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Proceedings Papers

Volume 2: 31st Design Automation Conference, Parts A and B

31st Design Automation Conference

Artificial Intelligence in Design

IDETC-CIE 2005; 5-12doi:https://doi.org/10.1115/DETC2005-84955
IDETC-CIE 2005; 13-23doi:https://doi.org/10.1115/DETC2005-85125
IDETC-CIE 2005; 25-31doi:https://doi.org/10.1115/DETC2005-85181
IDETC-CIE 2005; 33-42doi:https://doi.org/10.1115/DETC2005-85295
IDETC-CIE 2005; 43-50doi:https://doi.org/10.1115/DETC2005-85303

Collaborative Design

IDETC-CIE 2005; 51-58doi:https://doi.org/10.1115/DETC2005-84240
IDETC-CIE 2005; 59-69doi:https://doi.org/10.1115/DETC2005-84807
Topics: Design
IDETC-CIE 2005; 71-79doi:https://doi.org/10.1115/DETC2005-85124
IDETC-CIE 2005; 81-90doi:https://doi.org/10.1115/DETC2005-85160
IDETC-CIE 2005; 91-99doi:https://doi.org/10.1115/DETC2005-85428

Computational Conceptual Design

IDETC-CIE 2005; 101-108doi:https://doi.org/10.1115/DETC2005-84414
Topics: Design
IDETC-CIE 2005; 109-122doi:https://doi.org/10.1115/DETC2005-84956
IDETC-CIE 2005; 123-129doi:https://doi.org/10.1115/DETC2005-85034
IDETC-CIE 2005; 131-140doi:https://doi.org/10.1115/DETC2005-85403
IDETC-CIE 2005; 141-154doi:https://doi.org/10.1115/DETC2005-85546

Decision-Based Design

IDETC-CIE 2005; 155-164doi:https://doi.org/10.1115/DETC2005-84685
IDETC-CIE 2005; 165-175doi:https://doi.org/10.1115/DETC2005-84765
Topics: Design
IDETC-CIE 2005; 177-187doi:https://doi.org/10.1115/DETC2005-84766
IDETC-CIE 2005; 189-198doi:https://doi.org/10.1115/DETC2005-84812
IDETC-CIE 2005; 199-211doi:https://doi.org/10.1115/DETC2005-85147

Design Error and Its Applications

IDETC-CIE 2005; 213-218doi:https://doi.org/10.1115/DETC2005-84541
IDETC-CIE 2005; 219-224doi:https://doi.org/10.1115/DETC2005-84542
IDETC-CIE 2005; 225-230doi:https://doi.org/10.1115/DETC2005-84543
IDETC-CIE 2005; 231-241doi:https://doi.org/10.1115/DETC2005-84555

Design Optimization Algorithms

IDETC-CIE 2005; 243-252doi:https://doi.org/10.1115/DETC2005-84259
IDETC-CIE 2005; 253-263doi:https://doi.org/10.1115/DETC2005-84425
IDETC-CIE 2005; 265-275doi:https://doi.org/10.1115/DETC2005-84790
IDETC-CIE 2005; 277-287doi:https://doi.org/10.1115/DETC2005-84853
IDETC-CIE 2005; 289-294doi:https://doi.org/10.1115/DETC2005-84942
IDETC-CIE 2005; 295-303doi:https://doi.org/10.1115/DETC2005-85202
IDETC-CIE 2005; 305-319doi:https://doi.org/10.1115/DETC2005-85245
IDETC-CIE 2005; 321-330doi:https://doi.org/10.1115/DETC2005-85305
IDETC-CIE 2005; 331-336doi:https://doi.org/10.1115/DETC2005-85342
IDETC-CIE 2005; 337-344doi:https://doi.org/10.1115/DETC2005-85348
IDETC-CIE 2005; 345-354doi:https://doi.org/10.1115/DETC2005-85353
IDETC-CIE 2005; 355-363doi:https://doi.org/10.1115/DETC2005-85449

Education in Design Automation

IDETC-CIE 2005; 365-370doi:https://doi.org/10.1115/DETC2005-84330
IDETC-CIE 2005; 371-380doi:https://doi.org/10.1115/DETC2005-84633
IDETC-CIE 2005; 381-390doi:https://doi.org/10.1115/DETC2005-85136
IDETC-CIE 2005; 391-399doi:https://doi.org/10.1115/DETC2005-85231

General

IDETC-CIE 2005; 401-412doi:https://doi.org/10.1115/DETC2005-85111
IDETC-CIE 2005; 413-426doi:https://doi.org/10.1115/DETC2005-85322
IDETC-CIE 2005; 427-436doi:https://doi.org/10.1115/DETC2005-85414
IDETC-CIE 2005; 437-446doi:https://doi.org/10.1115/DETC2005-85486

Geometric Algorithms in Design, Manufacturing, and Rapid Prototyping

IDETC-CIE 2005; 447-455doi:https://doi.org/10.1115/DETC2005-84214
IDETC-CIE 2005; 457-466doi:https://doi.org/10.1115/DETC2005-84287
IDETC-CIE 2005; 467-478doi:https://doi.org/10.1115/DETC2005-84343
IDETC-CIE 2005; 479-486doi:https://doi.org/10.1115/DETC2005-84738
IDETC-CIE 2005; 487-496doi:https://doi.org/10.1115/DETC2005-85045
IDETC-CIE 2005; 497-507doi:https://doi.org/10.1115/DETC2005-85115
IDETC-CIE 2005; 509-520doi:https://doi.org/10.1115/DETC2005-85122
IDETC-CIE 2005; 521-531doi:https://doi.org/10.1115/DETC2005-85260
IDETC-CIE 2005; 533-542doi:https://doi.org/10.1115/DETC2005-85408
IDETC-CIE 2005; 543-553doi:https://doi.org/10.1115/DETC2005-85431
IDETC-CIE 2005; 555-564doi:https://doi.org/10.1115/DETC2005-85479
IDETC-CIE 2005; 565-575doi:https://doi.org/10.1115/DETC2005-85513
IDETC-CIE 2005; 577-585doi:https://doi.org/10.1115/DETC2005-85528
IDETC-CIE 2005; 587-597doi:https://doi.org/10.1115/DETC2005-85541

Industrial Applications

IDETC-CIE 2005; 599-602doi:https://doi.org/10.1115/DETC2005-84124
IDETC-CIE 2005; 603-608doi:https://doi.org/10.1115/DETC2005-84274
IDETC-CIE 2005; 609-613doi:https://doi.org/10.1115/DETC2005-84367
IDETC-CIE 2005; 615-626doi:https://doi.org/10.1115/DETC2005-84768
IDETC-CIE 2005; 627-636doi:https://doi.org/10.1115/DETC2005-84794
IDETC-CIE 2005; 637-646doi:https://doi.org/10.1115/DETC2005-84968
IDETC-CIE 2005; 647-653doi:https://doi.org/10.1115/DETC2005-85097
IDETC-CIE 2005; 655-663doi:https://doi.org/10.1115/DETC2005-85455
IDETC-CIE 2005; 665-670doi:https://doi.org/10.1115/DETC2005-85473
IDETC-CIE 2005; 671-680doi:https://doi.org/10.1115/DETC2005-85489
IDETC-CIE 2005; 681-689doi:https://doi.org/10.1115/DETC2005-85502
IDETC-CIE 2005; 691-698doi:https://doi.org/10.1115/DETC2005-85509

Knowledge Management in Design

IDETC-CIE 2005; 699-708doi:https://doi.org/10.1115/DETC2005-84079
IDETC-CIE 2005; 709-718doi:https://doi.org/10.1115/DETC2005-84869
IDETC-CIE 2005; 719-727doi:https://doi.org/10.1115/DETC2005-85284
IDETC-CIE 2005; 729-742doi:https://doi.org/10.1115/DETC2005-85686

Metamodeling Based Design Optimization

IDETC-CIE 2005; 743-757doi:https://doi.org/10.1115/DETC2005-85041
IDETC-CIE 2005; 759-771doi:https://doi.org/10.1115/DETC2005-85043
IDETC-CIE 2005; 773-783doi:https://doi.org/10.1115/DETC2005-85146
IDETC-CIE 2005; 785-798doi:https://doi.org/10.1115/DETC2005-85406
IDETC-CIE 2005; 799-806doi:https://doi.org/10.1115/DETC2005-85469

Multiscale Computational Design of Products and Materials

IDETC-CIE 2005; 807-821doi:https://doi.org/10.1115/DETC2005-85061
IDETC-CIE 2005; 823-834doi:https://doi.org/10.1115/DETC2005-85148
IDETC-CIE 2005; 835-843doi:https://doi.org/10.1115/DETC2005-85290
IDETC-CIE 2005; 845-857doi:https://doi.org/10.1115/DETC2005-85316
IDETC-CIE 2005; 859-870doi:https://doi.org/10.1115/DETC2005-85335
Topics: Design

New Problems in Topology Optimization

IDETC-CIE 2005; 871-879doi:https://doi.org/10.1115/DETC2005-84751
IDETC-CIE 2005; 881-887doi:https://doi.org/10.1115/DETC2005-84761
IDETC-CIE 2005; 889-898doi:https://doi.org/10.1115/DETC2005-84904
IDETC-CIE 2005; 899-907doi:https://doi.org/10.1115/DETC2005-84965
IDETC-CIE 2005; 909-919doi:https://doi.org/10.1115/DETC2005-85176
IDETC-CIE 2005; 921-930doi:https://doi.org/10.1115/DETC2005-85518
IDETC-CIE 2005; 931-937doi:https://doi.org/10.1115/DETC2005-85587
IDETC-CIE 2005; 939-945doi:https://doi.org/10.1115/DETC2005-85605

Product Families and Product Platforms

IDETC-CIE 2005; 947-957doi:https://doi.org/10.1115/DETC2005-84454
IDETC-CIE 2005; 959-968doi:https://doi.org/10.1115/DETC2005-84817
Topics: Design
IDETC-CIE 2005; 969-978doi:https://doi.org/10.1115/DETC2005-84818
IDETC-CIE 2005; 979-988doi:https://doi.org/10.1115/DETC2005-84888
IDETC-CIE 2005; 989-998doi:https://doi.org/10.1115/DETC2005-84890
IDETC-CIE 2005; 999-1008doi:https://doi.org/10.1115/DETC2005-84905
IDETC-CIE 2005; 1009-1018doi:https://doi.org/10.1115/DETC2005-84927
IDETC-CIE 2005; 1019-1028doi:https://doi.org/10.1115/DETC2005-85016
IDETC-CIE 2005; 1029-1051doi:https://doi.org/10.1115/DETC2005-85164
IDETC-CIE 2005; 1053-1068doi:https://doi.org/10.1115/DETC2005-85313
IDETC-CIE 2005; 1069-1078doi:https://doi.org/10.1115/DETC2005-85336
IDETC-CIE 2005; 1079-1089doi:https://doi.org/10.1115/DETC2005-85443
Topics: Design
IDETC-CIE 2005; 1091-1102doi:https://doi.org/10.1115/DETC2005-85559

Simulation-Based Design Under Uncertainty

IDETC-CIE 2005; 1103-1109doi:https://doi.org/10.1115/DETC2005-84179
IDETC-CIE 2005; 1111-1121doi:https://doi.org/10.1115/DETC2005-84489
IDETC-CIE 2005; 1123-1132doi:https://doi.org/10.1115/DETC2005-84495
IDETC-CIE 2005; 1133-1142doi:https://doi.org/10.1115/DETC2005-84514
IDETC-CIE 2005; 1143-1152doi:https://doi.org/10.1115/DETC2005-84523
IDETC-CIE 2005; 1153-1161doi:https://doi.org/10.1115/DETC2005-84693
IDETC-CIE 2005; 1163-1172doi:https://doi.org/10.1115/DETC2005-84891
IDETC-CIE 2005; 1173-1182doi:https://doi.org/10.1115/DETC2005-84928
IDETC-CIE 2005; 1183-1193doi:https://doi.org/10.1115/DETC2005-84984
IDETC-CIE 2005; 1195-1204doi:https://doi.org/10.1115/DETC2005-85019
IDETC-CIE 2005; 1205-1213doi:https://doi.org/10.1115/DETC2005-85042
IDETC-CIE 2005; 1215-1224doi:https://doi.org/10.1115/DETC2005-85056
IDETC-CIE 2005; 1225-1232doi:https://doi.org/10.1115/DETC2005-85064
IDETC-CIE 2005; 1233-1242doi:https://doi.org/10.1115/DETC2005-85095
IDETC-CIE 2005; 1243-1251doi:https://doi.org/10.1115/DETC2005-85137
IDETC-CIE 2005; 1253-1261doi:https://doi.org/10.1115/DETC2005-85253
IDETC-CIE 2005; 1263-1271doi:https://doi.org/10.1115/DETC2005-85384
IDETC-CIE 2005; 1273-1281doi:https://doi.org/10.1115/DETC2005-85490

Visualization and Virtual Reality in Design

IDETC-CIE 2005; 1283-1293doi:https://doi.org/10.1115/DETC2005-84457
IDETC-CIE 2005; 1295-1300doi:https://doi.org/10.1115/DETC2005-84496
IDETC-CIE 2005; 1301-1308doi:https://doi.org/10.1115/DETC2005-84813
IDETC-CIE 2005; 1309-1319doi:https://doi.org/10.1115/DETC2005-85163
IDETC-CIE 2005; 1321-1331doi:https://doi.org/10.1115/DETC2005-85458
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