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Proceedings Papers

Volume 3: 2011 ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications, Parts A and B

2011 ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications

The Fifth Symposium on Embedded Systems Infrastructure and Theory

IDETC-CIE 2011; 3-12doi:https://doi.org/10.1115/DETC2011-47139
IDETC-CIE 2011; 13-19doi:https://doi.org/10.1115/DETC2011-47843
IDETC-CIE 2011; 21-27doi:https://doi.org/10.1115/DETC2011-47910
IDETC-CIE 2011; 29-38doi:https://doi.org/10.1115/DETC2011-47928
IDETC-CIE 2011; 39-45doi:https://doi.org/10.1115/DETC2011-48634
IDETC-CIE 2011; 47-52doi:https://doi.org/10.1115/DETC2011-48908
IDETC-CIE 2011; 53-58doi:https://doi.org/10.1115/DETC2011-48912
IDETC-CIE 2011; 59-64doi:https://doi.org/10.1115/DETC2011-48957
IDETC-CIE 2011; 65-74doi:https://doi.org/10.1115/DETC2011-48981

The Fifth Symposium on Fractional Derivatives and Their Applications

IDETC-CIE 2011; 75-84doi:https://doi.org/10.1115/DETC2011-47053
IDETC-CIE 2011; 85-94doi:https://doi.org/10.1115/DETC2011-47071
IDETC-CIE 2011; 95-104doi:https://doi.org/10.1115/DETC2011-47107
IDETC-CIE 2011; 105-114doi:https://doi.org/10.1115/DETC2011-47204
Topics: Stability
IDETC-CIE 2011; 115-122doi:https://doi.org/10.1115/DETC2011-47250
IDETC-CIE 2011; 123-128doi:https://doi.org/10.1115/DETC2011-47284
IDETC-CIE 2011; 129-136doi:https://doi.org/10.1115/DETC2011-47286
IDETC-CIE 2011; 137-141doi:https://doi.org/10.1115/DETC2011-47317
IDETC-CIE 2011; 143-147doi:https://doi.org/10.1115/DETC2011-47374
IDETC-CIE 2011; 149-154doi:https://doi.org/10.1115/DETC2011-47392
IDETC-CIE 2011; 155-161doi:https://doi.org/10.1115/DETC2011-47395
IDETC-CIE 2011; 163-168doi:https://doi.org/10.1115/DETC2011-47396
IDETC-CIE 2011; 169-178doi:https://doi.org/10.1115/DETC2011-47408
IDETC-CIE 2011; 179-184doi:https://doi.org/10.1115/DETC2011-47415
IDETC-CIE 2011; 185-192doi:https://doi.org/10.1115/DETC2011-47444
IDETC-CIE 2011; 193-200doi:https://doi.org/10.1115/DETC2011-47552
IDETC-CIE 2011; 201-210doi:https://doi.org/10.1115/DETC2011-47613
IDETC-CIE 2011; 211-217doi:https://doi.org/10.1115/DETC2011-47623
IDETC-CIE 2011; 219-226doi:https://doi.org/10.1115/DETC2011-47633
IDETC-CIE 2011; 227-233doi:https://doi.org/10.1115/DETC2011-47696
IDETC-CIE 2011; 235-240doi:https://doi.org/10.1115/DETC2011-47699
IDETC-CIE 2011; 241-250doi:https://doi.org/10.1115/DETC2011-47721
IDETC-CIE 2011; 251-255doi:https://doi.org/10.1115/DETC2011-47731
IDETC-CIE 2011; 257-265doi:https://doi.org/10.1115/DETC2011-47734
IDETC-CIE 2011; 267-274doi:https://doi.org/10.1115/DETC2011-47769
IDETC-CIE 2011; 275-284doi:https://doi.org/10.1115/DETC2011-47835
IDETC-CIE 2011; 285-291doi:https://doi.org/10.1115/DETC2011-47842
IDETC-CIE 2011; 293-302doi:https://doi.org/10.1115/DETC2011-47864
IDETC-CIE 2011; 303-310doi:https://doi.org/10.1115/DETC2011-47867
IDETC-CIE 2011; 311-321doi:https://doi.org/10.1115/DETC2011-47872
IDETC-CIE 2011; 323-328doi:https://doi.org/10.1115/DETC2011-47878
IDETC-CIE 2011; 329-334doi:https://doi.org/10.1115/DETC2011-47880
IDETC-CIE 2011; 335-338doi:https://doi.org/10.1115/DETC2011-47953
IDETC-CIE 2011; 339-351doi:https://doi.org/10.1115/DETC2011-48016
IDETC-CIE 2011; 353-360doi:https://doi.org/10.1115/DETC2011-48045
IDETC-CIE 2011; 361-367doi:https://doi.org/10.1115/DETC2011-48063
IDETC-CIE 2011; 369-376doi:https://doi.org/10.1115/DETC2011-48079
IDETC-CIE 2011; 377-383doi:https://doi.org/10.1115/DETC2011-48151
IDETC-CIE 2011; 385-393doi:https://doi.org/10.1115/DETC2011-48175
IDETC-CIE 2011; 395-401doi:https://doi.org/10.1115/DETC2011-48426
IDETC-CIE 2011; 403-408doi:https://doi.org/10.1115/DETC2011-48861
IDETC-CIE 2011; 409-418doi:https://doi.org/10.1115/DETC2011-48950

The Fifth Symposium on Mechatronics and Embedded Systems Education

IDETC-CIE 2011; 419-426doi:https://doi.org/10.1115/DETC2011-47354
IDETC-CIE 2011; 427-435doi:https://doi.org/10.1115/DETC2011-47753
IDETC-CIE 2011; 437-440doi:https://doi.org/10.1115/DETC2011-48190
IDETC-CIE 2011; 441-449doi:https://doi.org/10.1115/DETC2011-48429

The Fifth Symposium on Sensors and Actuators

IDETC-CIE 2011; 451-456doi:https://doi.org/10.1115/DETC2011-47873
IDETC-CIE 2011; 457-463doi:https://doi.org/10.1115/DETC2011-48085
IDETC-CIE 2011; 465-469doi:https://doi.org/10.1115/DETC2011-48161
IDETC-CIE 2011; 471-479doi:https://doi.org/10.1115/DETC2011-48305
IDETC-CIE 2011; 481-489doi:https://doi.org/10.1115/DETC2011-48411
IDETC-CIE 2011; 491-497doi:https://doi.org/10.1115/DETC2011-48602
IDETC-CIE 2011; 499-505doi:https://doi.org/10.1115/DETC2011-48732
IDETC-CIE 2011; 507-510doi:https://doi.org/10.1115/DETC2011-48893
IDETC-CIE 2011; 511-516doi:https://doi.org/10.1115/DETC2011-48970
IDETC-CIE 2011; 517-523doi:https://doi.org/10.1115/DETC2011-48976

The First Symposium on Virtual Prototyping in Mechatronics

IDETC-CIE 2011; 525-533doi:https://doi.org/10.1115/DETC2011-48111
IDETC-CIE 2011; 535-544doi:https://doi.org/10.1115/DETC2011-48880
IDETC-CIE 2011; 545-553doi:https://doi.org/10.1115/DETC2011-48941
IDETC-CIE 2011; 555-563doi:https://doi.org/10.1115/DETC2011-48995

The Fourth Symposium on Robotics and Mobile Machines

IDETC-CIE 2011; 565-574doi:https://doi.org/10.1115/DETC2011-47185
IDETC-CIE 2011; 575-582doi:https://doi.org/10.1115/DETC2011-47194
IDETC-CIE 2011; 583-588doi:https://doi.org/10.1115/DETC2011-47198
IDETC-CIE 2011; 589-598doi:https://doi.org/10.1115/DETC2011-47201
IDETC-CIE 2011; 599-605doi:https://doi.org/10.1115/DETC2011-47468
IDETC-CIE 2011; 607-613doi:https://doi.org/10.1115/DETC2011-47711
IDETC-CIE 2011; 615-622doi:https://doi.org/10.1115/DETC2011-47735
IDETC-CIE 2011; 623-630doi:https://doi.org/10.1115/DETC2011-47747
IDETC-CIE 2011; 631-636doi:https://doi.org/10.1115/DETC2011-47816
IDETC-CIE 2011; 637-645doi:https://doi.org/10.1115/DETC2011-47991
IDETC-CIE 2011; 647-655doi:https://doi.org/10.1115/DETC2011-48203
IDETC-CIE 2011; 657-664doi:https://doi.org/10.1115/DETC2011-48635
IDETC-CIE 2011; 665-669doi:https://doi.org/10.1115/DETC2011-48857

The Second Symposium on Diagnosis and Monitoring in Mechatronic Systems

IDETC-CIE 2011; 671-676doi:https://doi.org/10.1115/DETC2011-47679
IDETC-CIE 2011; 677-680doi:https://doi.org/10.1115/DETC2011-47680
IDETC-CIE 2011; 681-689doi:https://doi.org/10.1115/DETC2011-48174
IDETC-CIE 2011; 691-697doi:https://doi.org/10.1115/DETC2011-48493
IDETC-CIE 2011; 699-706doi:https://doi.org/10.1115/DETC2011-48553

The Third Symposium on Autonomous Systems and Ambient Intelligence

IDETC-CIE 2011; 707-716doi:https://doi.org/10.1115/DETC2011-47989
IDETC-CIE 2011; 717-726doi:https://doi.org/10.1115/DETC2011-48041
IDETC-CIE 2011; 727-734doi:https://doi.org/10.1115/DETC2011-48042
IDETC-CIE 2011; 735-744doi:https://doi.org/10.1115/DETC2011-48699
IDETC-CIE 2011; 745-752doi:https://doi.org/10.1115/DETC2011-48904

The Third Symposium on Bio-Mechatronics - Medical Devices and Technologies

IDETC-CIE 2011; 753-764doi:https://doi.org/10.1115/DETC2011-47024
IDETC-CIE 2011; 765-769doi:https://doi.org/10.1115/DETC2011-47179
IDETC-CIE 2011; 771-777doi:https://doi.org/10.1115/DETC2011-47445
IDETC-CIE 2011; 779-784doi:https://doi.org/10.1115/DETC2011-48027
IDETC-CIE 2011; 785-793doi:https://doi.org/10.1115/DETC2011-48031
IDETC-CIE 2011; 795-804doi:https://doi.org/10.1115/DETC2011-48039
IDETC-CIE 2011; 805-810doi:https://doi.org/10.1115/DETC2011-48095
IDETC-CIE 2011; 811-819doi:https://doi.org/10.1115/DETC2011-48704
IDETC-CIE 2011; 821-827doi:https://doi.org/10.1115/DETC2011-48719

The Third Symposium on Cyber-Physical and Cooperative Systems

IDETC-CIE 2011; 829-845doi:https://doi.org/10.1115/DETC2011-47861
Topics: Vehicles
IDETC-CIE 2011; 847-855doi:https://doi.org/10.1115/DETC2011-48415

The Third Symposium on Mechatronic Control and Electrical Vehicular Systems

IDETC-CIE 2011; 857-862doi:https://doi.org/10.1115/DETC2011-47138
IDETC-CIE 2011; 863-871doi:https://doi.org/10.1115/DETC2011-47804
IDETC-CIE 2011; 873-880doi:https://doi.org/10.1115/DETC2011-48403
IDETC-CIE 2011; 881-887doi:https://doi.org/10.1115/DETC2011-48942
IDETC-CIE 2011; 889-894doi:https://doi.org/10.1115/DETC2011-49013

The Third Symposium on Small Unmanned Aerial Vehicle Technologies and Applications

IDETC-CIE 2011; 895-900doi:https://doi.org/10.1115/DETC2011-47518
IDETC-CIE 2011; 901-908doi:https://doi.org/10.1115/DETC2011-47742
IDETC-CIE 2011; 909-916doi:https://doi.org/10.1115/DETC2011-47844
IDETC-CIE 2011; 917-927doi:https://doi.org/10.1115/DETC2011-47848
IDETC-CIE 2011; 929-936doi:https://doi.org/10.1115/DETC2011-47851
IDETC-CIE 2011; 937-943doi:https://doi.org/10.1115/DETC2011-48167
IDETC-CIE 2011; 945-953doi:https://doi.org/10.1115/DETC2011-48259
IDETC-CIE 2011; 955-962doi:https://doi.org/10.1115/DETC2011-48447
IDETC-CIE 2011; 963-971doi:https://doi.org/10.1115/DETC2011-48561
IDETC-CIE 2011; 973-981doi:https://doi.org/10.1115/DETC2011-48606
IDETC-CIE 2011; 983-989doi:https://doi.org/10.1115/DETC2011-48644
IDETC-CIE 2011; 991-996doi:https://doi.org/10.1115/DETC2011-48651
IDETC-CIE 2011; 997-1004doi:https://doi.org/10.1115/DETC2011-48755
IDETC-CIE 2011; 1005-1012doi:https://doi.org/10.1115/DETC2011-48788
IDETC-CIE 2011; 1013-1022doi:https://doi.org/10.1115/DETC2011-48806
IDETC-CIE 2011; 1023-1030doi:https://doi.org/10.1115/DETC2011-48836
IDETC-CIE 2011; 1031-1035doi:https://doi.org/10.1115/DETC2011-48954
IDETC-CIE 2011; 1037-1046doi:https://doi.org/10.1115/DETC2011-48975
IDETC-CIE 2011; 1047-1052doi:https://doi.org/10.1115/DETC2011-49012
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