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Proceedings Papers

Volume 1: 34th Design Automation Conference, Parts A and B

34th Design Automation Conference (DAC)

Artificial Intelligence in Design

IDETC-CIE 2008; 3-13doi:https://doi.org/10.1115/DETC2008-49281
IDETC-CIE 2008; 15-24doi:https://doi.org/10.1115/DETC2008-49439
IDETC-CIE 2008; 25-34doi:https://doi.org/10.1115/DETC2008-49856
IDETC-CIE 2008; 35-42doi:https://doi.org/10.1115/DETC2008-49895
IDETC-CIE 2008; 43-51doi:https://doi.org/10.1115/DETC2008-49900

Collaborative and Automated Assembly Design

IDETC-CIE 2008; 53-59doi:https://doi.org/10.1115/DETC2008-49191
IDETC-CIE 2008; 61-72doi:https://doi.org/10.1115/DETC2008-49589
IDETC-CIE 2008; 73-81doi:https://doi.org/10.1115/DETC2008-49760
IDETC-CIE 2008; 83-91doi:https://doi.org/10.1115/DETC2008-50050

Computer-Aided Nano-Design

IDETC-CIE 2008; 93-101doi:https://doi.org/10.1115/DETC2008-49410
IDETC-CIE 2008; 103-111doi:https://doi.org/10.1115/DETC2008-49411
IDETC-CIE 2008; 113-122doi:https://doi.org/10.1115/DETC2008-49560
IDETC-CIE 2008; 123-132doi:https://doi.org/10.1115/DETC2008-49650

Conceptual Design Methods

IDETC-CIE 2008; 133-142doi:https://doi.org/10.1115/DETC2008-49648
IDETC-CIE 2008; 143-150doi:https://doi.org/10.1115/DETC2008-49675
IDETC-CIE 2008; 151-161doi:https://doi.org/10.1115/DETC2008-49700
IDETC-CIE 2008; 163-172doi:https://doi.org/10.1115/DETC2008-49726
IDETC-CIE 2008; 173-183doi:https://doi.org/10.1115/DETC2008-50005

Concurrent/Collaborative Design

IDETC-CIE 2008; 185-194doi:https://doi.org/10.1115/DETC2008-49154
IDETC-CIE 2008; 195-204doi:https://doi.org/10.1115/DETC2008-49541
IDETC-CIE 2008; 205-218doi:https://doi.org/10.1115/DETC2008-49799
IDETC-CIE 2008; 219-229doi:https://doi.org/10.1115/DETC2008-49865
IDETC-CIE 2008; 231-243doi:https://doi.org/10.1115/DETC2008-49976

Data-Driven Risk Management for System Design

IDETC-CIE 2008; 245-258doi:https://doi.org/10.1115/DETC2008-49481
IDETC-CIE 2008; 259-272doi:https://doi.org/10.1115/DETC2008-49663
IDETC-CIE 2008; 273-284doi:https://doi.org/10.1115/DETC2008-50006
IDETC-CIE 2008; 285-296doi:https://doi.org/10.1115/DETC2008-50079

Decomposition Methods in Design

IDETC-CIE 2008; 297-306doi:https://doi.org/10.1115/DETC2008-49249
IDETC-CIE 2008; 307-317doi:https://doi.org/10.1115/DETC2008-49542
IDETC-CIE 2008; 319-328doi:https://doi.org/10.1115/DETC2008-49904
IDETC-CIE 2008; 329-340doi:https://doi.org/10.1115/DETC2008-50029

Design and Development of Reconfigurable Systems

IDETC-CIE 2008; 341-349doi:https://doi.org/10.1115/DETC2008-49236
IDETC-CIE 2008; 351-366doi:https://doi.org/10.1115/DETC2008-49891
IDETC-CIE 2008; 367-376doi:https://doi.org/10.1115/DETC2008-49971

Design for Market Systems

IDETC-CIE 2008; 377-391doi:https://doi.org/10.1115/DETC2008-49137
IDETC-CIE 2008; 393-402doi:https://doi.org/10.1115/DETC2008-49143
IDETC-CIE 2008; 403-415doi:https://doi.org/10.1115/DETC2008-49176
IDETC-CIE 2008; 417-426doi:https://doi.org/10.1115/DETC2008-49210
IDETC-CIE 2008; 427-436doi:https://doi.org/10.1115/DETC2008-49561
IDETC-CIE 2008; 437-446doi:https://doi.org/10.1115/DETC2008-49637
IDETC-CIE 2008; 447-459doi:https://doi.org/10.1115/DETC2008-50071
IDETC-CIE 2008; 461-468doi:https://doi.org/10.1115/DETC2008-50073

Design Optimization Algorithms

IDETC-CIE 2008; 469-478doi:https://doi.org/10.1115/DETC2008-49127
IDETC-CIE 2008; 479-487doi:https://doi.org/10.1115/DETC2008-49211
IDETC-CIE 2008; 489-497doi:https://doi.org/10.1115/DETC2008-49256
IDETC-CIE 2008; 499-509doi:https://doi.org/10.1115/DETC2008-49681
IDETC-CIE 2008; 511-520doi:https://doi.org/10.1115/DETC2008-49684
IDETC-CIE 2008; 521-530doi:https://doi.org/10.1115/DETC2008-49727
IDETC-CIE 2008; 531-541doi:https://doi.org/10.1115/DETC2008-49991
IDETC-CIE 2008; 543-552doi:https://doi.org/10.1115/DETC2008-50097

Designing for Human Variability

IDETC-CIE 2008; 553-559doi:https://doi.org/10.1115/DETC2008-49230
IDETC-CIE 2008; 561-569doi:https://doi.org/10.1115/DETC2008-49483
IDETC-CIE 2008; 571-580doi:https://doi.org/10.1115/DETC2008-50081
IDETC-CIE 2008; 581-588doi:https://doi.org/10.1115/DETC2008-50091

Direct Digital Manufacturing

IDETC-CIE 2008; 589-596doi:https://doi.org/10.1115/DETC2008-49725
IDETC-CIE 2008; 597-603doi:https://doi.org/10.1115/DETC2008-50062
IDETC-CIE 2008; 605-615doi:https://doi.org/10.1115/DETC2008-50123

Geometric Modeling and Algorithms for Design and Manufacturing

IDETC-CIE 2008; 617-625doi:https://doi.org/10.1115/DETC2008-49078
IDETC-CIE 2008; 627-635doi:https://doi.org/10.1115/DETC2008-49438
IDETC-CIE 2008; 637-645doi:https://doi.org/10.1115/DETC2008-49447
IDETC-CIE 2008; 647-657doi:https://doi.org/10.1115/DETC2008-49524
IDETC-CIE 2008; 659-669doi:https://doi.org/10.1115/DETC2008-49604
IDETC-CIE 2008; 671-682doi:https://doi.org/10.1115/DETC2008-49659
IDETC-CIE 2008; 683-691doi:https://doi.org/10.1115/DETC2008-49698
IDETC-CIE 2008; 693-700doi:https://doi.org/10.1115/DETC2008-49708
Topics: Inspection
IDETC-CIE 2008; 701-710doi:https://doi.org/10.1115/DETC2008-49798
IDETC-CIE 2008; 711-717doi:https://doi.org/10.1115/DETC2008-50105

Innovative Industrial Applications, Developments, and Perspectives

IDETC-CIE 2008; 719-726doi:https://doi.org/10.1115/DETC2008-49188
IDETC-CIE 2008; 727-736doi:https://doi.org/10.1115/DETC2008-49639
IDETC-CIE 2008; 737-747doi:https://doi.org/10.1115/DETC2008-49953
IDETC-CIE 2008; 749-756doi:https://doi.org/10.1115/DETC2008-50017
IDETC-CIE 2008; 757-766doi:https://doi.org/10.1115/DETC2008-50054

Kinematics and Mechanism Design Automation

IDETC-CIE 2008; 767-775doi:https://doi.org/10.1115/DETC2008-49558
IDETC-CIE 2008; 777-787doi:https://doi.org/10.1115/DETC2008-49645
IDETC-CIE 2008; 789-797doi:https://doi.org/10.1115/DETC2008-50093
IDETC-CIE 2008; 799-805doi:https://doi.org/10.1115/DETC2008-50137

Managing Design and Analysis Processes

IDETC-CIE 2008; 807-822doi:https://doi.org/10.1115/DETC2008-49356
IDETC-CIE 2008; 823-840doi:https://doi.org/10.1115/DETC2008-49395
IDETC-CIE 2008; 841-850doi:https://doi.org/10.1115/DETC2008-49734

Metamodel-Based Design Optimization

IDETC-CIE 2008; 851-860doi:https://doi.org/10.1115/DETC2008-49240
IDETC-CIE 2008; 861-872doi:https://doi.org/10.1115/DETC2008-49479
IDETC-CIE 2008; 873-882doi:https://doi.org/10.1115/DETC2008-49994
IDETC-CIE 2008; 883-893doi:https://doi.org/10.1115/DETC2008-50061

Multidisciplinary Design Optimization

IDETC-CIE 2008; 895-905doi:https://doi.org/10.1115/DETC2008-49148
IDETC-CIE 2008; 907-916doi:https://doi.org/10.1115/DETC2008-49444
IDETC-CIE 2008; 917-926doi:https://doi.org/10.1115/DETC2008-49823
IDETC-CIE 2008; 927-936doi:https://doi.org/10.1115/DETC2008-50038

Product and System Optimization

IDETC-CIE 2008; 937-947doi:https://doi.org/10.1115/DETC2008-49425
IDETC-CIE 2008; 949-959doi:https://doi.org/10.1115/DETC2008-49435
IDETC-CIE 2008; 961-968doi:https://doi.org/10.1115/DETC2008-49871
IDETC-CIE 2008; 969-976doi:https://doi.org/10.1115/DETC2008-50027
IDETC-CIE 2008; 977-987doi:https://doi.org/10.1115/DETC2008-50068

Product Family and Product Platform Design Optimization

IDETC-CIE 2008; 989-998doi:https://doi.org/10.1115/DETC2008-49239
IDETC-CIE 2008; 999-1009doi:https://doi.org/10.1115/DETC2008-49335
IDETC-CIE 2008; 1011-1017doi:https://doi.org/10.1115/DETC2008-49428
IDETC-CIE 2008; 1019-1029doi:https://doi.org/10.1115/DETC2008-49429
Topics: Design
IDETC-CIE 2008; 1031-1041doi:https://doi.org/10.1115/DETC2008-49544
IDETC-CIE 2008; 1043-1052doi:https://doi.org/10.1115/DETC2008-49597
IDETC-CIE 2008; 1053-1066doi:https://doi.org/10.1115/DETC2008-49683
IDETC-CIE 2008; 1067-1076doi:https://doi.org/10.1115/DETC2008-49739
IDETC-CIE 2008; 1077-1091doi:https://doi.org/10.1115/DETC2008-50023
Topics: Design

Simulation-Based Design Under Uncertainty

IDETC-CIE 2008; 1093-1107doi:https://doi.org/10.1115/DETC2008-49156
IDETC-CIE 2008; 1109-1122doi:https://doi.org/10.1115/DETC2008-49168
IDETC-CIE 2008; 1123-1132doi:https://doi.org/10.1115/DETC2008-49415
IDETC-CIE 2008; 1133-1143doi:https://doi.org/10.1115/DETC2008-49493
IDETC-CIE 2008; 1145-1156doi:https://doi.org/10.1115/DETC2008-49494

Structural/Topology Optimization and Its Applications

IDETC-CIE 2008; 1157-1166doi:https://doi.org/10.1115/DETC2008-49098
IDETC-CIE 2008; 1167-1174doi:https://doi.org/10.1115/DETC2008-49134
IDETC-CIE 2008; 1175-1184doi:https://doi.org/10.1115/DETC2008-49187
IDETC-CIE 2008; 1185-1193doi:https://doi.org/10.1115/DETC2008-49394
IDETC-CIE 2008; 1195-1206doi:https://doi.org/10.1115/DETC2008-49563
IDETC-CIE 2008; 1207-1216doi:https://doi.org/10.1115/DETC2008-49582
IDETC-CIE 2008; 1217-1225doi:https://doi.org/10.1115/DETC2008-49618
IDETC-CIE 2008; 1227-1234doi:https://doi.org/10.1115/DETC2008-49857
IDETC-CIE 2008; 1235-1245doi:https://doi.org/10.1115/DETC2008-50037
IDETC-CIE 2008; 1247-1253doi:https://doi.org/10.1115/DETC2008-50106

Validating Predictive Models in Engineering Design

IDETC-CIE 2008; 1255-1264doi:https://doi.org/10.1115/DETC2008-49336
IDETC-CIE 2008; 1265-1273doi:https://doi.org/10.1115/DETC2008-49662
IDETC-CIE 2008; 1275-1286doi:https://doi.org/10.1115/DETC2008-49669
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