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Proceedings Papers

Volume 3: 28th Computers and Information in Engineering Conference, Parts A and B

28th Computers and Information in Engineering Conference (CIE)

Agent-Based Modeling

IDETC-CIE 2008; 3-12doi:https://doi.org/10.1115/DETC2008-49202
IDETC-CIE 2008; 13-19doi:https://doi.org/10.1115/DETC2008-49291
IDETC-CIE 2008; 21-28doi:https://doi.org/10.1115/DETC2008-49326
IDETC-CIE 2008; 29-36doi:https://doi.org/10.1115/DETC2008-49441
IDETC-CIE 2008; 37-45doi:https://doi.org/10.1115/DETC2008-49498
IDETC-CIE 2008; 47-56doi:https://doi.org/10.1115/DETC2008-49642
IDETC-CIE 2008; 57-64doi:https://doi.org/10.1115/DETC2008-49661
IDETC-CIE 2008; 65-73doi:https://doi.org/10.1115/DETC2008-49670
IDETC-CIE 2008; 75-81doi:https://doi.org/10.1115/DETC2008-50039
IDETC-CIE 2008; 83-87doi:https://doi.org/10.1115/DETC2008-50101

CAPD: Computer-Aided Product Development

IDETC-CIE 2008; 89-97doi:https://doi.org/10.1115/DETC2008-49107
IDETC-CIE 2008; 99-109doi:https://doi.org/10.1115/DETC2008-49124
IDETC-CIE 2008; 111-120doi:https://doi.org/10.1115/DETC2008-49141
IDETC-CIE 2008; 121-130doi:https://doi.org/10.1115/DETC2008-49159
IDETC-CIE 2008; 131-139doi:https://doi.org/10.1115/DETC2008-49192
IDETC-CIE 2008; 141-150doi:https://doi.org/10.1115/DETC2008-49223
IDETC-CIE 2008; 151-158doi:https://doi.org/10.1115/DETC2008-49333
IDETC-CIE 2008; 159-169doi:https://doi.org/10.1115/DETC2008-49382
IDETC-CIE 2008; 171-178doi:https://doi.org/10.1115/DETC2008-49469
IDETC-CIE 2008; 179-186doi:https://doi.org/10.1115/DETC2008-49506
IDETC-CIE 2008; 187-197doi:https://doi.org/10.1115/DETC2008-49529
IDETC-CIE 2008; 199-208doi:https://doi.org/10.1115/DETC2008-49590
IDETC-CIE 2008; 209-221doi:https://doi.org/10.1115/DETC2008-49598
IDETC-CIE 2008; 223-230doi:https://doi.org/10.1115/DETC2008-49652
IDETC-CIE 2008; 231-240doi:https://doi.org/10.1115/DETC2008-49735
IDETC-CIE 2008; 241-253doi:https://doi.org/10.1115/DETC2008-49737
IDETC-CIE 2008; 255-261doi:https://doi.org/10.1115/DETC2008-49738
IDETC-CIE 2008; 263-269doi:https://doi.org/10.1115/DETC2008-49778
IDETC-CIE 2008; 271-281doi:https://doi.org/10.1115/DETC2008-49796
IDETC-CIE 2008; 283-289doi:https://doi.org/10.1115/DETC2008-49833
IDETC-CIE 2008; 291-300doi:https://doi.org/10.1115/DETC2008-49835
IDETC-CIE 2008; 301-306doi:https://doi.org/10.1115/DETC2008-49956
IDETC-CIE 2008; 307-315doi:https://doi.org/10.1115/DETC2008-49959
IDETC-CIE 2008; 317-327doi:https://doi.org/10.1115/DETC2008-49961
IDETC-CIE 2008; 329-342doi:https://doi.org/10.1115/DETC2008-49975
IDETC-CIE 2008; 343-352doi:https://doi.org/10.1115/DETC2008-50016
IDETC-CIE 2008; 353-365doi:https://doi.org/10.1115/DETC2008-50113

CES: Computers in Energy Systems

IDETC-CIE 2008; 367-374doi:https://doi.org/10.1115/DETC2008-49063
IDETC-CIE 2008; 375-380doi:https://doi.org/10.1115/DETC2008-49334
IDETC-CIE 2008; 381-397doi:https://doi.org/10.1115/DETC2008-49376
IDETC-CIE 2008; 399-407doi:https://doi.org/10.1115/DETC2008-49788
IDETC-CIE 2008; 409-417doi:https://doi.org/10.1115/DETC2008-50148

CIEd: Computers in Education

IDETC-CIE 2008; 419-425doi:https://doi.org/10.1115/DETC2008-49695
IDETC-CIE 2008; 427-432doi:https://doi.org/10.1115/DETC2008-49837
IDETC-CIE 2008; 433-441doi:https://doi.org/10.1115/DETC2008-50015

CTESA: Computational Technologies for Engineering Sciences Applications

IDETC-CIE 2008; 443-452doi:https://doi.org/10.1115/DETC2008-49066
IDETC-CIE 2008; 453-462doi:https://doi.org/10.1115/DETC2008-49067
IDETC-CIE 2008; 463-473doi:https://doi.org/10.1115/DETC2008-49101
IDETC-CIE 2008; 475-481doi:https://doi.org/10.1115/DETC2008-49110
IDETC-CIE 2008; 483-490doi:https://doi.org/10.1115/DETC2008-49248
IDETC-CIE 2008; 491-503doi:https://doi.org/10.1115/DETC2008-49255
IDETC-CIE 2008; 505-513doi:https://doi.org/10.1115/DETC2008-49274
IDETC-CIE 2008; 515-524doi:https://doi.org/10.1115/DETC2008-49489
IDETC-CIE 2008; 525-535doi:https://doi.org/10.1115/DETC2008-49654
IDETC-CIE 2008; 537-543doi:https://doi.org/10.1115/DETC2008-49696
IDETC-CIE 2008; 545-555doi:https://doi.org/10.1115/DETC2008-49732
IDETC-CIE 2008; 557-561doi:https://doi.org/10.1115/DETC2008-49849
IDETC-CIE 2008; 563-574doi:https://doi.org/10.1115/DETC2008-49936
IDETC-CIE 2008; 575-584doi:https://doi.org/10.1115/DETC2008-50001

EIM: Enterprise Information Management

IDETC-CIE 2008; 585-593doi:https://doi.org/10.1115/DETC2008-49155
IDETC-CIE 2008; 595-605doi:https://doi.org/10.1115/DETC2008-49417
IDETC-CIE 2008; 607-616doi:https://doi.org/10.1115/DETC2008-49720
IDETC-CIE 2008; 617-624doi:https://doi.org/10.1115/DETC2008-49730
IDETC-CIE 2008; 625-633doi:https://doi.org/10.1115/DETC2008-49803
IDETC-CIE 2008; 635-645doi:https://doi.org/10.1115/DETC2008-49934
IDETC-CIE 2008; 647-657doi:https://doi.org/10.1115/DETC2008-49948
IDETC-CIE 2008; 659-669doi:https://doi.org/10.1115/DETC2008-49989
IDETC-CIE 2008; 671-683doi:https://doi.org/10.1115/DETC2008-50086
IDETC-CIE 2008; 685-697doi:https://doi.org/10.1115/DETC2008-50099
IDETC-CIE 2008; 699-715doi:https://doi.org/10.1115/DETC2008-50135

Emerging Computational Methods for Product Design

IDETC-CIE 2008; 717-728doi:https://doi.org/10.1115/DETC2008-49432
IDETC-CIE 2008; 729-739doi:https://doi.org/10.1115/DETC2008-49576
Topics: Manifolds
IDETC-CIE 2008; 741-751doi:https://doi.org/10.1115/DETC2008-49626
IDETC-CIE 2008; 753-760doi:https://doi.org/10.1115/DETC2008-49709
IDETC-CIE 2008; 761-769doi:https://doi.org/10.1115/DETC2008-49919
IDETC-CIE 2008; 771-778doi:https://doi.org/10.1115/DETC2008-49986

Emotional Engineering

IDETC-CIE 2008; 779-784doi:https://doi.org/10.1115/DETC2008-49146
IDETC-CIE 2008; 785-789doi:https://doi.org/10.1115/DETC2008-49150
IDETC-CIE 2008; 791-800doi:https://doi.org/10.1115/DETC2008-49279
IDETC-CIE 2008; 801-810doi:https://doi.org/10.1115/DETC2008-49389
IDETC-CIE 2008; 811-819doi:https://doi.org/10.1115/DETC2008-49409
IDETC-CIE 2008; 821-827doi:https://doi.org/10.1115/DETC2008-49456
IDETC-CIE 2008; 829-839doi:https://doi.org/10.1115/DETC2008-49468
IDETC-CIE 2008; 841-850doi:https://doi.org/10.1115/DETC2008-49500
IDETC-CIE 2008; 851-858doi:https://doi.org/10.1115/DETC2008-49569
IDETC-CIE 2008; 859-866doi:https://doi.org/10.1115/DETC2008-49574
IDETC-CIE 2008; 867-876doi:https://doi.org/10.1115/DETC2008-49728
IDETC-CIE 2008; 877-885doi:https://doi.org/10.1115/DETC2008-49749
IDETC-CIE 2008; 887-896doi:https://doi.org/10.1115/DETC2008-49809
IDETC-CIE 2008; 897-900doi:https://doi.org/10.1115/DETC2008-49828
IDETC-CIE 2008; 901-908doi:https://doi.org/10.1115/DETC2008-49937
IDETC-CIE 2008; 909-921doi:https://doi.org/10.1115/DETC2008-50063

Integrated Systems Engineering

IDETC-CIE 2008; 923-930doi:https://doi.org/10.1115/DETC2008-49060
IDETC-CIE 2008; 931-941doi:https://doi.org/10.1115/DETC2008-49123
IDETC-CIE 2008; 943-955doi:https://doi.org/10.1115/DETC2008-49339
IDETC-CIE 2008; 957-967doi:https://doi.org/10.1115/DETC2008-49355
IDETC-CIE 2008; 969-975doi:https://doi.org/10.1115/DETC2008-49477
IDETC-CIE 2008; 977-982doi:https://doi.org/10.1115/DETC2008-49656
IDETC-CIE 2008; 983-991doi:https://doi.org/10.1115/DETC2008-49807
IDETC-CIE 2008; 993-1005doi:https://doi.org/10.1115/DETC2008-49970
IDETC-CIE 2008; 1007-1015doi:https://doi.org/10.1115/DETC2008-50150

Inverse Problems in Science and Engineering

IDETC-CIE 2008; 1017-1026doi:https://doi.org/10.1115/DETC2008-49062
IDETC-CIE 2008; 1027-1033doi:https://doi.org/10.1115/DETC2008-49090
IDETC-CIE 2008; 1035-1042doi:https://doi.org/10.1115/DETC2008-49197
IDETC-CIE 2008; 1043-1047doi:https://doi.org/10.1115/DETC2008-49228
IDETC-CIE 2008; 1049-1056doi:https://doi.org/10.1115/DETC2008-49547
IDETC-CIE 2008; 1057-1066doi:https://doi.org/10.1115/DETC2008-49595
IDETC-CIE 2008; 1067-1073doi:https://doi.org/10.1115/DETC2008-49653
IDETC-CIE 2008; 1075-1080doi:https://doi.org/10.1115/DETC2008-49754
IDETC-CIE 2008; 1081-1086doi:https://doi.org/10.1115/DETC2008-49790
IDETC-CIE 2008; 1087-1093doi:https://doi.org/10.1115/DETC2008-49811
IDETC-CIE 2008; 1095-1106doi:https://doi.org/10.1115/DETC2008-49940
IDETC-CIE 2008; 1107-1114doi:https://doi.org/10.1115/DETC2008-50078
IDETC-CIE 2008; 1115-1124doi:https://doi.org/10.1115/DETC2008-50133

NTC: Non-Traditional Computing

IDETC-CIE 2008; 1125-1133doi:https://doi.org/10.1115/DETC2008-49153
IDETC-CIE 2008; 1135-1141doi:https://doi.org/10.1115/DETC2008-49445
IDETC-CIE 2008; 1143-1152doi:https://doi.org/10.1115/DETC2008-49702
IDETC-CIE 2008; 1153-1161doi:https://doi.org/10.1115/DETC2008-49785
IDETC-CIE 2008; 1163-1176doi:https://doi.org/10.1115/DETC2008-49996

Panels and Posters

IDETC-CIE 2008; 1177-1183doi:https://doi.org/10.1115/DETC2008-49286
IDETC-CIE 2008; 1185-1193doi:https://doi.org/10.1115/DETC2008-49624
IDETC-CIE 2008; 1195-1199doi:https://doi.org/10.1115/DETC2008-50152
IDETC-CIE 2008; 1201-1206doi:https://doi.org/10.1115/DETC2008-50153
IDETC-CIE 2008; 1207-1208doi:https://doi.org/10.1115/DETC2008-50154
Topics: Design

Product Lifecycle Management

IDETC-CIE 2008; 1209-1215doi:https://doi.org/10.1115/DETC2008-49136
IDETC-CIE 2008; 1217-1225doi:https://doi.org/10.1115/DETC2008-49170
IDETC-CIE 2008; 1227-1236doi:https://doi.org/10.1115/DETC2008-49340
IDETC-CIE 2008; 1237-1245doi:https://doi.org/10.1115/DETC2008-49348
IDETC-CIE 2008; 1247-1256doi:https://doi.org/10.1115/DETC2008-49591
IDETC-CIE 2008; 1257-1266doi:https://doi.org/10.1115/DETC2008-49671
IDETC-CIE 2008; 1267-1275doi:https://doi.org/10.1115/DETC2008-49804
IDETC-CIE 2008; 1277-1291doi:https://doi.org/10.1115/DETC2008-49922
IDETC-CIE 2008; 1293-1301doi:https://doi.org/10.1115/DETC2008-49932
IDETC-CIE 2008; 1303-1308doi:https://doi.org/10.1115/DETC2008-49943
IDETC-CIE 2008; 1309-1317doi:https://doi.org/10.1115/DETC2008-50074
IDETC-CIE 2008; 1319-1326doi:https://doi.org/10.1115/DETC2008-50127

Prognostics and Health Management - PHM

IDETC-CIE 2008; 1327-1331doi:https://doi.org/10.1115/DETC2008-49323
IDETC-CIE 2008; 1333-1345doi:https://doi.org/10.1115/DETC2008-49421
IDETC-CIE 2008; 1347-1358doi:https://doi.org/10.1115/DETC2008-49638
IDETC-CIE 2008; 1359-1368doi:https://doi.org/10.1115/DETC2008-49772
IDETC-CIE 2008; 1369-1381doi:https://doi.org/10.1115/DETC2008-49859
IDETC-CIE 2008; 1383-1389doi:https://doi.org/10.1115/DETC2008-49907
IDETC-CIE 2008; 1391-1400doi:https://doi.org/10.1115/DETC2008-49938
IDETC-CIE 2008; 1401-1409doi:https://doi.org/10.1115/DETC2008-50104

Self-Optimizing Mechatronic Systems

IDETC-CIE 2008; 1411-1421doi:https://doi.org/10.1115/DETC2008-49475
IDETC-CIE 2008; 1423-1431doi:https://doi.org/10.1115/DETC2008-49521
IDETC-CIE 2008; 1433-1440doi:https://doi.org/10.1115/DETC2008-49800
IDETC-CIE 2008; 1441-1450doi:https://doi.org/10.1115/DETC2008-49881

VES: Virtual Environments and Systems

IDETC-CIE 2008; 1451-1460doi:https://doi.org/10.1115/DETC2008-49144
IDETC-CIE 2008; 1461-1472doi:https://doi.org/10.1115/DETC2008-49160
IDETC-CIE 2008; 1473-1479doi:https://doi.org/10.1115/DETC2008-49215
IDETC-CIE 2008; 1481-1491doi:https://doi.org/10.1115/DETC2008-49399
IDETC-CIE 2008; 1493-1502doi:https://doi.org/10.1115/DETC2008-49405
IDETC-CIE 2008; 1503-1511doi:https://doi.org/10.1115/DETC2008-49516
IDETC-CIE 2008; 1513-1521doi:https://doi.org/10.1115/DETC2008-49517
IDETC-CIE 2008; 1523-1531doi:https://doi.org/10.1115/DETC2008-49581
IDETC-CIE 2008; 1533-1540doi:https://doi.org/10.1115/DETC2008-49608
IDETC-CIE 2008; 1541-1545doi:https://doi.org/10.1115/DETC2008-49622
IDETC-CIE 2008; 1547-1560doi:https://doi.org/10.1115/DETC2008-49703
IDETC-CIE 2008; 1561-1570doi:https://doi.org/10.1115/DETC2008-49827
IDETC-CIE 2008; 1571-1578doi:https://doi.org/10.1115/DETC2008-49845
IDETC-CIE 2008; 1579-1587doi:https://doi.org/10.1115/DETC2008-49870
IDETC-CIE 2008; 1589-1593doi:https://doi.org/10.1115/DETC2008-50024
IDETC-CIE 2008; 1595-1604doi:https://doi.org/10.1115/DETC2008-50034
IDETC-CIE 2008; 1605-1611doi:https://doi.org/10.1115/DETC2008-50084
IDETC-CIE 2008; 1613-1624doi:https://doi.org/10.1115/DETC2008-50136
IDETC-CIE 2008; 1625-1635doi:https://doi.org/10.1115/DETC2008-50138

Volumetric, Air-Borne and Tangible Visualization

IDETC-CIE 2008; 1637-1647doi:https://doi.org/10.1115/DETC2008-49174
IDETC-CIE 2008; 1649-1659doi:https://doi.org/10.1115/DETC2008-49273
IDETC-CIE 2008; 1661-1669doi:https://doi.org/10.1115/DETC2008-49805
IDETC-CIE 2008; 1671-1677doi:https://doi.org/10.1115/DETC2008-50119
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