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Proceedings Papers

ASME 2004 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 28–October 2, 2004
Salt Lake City, Utah, USA
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4697-0
In This Volume
Volume 4: 24th Computers and Information in Engineering Conference

24th Computers and Information in Engineering Conference

IDETC-CIE 2004; 1-10doi:https://doi.org/10.1115/DETC2004-57646
IDETC-CIE 2004; 11-18doi:https://doi.org/10.1115/DETC2004-57647
IDETC-CIE 2004; 19-25doi:https://doi.org/10.1115/DETC2004-57648
IDETC-CIE 2004; 27-30doi:https://doi.org/10.1115/DETC2004-57649
IDETC-CIE 2004; 31-34doi:https://doi.org/10.1115/DETC2004-57650
IDETC-CIE 2004; 35-44doi:https://doi.org/10.1115/DETC2004-57651
IDETC-CIE 2004; 45-51doi:https://doi.org/10.1115/DETC2004-57652
IDETC-CIE 2004; 53-60doi:https://doi.org/10.1115/DETC2004-57653
IDETC-CIE 2004; 61-67doi:https://doi.org/10.1115/DETC2004-57654
IDETC-CIE 2004; 69-77doi:https://doi.org/10.1115/DETC2004-57655
IDETC-CIE 2004; 79-89doi:https://doi.org/10.1115/DETC2004-57656
IDETC-CIE 2004; 91-98doi:https://doi.org/10.1115/DETC2004-57657
IDETC-CIE 2004; 99-105doi:https://doi.org/10.1115/DETC2004-57658
IDETC-CIE 2004; 107-112doi:https://doi.org/10.1115/DETC2004-57659
Topics: Design
IDETC-CIE 2004; 113-122doi:https://doi.org/10.1115/DETC2004-57660
IDETC-CIE 2004; 123-129doi:https://doi.org/10.1115/DETC2004-57662
IDETC-CIE 2004; 131-140doi:https://doi.org/10.1115/DETC2004-57663
IDETC-CIE 2004; 141-146doi:https://doi.org/10.1115/DETC2004-57664
IDETC-CIE 2004; 147-154doi:https://doi.org/10.1115/DETC2004-57665
IDETC-CIE 2004; 155-164doi:https://doi.org/10.1115/DETC2004-57666
IDETC-CIE 2004; 165-172doi:https://doi.org/10.1115/DETC2004-57667
IDETC-CIE 2004; 173-182doi:https://doi.org/10.1115/DETC2004-57668
IDETC-CIE 2004; 183-192doi:https://doi.org/10.1115/DETC2004-57669
IDETC-CIE 2004; 193-200doi:https://doi.org/10.1115/DETC2004-57670
IDETC-CIE 2004; 201-207doi:https://doi.org/10.1115/DETC2004-57671
IDETC-CIE 2004; 209-216doi:https://doi.org/10.1115/DETC2004-57672
IDETC-CIE 2004; 217-223doi:https://doi.org/10.1115/DETC2004-57673
IDETC-CIE 2004; 225-231doi:https://doi.org/10.1115/DETC2004-57674
IDETC-CIE 2004; 233-241doi:https://doi.org/10.1115/DETC2004-57675
IDETC-CIE 2004; 243-251doi:https://doi.org/10.1115/DETC2004-57676
IDETC-CIE 2004; 253-259doi:https://doi.org/10.1115/DETC2004-57677
IDETC-CIE 2004; 261-267doi:https://doi.org/10.1115/DETC2004-57678
IDETC-CIE 2004; 269-273doi:https://doi.org/10.1115/DETC2004-57679
IDETC-CIE 2004; 275-284doi:https://doi.org/10.1115/DETC2004-57680
IDETC-CIE 2004; 285-298doi:https://doi.org/10.1115/DETC2004-57681
IDETC-CIE 2004; 299-308doi:https://doi.org/10.1115/DETC2004-57682
IDETC-CIE 2004; 309-318doi:https://doi.org/10.1115/DETC2004-57683
IDETC-CIE 2004; 319-327doi:https://doi.org/10.1115/DETC2004-57684
IDETC-CIE 2004; 329-335doi:https://doi.org/10.1115/DETC2004-57685
IDETC-CIE 2004; 337-346doi:https://doi.org/10.1115/DETC2004-57686
IDETC-CIE 2004; 347-355doi:https://doi.org/10.1115/DETC2004-57687
IDETC-CIE 2004; 357-366doi:https://doi.org/10.1115/DETC2004-57688
IDETC-CIE 2004; 367-375doi:https://doi.org/10.1115/DETC2004-57689
IDETC-CIE 2004; 377-386doi:https://doi.org/10.1115/DETC2004-57690
IDETC-CIE 2004; 387-399doi:https://doi.org/10.1115/DETC2004-57691
IDETC-CIE 2004; 401-410doi:https://doi.org/10.1115/DETC2004-57692
IDETC-CIE 2004; 411-419doi:https://doi.org/10.1115/DETC2004-57693
IDETC-CIE 2004; 421-431doi:https://doi.org/10.1115/DETC2004-57694
IDETC-CIE 2004; 433-442doi:https://doi.org/10.1115/DETC2004-57695
IDETC-CIE 2004; 443-449doi:https://doi.org/10.1115/DETC2004-57696
IDETC-CIE 2004; 451-460doi:https://doi.org/10.1115/DETC2004-57697
IDETC-CIE 2004; 461-469doi:https://doi.org/10.1115/DETC2004-57698
IDETC-CIE 2004; 471-482doi:https://doi.org/10.1115/DETC2004-57699
IDETC-CIE 2004; 483-492doi:https://doi.org/10.1115/DETC2004-57700
IDETC-CIE 2004; 493-500doi:https://doi.org/10.1115/DETC2004-57701
IDETC-CIE 2004; 501-510doi:https://doi.org/10.1115/DETC2004-57702
IDETC-CIE 2004; 511-519doi:https://doi.org/10.1115/DETC2004-57703
IDETC-CIE 2004; 521-525doi:https://doi.org/10.1115/DETC2004-57704
IDETC-CIE 2004; 527-536doi:https://doi.org/10.1115/DETC2004-57705
IDETC-CIE 2004; 537-542doi:https://doi.org/10.1115/DETC2004-57706
IDETC-CIE 2004; 543-552doi:https://doi.org/10.1115/DETC2004-57707
IDETC-CIE 2004; 553-562doi:https://doi.org/10.1115/DETC2004-57708
IDETC-CIE 2004; 563-574doi:https://doi.org/10.1115/DETC2004-57709
IDETC-CIE 2004; 575-587doi:https://doi.org/10.1115/DETC2004-57710
IDETC-CIE 2004; 589-597doi:https://doi.org/10.1115/DETC2004-57711
IDETC-CIE 2004; 599-609doi:https://doi.org/10.1115/DETC2004-57712
IDETC-CIE 2004; 611-625doi:https://doi.org/10.1115/DETC2004-57713
IDETC-CIE 2004; 627-636doi:https://doi.org/10.1115/DETC2004-57714
IDETC-CIE 2004; 637-644doi:https://doi.org/10.1115/DETC2004-57715
IDETC-CIE 2004; 645-652doi:https://doi.org/10.1115/DETC2004-57716
IDETC-CIE 2004; 653-659doi:https://doi.org/10.1115/DETC2004-57717
IDETC-CIE 2004; 661-669doi:https://doi.org/10.1115/DETC2004-57718
IDETC-CIE 2004; 671-682doi:https://doi.org/10.1115/DETC2004-57719
IDETC-CIE 2004; 683-692doi:https://doi.org/10.1115/DETC2004-57720
Topics: Modeling
IDETC-CIE 2004; 693-701doi:https://doi.org/10.1115/DETC2004-57721
IDETC-CIE 2004; 703-714doi:https://doi.org/10.1115/DETC2004-57722
IDETC-CIE 2004; 715-721doi:https://doi.org/10.1115/DETC2004-57723
IDETC-CIE 2004; 723-733doi:https://doi.org/10.1115/DETC2004-57724
IDETC-CIE 2004; 735-744doi:https://doi.org/10.1115/DETC2004-57725
IDETC-CIE 2004; 747-757doi:https://doi.org/10.1115/DETC2004-57726
IDETC-CIE 2004; 759-770doi:https://doi.org/10.1115/DETC2004-57727
IDETC-CIE 2004; 771-781doi:https://doi.org/10.1115/DETC2004-57729
IDETC-CIE 2004; 783-789doi:https://doi.org/10.1115/DETC2004-57730
IDETC-CIE 2004; 791-805doi:https://doi.org/10.1115/DETC2004-57731
IDETC-CIE 2004; 807-819doi:https://doi.org/10.1115/DETC2004-57732
IDETC-CIE 2004; 821-826doi:https://doi.org/10.1115/DETC2004-57733
Topics: Cycles
IDETC-CIE 2004; 827-833doi:https://doi.org/10.1115/DETC2004-57734
Topics: Algorithms
IDETC-CIE 2004; 835-846doi:https://doi.org/10.1115/DETC2004-57735
IDETC-CIE 2004; 847-852doi:https://doi.org/10.1115/DETC2004-57736
IDETC-CIE 2004; 853-860doi:https://doi.org/10.1115/DETC2004-57737
IDETC-CIE 2004; 861-871doi:https://doi.org/10.1115/DETC2004-57738
IDETC-CIE 2004; 873-882doi:https://doi.org/10.1115/DETC2004-57739
IDETC-CIE 2004; 883-890doi:https://doi.org/10.1115/DETC2004-57740
IDETC-CIE 2004; 891-900doi:https://doi.org/10.1115/DETC2004-57741
IDETC-CIE 2004; 901-913doi:https://doi.org/10.1115/DETC2004-57742
IDETC-CIE 2004; 915-923doi:https://doi.org/10.1115/DETC2004-57743
IDETC-CIE 2004; 925-934doi:https://doi.org/10.1115/DETC2004-57744
IDETC-CIE 2004; 935-941doi:https://doi.org/10.1115/DETC2004-57745
IDETC-CIE 2004; 943-952doi:https://doi.org/10.1115/DETC2004-57746
IDETC-CIE 2004; 953-959doi:https://doi.org/10.1115/DETC2004-57747
IDETC-CIE 2004; 961-970doi:https://doi.org/10.1115/DETC2004-57748
IDETC-CIE 2004; 971-979doi:https://doi.org/10.1115/DETC2004-57749
IDETC-CIE 2004; 981-987doi:https://doi.org/10.1115/DETC2004-57750
IDETC-CIE 2004; 989-994doi:https://doi.org/10.1115/DETC2004-57751
IDETC-CIE 2004; 995-1001doi:https://doi.org/10.1115/DETC2004-57785
IDETC-CIE 2004; 1003-1018doi:https://doi.org/10.1115/DETC2004-57786
IDETC-CIE 2004; 1019-1030doi:https://doi.org/10.1115/DETC2004-57787
IDETC-CIE 2004; 1031-1039doi:https://doi.org/10.1115/DETC2004-57788
IDETC-CIE 2004; 1041-1047doi:https://doi.org/10.1115/DETC2004-57789
IDETC-CIE 2004; 1049-1051doi:https://doi.org/10.1115/DETC2004-57790
IDETC-CIE 2004; 1053-1064doi:https://doi.org/10.1115/DETC2004-57791
IDETC-CIE 2004; 1065-1073doi:https://doi.org/10.1115/DETC2004-57792
IDETC-CIE 2004; 1075-1081doi:https://doi.org/10.1115/DETC2004-57793
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