.1115/DETC2011-48862
IDETC-CIE 2011; 263-267doi:https://doi.org/10.1115/DETC2011-48888

Symposium on Measurement and Control in Micro- and Nano-Systems

IDETC-CIE 2011; 269-277doi:https://doi.org/10.1115/DETC2011-47512
IDETC-CIE 2011; 279-286doi:https://doi.org/10.1115/DETC2011-47902
IDETC-CIE 2011; 287-290doi:https://doi.org/10.1115/DETC2011-48029
IDETC-CIE 2011; 291-299doi:https://doi.org/10.1115/DETC2011-48467
IDETC-CIE 2011; 301-308doi:https://doi.org/10.1115/DETC2011-48472
IDETC-CIE 2011; 309-316doi:https://doi.org/10.1115/DETC2011-48734
IDETC-CIE 2011; 317-325doi:https://doi.org/10.1115/DETC2011-48848

Symposium on Micro and Nano Mechanisms and Robotics

IDETC-CIE 2011; 327-334doi:https://doi.org/10.1115/DETC2011-47717
IDETC-CIE 2011; 335-344doi:https://doi.org/10.1115/DETC2011-47914
IDETC-CIE 2011; 345-354doi:https://doi.org/10.1115/DETC2011-48810
IDETC-CIE 2011; 355-364doi:https://doi.org/10.1115/DETC2011-48842

Symposium on Micro Mechanics, Surface Engineering, and Contact Mechanics/Tribology

IDETC-CIE 2011; 365-370doi:https://doi.org/10.1115/DETC2011-47112
IDETC-CIE 2011; 371-377doi:https://doi.org/10.1115/DETC2011-47152
IDETC-CIE 2011; 379-385doi:https://doi.org/10.1115/DETC2011-47167
IDETC-CIE 2011; 387-390doi:https://doi.org/10.1115/DETC2011-47226
IDETC-CIE 2011; 391-396doi:https://doi.org/10.1115/DETC2011-47616
IDETC-CIE 2011; 397-399doi:https://doi.org/10.1115/DETC2011-47681
IDETC-CIE 2011; 401-404doi:https://doi.org/10.1115/DETC2011-47856
IDETC-CIE 2011; 405-412doi:https://doi.org/10.1115/DETC2011-47883
IDETC-CIE 2011; 413-416doi:https://doi.org/10.1115/DETC2011-48999

Symposium on Micro- and Nano- Manufacturing

IDETC-CIE 2011; 417-424doi:https://doi.org/10.1115/DETC2011-47298
IDETC-CIE 2011; 425-431doi:https://doi.org/10.1115/DETC2011-47945
IDETC-CIE 2011; 433-439doi:https://doi.org/10.1115/DETC2011-48301
IDETC-CIE 2011; 441-446doi:https://doi.org/10.1115/DETC2011-48331
IDETC-CIE 2011; 447-457doi:https://doi.org/10.1115/DETC2011-48619

Symposium on Nonlinear Mechanics, Dynamics, and Control in Atomic Force Microscopy

IDETC-CIE 2011; 459-467doi:https://doi.org/10.1115/DETC2011-47082
IDETC-CIE 2011; 469-473doi:https://doi.org/10.1115/DETC2011-47199
IDETC-CIE 2011; 475-480doi:https://doi.org/10.1115/DETC2011-47455
IDETC-CIE 2011; 481-490doi:https://doi.org/10.1115/DETC2011-47503
IDETC-CIE 2011; 491-500doi:https://doi.org/10.1115/DETC2011-47543
IDETC-CIE 2011; 501-506doi:https://doi.org/10.1115/DETC2011-47668
IDETC-CIE 2011; 507-524doi:https://doi.org/10.1115/DETC2011-47730
IDETC-CIE 2011; 525-534doi:https://doi.org/10.1115/DETC2011-47955
IDETC-CIE 2011; 535-542doi:https://doi.org/10.1115/DETC2011-47985
IDETC-CIE 2011; 543-549doi:https://doi.org/10.1115/DETC2011-48653
IDETC-CIE 2011; 551-555doi:https://doi.org/10.1115/DETC2011-48737

8th International Conference on Design and Design Education

Best Practices and Lessons Learned in Design Education

IDETC-CIE 2011; 559-568doi:https://doi.org/10.1115/DETC2011-47154
IDETC-CIE 2011; 569-578doi:https://doi.org/10.1115/DETC2011-47471
IDETC-CIE 2011; 579-587doi:https://doi.org/10.1115/DETC2011-47498
IDETC-CIE 2011; 589-598doi:https://doi.org/10.1115/DETC2011-48168
IDETC-CIE 2011; 599-606doi:https://doi.org/10.1115/DETC2011-48310
IDETC-CIE 2011; 607-614doi:https://doi.org/10.1115/DETC2011-48357
IDETC-CIE 2011; 615-623doi:https://doi.org/10.1115/DETC2011-48724

Broad Adaptation/Adoption of Design Tools in Engineering Education - Issues and Lessons Learned

IDETC-CIE 2011; 625-636doi:https://doi.org/10.1115/DETC2011-47852
IDETC-CIE 2011; 637-643doi:https://doi.org/10.1115/DETC2011-48163
IDETC-CIE 2011; 645-654doi:https://doi.org/10.1115/DETC2011-48439
IDETC-CIE 2011; 655-660doi:https://doi.org/10.1115/DETC2011-48571

Experiential Learning and New Pedagogy for Engineering Education

IDETC-CIE 2011; 661-670doi:https://doi.org/10.1115/DETC2011-47796
IDETC-CIE 2011; 671-681doi:https://doi.org/10.1115/DETC2011-47933
IDETC-CIE 2011; 683-695doi:https://doi.org/10.1115/DETC2011-48078
IDETC-CIE 2011; 697-703doi:https://doi.org/10.1115/DETC2011-48242
IDETC-CIE 2011; 705-716doi:https://doi.org/10.1115/DETC2011-48258
IDETC-CIE 2011; 717-727doi:https://doi.org/10.1115/DETC2011-48298
IDETC-CIE 2011; 729-739doi:https://doi.org/10.1115/DETC2011-48438
IDETC-CIE 2011; 741-750doi:https://doi.org/10.1115/DETC2011-48817

Innovation and Entrepreneurship in Design

IDETC-CIE 2011; 751-761doi:https://doi.org/10.1115/DETC2011-47837
IDETC-CIE 2011; 763-772doi:https://doi.org/10.1115/DETC2011-48265
IDETC-CIE 2011; 773-782doi:https://doi.org/10.1115/DETC2011-48402
IDETC-CIE 2011; 783-792doi:https://doi.org/10.1115/DETC2011-48609

Opportunities and Barriers to Bringing Change in Engineering Education

IDETC-CIE 2011; 793-804doi:https://doi.org/10.1115/DETC2011-48378
IDETC-CIE 2011; 805-813doi:https://doi.org/10.1115/DETC2011-48446
IDETC-CIE 2011; 815-822doi:https://doi.org/10.1115/DETC2011-48648

Teaching Design for Sustainability

IDETC-CIE 2011; 823-832doi:https://doi.org/10.1115/DETC2011-47577
IDETC-CIE 2011; 833-843doi:https://doi.org/10.1115/DETC2011-47847
IDETC-CIE 2011; 845-849doi:https://doi.org/10.1115/DETC2011-48454
IDETC-CIE 2011; 851-859doi:https://doi.org/10.1115/DETC2011-48859

21st Reliability, Stress Analysis, and Failure Prevention Conference

Failure Analyses and Modeling

IDETC-CIE 2011; 863-870doi:https://doi.org/10.1115/DETC2011-47343
IDETC-CIE 2011; 871-875doi:https://doi.org/10.1115/DETC2011-47378
IDETC-CIE 2011; 877-885doi:https://doi.org/10.1115/DETC2011-47485
IDETC-CIE 2011; 887-892doi:https://doi.org/10.1115/DETC2011-47583
IDETC-CIE 2011; 893-898doi:https://doi.org/10.1115/DETC2011-48413

RSAFP Considerations in Design Process and Computer-Based Analyses for RSAFP

IDETC-CIE 2011; 899-908doi:https://doi.org/10.1115/DETC2011-47080
IDETC-CIE 2011; 909-914doi:https://doi.org/10.1115/DETC2011-47265
IDETC-CIE 2011; 915-919doi:https://doi.org/10.1115/DETC2011-47375
IDETC-CIE 2011; 921-925doi:https://doi.org/10.1115/DETC2011-48002
IDETC-CIE 2011; 927-932doi:https://doi.org/10.1115/DETC2011-48650

Stress Analyses

IDETC-CIE 2011; 933-938doi:https://doi.org/10.1115/DETC2011-47076
IDETC-CIE 2011; 939-944doi:https://doi.org/10.1115/DETC2011-48222
IDETC-CIE 2011; 945-952doi:https://doi.org/10.1115/DETC2011-48247
IDETC-CIE 2011; 953-959doi:https://doi.org/10.1115/DETC2011-48807
IDETC-CIE 2011; 961-965doi:https://doi.org/10.1115/DETC2011-48874
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