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Proceedings Papers

Proceedings Volume Cover
ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 28–31, 2011
Washington, DC, USA
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
978-0-7918-5479-2
Volume 2: 31st Computers and Information in Engineering Conference, Parts A and B

31st Computers and Information in Engineering Conference

AMS: Advanced Modeling and Simulation, General

IDETC-CIE 2011; 3-13doi:https://doi.org/10.1115/DETC2011-47046
IDETC-CIE 2011; 15-22doi:https://doi.org/10.1115/DETC2011-47075
IDETC-CIE 2011; 23-29doi:https://doi.org/10.1115/DETC2011-47216
IDETC-CIE 2011; 31-38doi:https://doi.org/10.1115/DETC2011-47328
IDETC-CIE 2011; 39-50doi:https://doi.org/10.1115/DETC2011-47476
IDETC-CIE 2011; 51-57doi:https://doi.org/10.1115/DETC2011-47489
IDETC-CIE 2011; 59-69doi:https://doi.org/10.1115/DETC2011-47550
IDETC-CIE 2011; 71-76doi:https://doi.org/10.1115/DETC2011-47627
IDETC-CIE 2011; 77-82doi:https://doi.org/10.1115/DETC2011-47629
IDETC-CIE 2011; 83-89doi:https://doi.org/10.1115/DETC2011-47669
IDETC-CIE 2011; 91-104doi:https://doi.org/10.1115/DETC2011-47776
IDETC-CIE 2011; 105-113doi:https://doi.org/10.1115/DETC2011-47792
IDETC-CIE 2011; 115-125doi:https://doi.org/10.1115/DETC2011-48480
IDETC-CIE 2011; 127-133doi:https://doi.org/10.1115/DETC2011-48615
IDETC-CIE 2011; 135-147doi:https://doi.org/10.1115/DETC2011-48792

AMS: Advances in Understanding and Modeling of Corrosion

IDETC-CIE 2011; 149-154doi:https://doi.org/10.1115/DETC2011-47192
IDETC-CIE 2011; 155-160doi:https://doi.org/10.1115/DETC2011-47215
IDETC-CIE 2011; 161-169doi:https://doi.org/10.1115/DETC2011-47571
IDETC-CIE 2011; 171-179doi:https://doi.org/10.1115/DETC2011-48739
IDETC-CIE 2011; 181-190doi:https://doi.org/10.1115/DETC2011-48937

AMS: Applications of Symbolic Computation in Engineering

IDETC-CIE 2011; 191-200doi:https://doi.org/10.1115/DETC2011-47659
IDETC-CIE 2011; 201-211doi:https://doi.org/10.1115/DETC2011-47737
IDETC-CIE 2011; 213-223doi:https://doi.org/10.1115/DETC2011-48154
IDETC-CIE 2011; 225-231doi:https://doi.org/10.1115/DETC2011-48406

AMS: Computational Multiphysics Applications

IDETC-CIE 2011; 233-240doi:https://doi.org/10.1115/DETC2011-47763
IDETC-CIE 2011; 241-252doi:https://doi.org/10.1115/DETC2011-48570
IDETC-CIE 2011; 253-258doi:https://doi.org/10.1115/DETC2011-48765
IDETC-CIE 2011; 259-268doi:https://doi.org/10.1115/DETC2011-48889

AMS: Energy Systems - Energy Efficient Manufacturing

IDETC-CIE 2011; 269-274doi:https://doi.org/10.1115/DETC2011-47064
IDETC-CIE 2011; 275-280doi:https://doi.org/10.1115/DETC2011-47065
IDETC-CIE 2011; 281-289doi:https://doi.org/10.1115/DETC2011-47066
IDETC-CIE 2011; 291-297doi:https://doi.org/10.1115/DETC2011-47067
IDETC-CIE 2011; 299-304doi:https://doi.org/10.1115/DETC2011-47068
IDETC-CIE 2011; 305-314doi:https://doi.org/10.1115/DETC2011-47454
IDETC-CIE 2011; 315-324doi:https://doi.org/10.1115/DETC2011-47935

AMS: GPU-Based High Performance Computing

IDETC-CIE 2011; 325-337doi:https://doi.org/10.1115/DETC2011-47213
IDETC-CIE 2011; 339-346doi:https://doi.org/10.1115/DETC2011-47330
IDETC-CIE 2011; 347-355doi:https://doi.org/10.1115/DETC2011-47981
IDETC-CIE 2011; 357-370doi:https://doi.org/10.1115/DETC2011-48228
IDETC-CIE 2011; 371-377doi:https://doi.org/10.1115/DETC2011-48452
IDETC-CIE 2011; 379-387doi:https://doi.org/10.1115/DETC2011-48598

AMS: Inverse Problems in Science and Engineering

IDETC-CIE 2011; 389-398doi:https://doi.org/10.1115/DETC2011-47435
IDETC-CIE 2011; 399-406doi:https://doi.org/10.1115/DETC2011-47547
IDETC-CIE 2011; 407-414doi:https://doi.org/10.1115/DETC2011-47584
IDETC-CIE 2011; 415-424doi:https://doi.org/10.1115/DETC2011-47632
IDETC-CIE 2011; 425-434doi:https://doi.org/10.1115/DETC2011-47652
IDETC-CIE 2011; 435-445doi:https://doi.org/10.1115/DETC2011-47658
IDETC-CIE 2011; 447-456doi:https://doi.org/10.1115/DETC2011-47784
IDETC-CIE 2011; 457-462doi:https://doi.org/10.1115/DETC2011-47799
IDETC-CIE 2011; 463-470doi:https://doi.org/10.1115/DETC2011-47946

AMS: Material Characterization Methods and Applications

IDETC-CIE 2011; 471-477doi:https://doi.org/10.1115/DETC2011-47420
IDETC-CIE 2011; 479-487doi:https://doi.org/10.1115/DETC2011-47511
IDETC-CIE 2011; 489-498doi:https://doi.org/10.1115/DETC2011-47739
IDETC-CIE 2011; 499-511doi:https://doi.org/10.1115/DETC2011-47740
IDETC-CIE 2011; 513-520doi:https://doi.org/10.1115/DETC2011-48232
IDETC-CIE 2011; 521-526doi:https://doi.org/10.1115/DETC2011-48488
IDETC-CIE 2011; 527-535doi:https://doi.org/10.1115/DETC2011-48870
IDETC-CIE 2011; 537-542doi:https://doi.org/10.1115/DETC2011-48902

AMS: Modeling and Simulation in Biomechanics

IDETC-CIE 2011; 543-550doi:https://doi.org/10.1115/DETC2011-47073
IDETC-CIE 2011; 551-556doi:https://doi.org/10.1115/DETC2011-48484
IDETC-CIE 2011; 557-566doi:https://doi.org/10.1115/DETC2011-48685

CAPPD: Computer-Aided Product and Process Development, General

IDETC-CIE 2011; 567-576doi:https://doi.org/10.1115/DETC2011-47176
IDETC-CIE 2011; 577-585doi:https://doi.org/10.1115/DETC2011-47197
IDETC-CIE 2011; 587-598doi:https://doi.org/10.1115/DETC2011-47217
IDETC-CIE 2011; 599-607doi:https://doi.org/10.1115/DETC2011-47278
IDETC-CIE 2011; 609-618doi:https://doi.org/10.1115/DETC2011-47288
IDETC-CIE 2011; 619-628doi:https://doi.org/10.1115/DETC2011-47410
IDETC-CIE 2011; 629-637doi:https://doi.org/10.1115/DETC2011-47439
IDETC-CIE 2011; 639-651doi:https://doi.org/10.1115/DETC2011-47483
IDETC-CIE 2011; 653-659doi:https://doi.org/10.1115/DETC2011-47535
IDETC-CIE 2011; 661-672doi:https://doi.org/10.1115/DETC2011-47589
IDETC-CIE 2011; 673-681doi:https://doi.org/10.1115/DETC2011-47651
IDETC-CIE 2011; 683-696doi:https://doi.org/10.1115/DETC2011-47661
IDETC-CIE 2011; 697-707doi:https://doi.org/10.1115/DETC2011-47729
IDETC-CIE 2011; 709-722doi:https://doi.org/10.1115/DETC2011-47937
IDETC-CIE 2011; 723-737doi:https://doi.org/10.1115/DETC2011-48205
IDETC-CIE 2011; 739-748doi:https://doi.org/10.1115/DETC2011-48270
IDETC-CIE 2011; 749-758doi:https://doi.org/10.1115/DETC2011-48374
IDETC-CIE 2011; 759-767doi:https://doi.org/10.1115/DETC2011-48444
IDETC-CIE 2011; 769-777doi:https://doi.org/10.1115/DETC2011-48477
IDETC-CIE 2011; 779-791doi:https://doi.org/10.1115/DETC2011-48530
IDETC-CIE 2011; 793-804doi:https://doi.org/10.1115/DETC2011-48573
IDETC-CIE 2011; 805-815doi:https://doi.org/10.1115/DETC2011-48668
IDETC-CIE 2011; 817-824doi:https://doi.org/10.1115/DETC2011-48779

CAPPD: Emotional Engineering

IDETC-CIE 2011; 825-832doi:https://doi.org/10.1115/DETC2011-47568
IDETC-CIE 2011; 833-838doi:https://doi.org/10.1115/DETC2011-47630
IDETC-CIE 2011; 839-847doi:https://doi.org/10.1115/DETC2011-47845
IDETC-CIE 2011; 849-858doi:https://doi.org/10.1115/DETC2011-48066
IDETC-CIE 2011; 859-864doi:https://doi.org/10.1115/DETC2011-48149
IDETC-CIE 2011; 865-873doi:https://doi.org/10.1115/DETC2011-48195
IDETC-CIE 2011; 875-880doi:https://doi.org/10.1115/DETC2011-48663
IDETC-CIE 2011; 881-886doi:https://doi.org/10.1115/DETC2011-48682
IDETC-CIE 2011; 887-895doi:https://doi.org/10.1115/DETC2011-48803
IDETC-CIE 2011; 897-905doi:https://doi.org/10.1115/DETC2011-48838
IDETC-CIE 2011; 907-915doi:https://doi.org/10.1115/DETC2011-48892
IDETC-CIE 2011; 917-925doi:https://doi.org/10.1115/DETC2011-48914
IDETC-CIE 2011; 927-933doi:https://doi.org/10.1115/DETC2011-48992

CAPPD: Modeling Tools and Metrics for Sustainable Manufacturing

IDETC-CIE 2011; 935-941doi:https://doi.org/10.1115/DETC2011-47327
IDETC-CIE 2011; 943-950doi:https://doi.org/10.1115/DETC2011-47491
IDETC-CIE 2011; 951-958doi:https://doi.org/10.1115/DETC2011-47664
IDETC-CIE 2011; 959-968doi:https://doi.org/10.1115/DETC2011-47984
IDETC-CIE 2011; 969-976doi:https://doi.org/10.1115/DETC2011-48117
IDETC-CIE 2011; 977-983doi:https://doi.org/10.1115/DETC2011-48273
IDETC-CIE 2011; 985-995doi:https://doi.org/10.1115/DETC2011-48500
IDETC-CIE 2011; 997-1002doi:https://doi.org/10.1115/DETC2011-48612
IDETC-CIE 2011; 1003-1010doi:https://doi.org/10.1115/DETC2011-48632
IDETC-CIE 2011; 1011-1017doi:https://doi.org/10.1115/DETC2011-48772
IDETC-CIE 2011; 1019-1028doi:https://doi.org/10.1115/DETC2011-48867

SEIKM: Advances in the Engineering of Complex and Large-Scale Systems

IDETC-CIE 2011; 1029-1043doi:https://doi.org/10.1115/DETC2011-47291
IDETC-CIE 2011; 1045-1054doi:https://doi.org/10.1115/DETC2011-47767
IDETC-CIE 2011; 1055-1062doi:https://doi.org/10.1115/DETC2011-48200
IDETC-CIE 2011; 1063-1075doi:https://doi.org/10.1115/DETC2011-48365
IDETC-CIE 2011; 1077-1088doi:https://doi.org/10.1115/DETC2011-48821

SEIKM: Design Informatics: Advances of Intelligent Information Processing and Knowledge Management in Engineering Design

IDETC-CIE 2011; 1089-1098doi:https://doi.org/10.1115/DETC2011-47313
IDETC-CIE 2011; 1099-1109doi:https://doi.org/10.1115/DETC2011-47425
IDETC-CIE 2011; 1111-1120doi:https://doi.org/10.1115/DETC2011-47733
IDETC-CIE 2011; 1121-1133doi:https://doi.org/10.1115/DETC2011-47768
IDETC-CIE 2011; 1135-1142doi:https://doi.org/10.1115/DETC2011-48064
IDETC-CIE 2011; 1143-1152doi:https://doi.org/10.1115/DETC2011-48181
IDETC-CIE 2011; 1153-1162doi:https://doi.org/10.1115/DETC2011-48240
IDETC-CIE 2011; 1163-1174doi:https://doi.org/10.1115/DETC2011-48537
IDETC-CIE 2011; 1175-1188doi:https://doi.org/10.1115/DETC2011-48684

SEIKM: Knowledge-Capture, Reuse, Management

IDETC-CIE 2011; 1189-1195doi:https://doi.org/10.1115/DETC2011-47631
IDETC-CIE 2011; 1197-1209doi:https://doi.org/10.1115/DETC2011-47849
IDETC-CIE 2011; 1211-1221doi:https://doi.org/10.1115/DETC2011-47920
IDETC-CIE 2011; 1223-1235doi:https://doi.org/10.1115/DETC2011-48346

SEIKM: Product Lifecycle Management

IDETC-CIE 2011; 1237-1244doi:https://doi.org/10.1115/DETC2011-47801
IDETC-CIE 2011; 1245-1255doi:https://doi.org/10.1115/DETC2011-48294
Topics: Design
IDETC-CIE 2011; 1257-1265doi:https://doi.org/10.1115/DETC2011-48520
IDETC-CIE 2011; 1267-1273doi:https://doi.org/10.1115/DETC2011-48600
IDETC-CIE 2011; 1275-1283doi:https://doi.org/10.1115/DETC2011-48631

SEIKM: Prognostics and Health Management

IDETC-CIE 2011; 1285-1295doi:https://doi.org/10.1115/DETC2011-47869
IDETC-CIE 2011; 1297-1306doi:https://doi.org/10.1115/DETC2011-48302
IDETC-CIE 2011; 1307-1316doi:https://doi.org/10.1115/DETC2011-48784
IDETC-CIE 2011; 1317-1328doi:https://doi.org/10.1115/DETC2011-48801

SEIKM: Systems Engineering

IDETC-CIE 2011; 1329-1339doi:https://doi.org/10.1115/DETC2011-47924
IDETC-CIE 2011; 1341-1349doi:https://doi.org/10.1115/DETC2011-48028
IDETC-CIE 2011; 1351-1360doi:https://doi.org/10.1115/DETC2011-48105
IDETC-CIE 2011; 1361-1369doi:https://doi.org/10.1115/DETC2011-48453

SEIKM: Systems Engineering, Information and Knowledge Management, General

IDETC-CIE 2011; 1371-1378doi:https://doi.org/10.1115/DETC2011-47825
IDETC-CIE 2011; 1379-1388doi:https://doi.org/10.1115/DETC2011-47965
IDETC-CIE 2011; 1389-1399doi:https://doi.org/10.1115/DETC2011-48278
IDETC-CIE 2011; 1401-1410doi:https://doi.org/10.1115/DETC2011-48335
IDETC-CIE 2011; 1411-1417doi:https://doi.org/10.1115/DETC2011-48997

VES: Virtual Environments and Systems, General

IDETC-CIE 2011; 1419-1428doi:https://doi.org/10.1115/DETC2011-47019
IDETC-CIE 2011; 1429-1438doi:https://doi.org/10.1115/DETC2011-47088
IDETC-CIE 2011; 1439-1449doi:https://doi.org/10.1115/DETC2011-47098
IDETC-CIE 2011; 1451-1461doi:https://doi.org/10.1115/DETC2011-47270
IDETC-CIE 2011; 1463-1470doi:https://doi.org/10.1115/DETC2011-47460
IDETC-CIE 2011; 1471-1480doi:https://doi.org/10.1115/DETC2011-47551
IDETC-CIE 2011; 1481-1490doi:https://doi.org/10.1115/DETC2011-47621
IDETC-CIE 2011; 1491-1498doi:https://doi.org/10.1115/DETC2011-47665
IDETC-CIE 2011; 1499-1506doi:https://doi.org/10.1115/DETC2011-47882
IDETC-CIE 2011; 1507-1514doi:https://doi.org/10.1115/DETC2011-47969
IDETC-CIE 2011; 1515-1523doi:https://doi.org/10.1115/DETC2011-48044
IDETC-CIE 2011; 1525-1531doi:https://doi.org/10.1115/DETC2011-48141
IDETC-CIE 2011; 1533-1543doi:https://doi.org/10.1115/DETC2011-48155
IDETC-CIE 2011; 1545-1554doi:https://doi.org/10.1115/DETC2011-48230
IDETC-CIE 2011; 1555-1563doi:https://doi.org/10.1115/DETC2011-48288
IDETC-CIE 2011; 1565-1574doi:https://doi.org/10.1115/DETC2011-48585
IDETC-CIE 2011; 1575-1580doi:https://doi.org/10.1115/DETC2011-48775
IDETC-CIE 2011; 1581-1588doi:https://doi.org/10.1115/DETC2011-48826
IDETC-CIE 2011; 1589-1598doi:https://doi.org/10.1115/DETC2011-48866
IDETC-CIE 2011; 1599-1608doi:https://doi.org/10.1115/DETC2011-48958
Topics: Design
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