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Proceedings Papers

Proceedings Volume Cover
ASME 2004 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 28–October 2, 2004
Salt Lake City, Utah, USA
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4694-6
In This Volume
Volume 1: 30th Design Automation Conference

30th Design Automation Conference

IDETC-CIE 2004; 11-20doi:https://doi.org/10.1115/DETC2004-57048
IDETC-CIE 2004; 21-27doi:https://doi.org/10.1115/DETC2004-57049
IDETC-CIE 2004; 29-38doi:https://doi.org/10.1115/DETC2004-57050
IDETC-CIE 2004; 39-47doi:https://doi.org/10.1115/DETC2004-57061
IDETC-CIE 2004; 49-55doi:https://doi.org/10.1115/DETC2004-57066
IDETC-CIE 2004; 57-64doi:https://doi.org/10.1115/DETC2004-57071
IDETC-CIE 2004; 65-73doi:https://doi.org/10.1115/DETC2004-57076
IDETC-CIE 2004; 75-84doi:https://doi.org/10.1115/DETC2004-57082
IDETC-CIE 2004; 85-91doi:https://doi.org/10.1115/DETC2004-57086
IDETC-CIE 2004; 93-99doi:https://doi.org/10.1115/DETC2004-57091
IDETC-CIE 2004; 101-107doi:https://doi.org/10.1115/DETC2004-57096
IDETC-CIE 2004; 109-122doi:https://doi.org/10.1115/DETC2004-57102
IDETC-CIE 2004; 123-130doi:https://doi.org/10.1115/DETC2004-57115
IDETC-CIE 2004; 131-139doi:https://doi.org/10.1115/DETC2004-57116
IDETC-CIE 2004; 141-148doi:https://doi.org/10.1115/DETC2004-57119
IDETC-CIE 2004; 149-157doi:https://doi.org/10.1115/DETC2004-57133
IDETC-CIE 2004; 159-168doi:https://doi.org/10.1115/DETC2004-57134
IDETC-CIE 2004; 169-178doi:https://doi.org/10.1115/DETC2004-57141
IDETC-CIE 2004; 179-188doi:https://doi.org/10.1115/DETC2004-57149
IDETC-CIE 2004; 189-198doi:https://doi.org/10.1115/DETC2004-57152
IDETC-CIE 2004; 199-205doi:https://doi.org/10.1115/DETC2004-57153
IDETC-CIE 2004; 209-214doi:https://doi.org/10.1115/DETC2004-57156
IDETC-CIE 2004; 215-224doi:https://doi.org/10.1115/DETC2004-57159
IDETC-CIE 2004; 225-233doi:https://doi.org/10.1115/DETC2004-57163
IDETC-CIE 2004; 235-246doi:https://doi.org/10.1115/DETC2004-57165
IDETC-CIE 2004; 247-256doi:https://doi.org/10.1115/DETC2004-57174
Topics: Shapes
IDETC-CIE 2004; 257-266doi:https://doi.org/10.1115/DETC2004-57175
Topics: Design
IDETC-CIE 2004; 267-278doi:https://doi.org/10.1115/DETC2004-57183
IDETC-CIE 2004; 279-291doi:https://doi.org/10.1115/DETC2004-57194
IDETC-CIE 2004; 293-302doi:https://doi.org/10.1115/DETC2004-57195
IDETC-CIE 2004; 303-311doi:https://doi.org/10.1115/DETC2004-57199
IDETC-CIE 2004; 313-320doi:https://doi.org/10.1115/DETC2004-57205
IDETC-CIE 2004; 321-331doi:https://doi.org/10.1115/DETC2004-57211
IDETC-CIE 2004; 333-339doi:https://doi.org/10.1115/DETC2004-57212
IDETC-CIE 2004; 341-349doi:https://doi.org/10.1115/DETC2004-57224
IDETC-CIE 2004; 351-360doi:https://doi.org/10.1115/DETC2004-57225
IDETC-CIE 2004; 361-368doi:https://doi.org/10.1115/DETC2004-57228
IDETC-CIE 2004; 369-378doi:https://doi.org/10.1115/DETC2004-57229
IDETC-CIE 2004; 379-386doi:https://doi.org/10.1115/DETC2004-57235
IDETC-CIE 2004; 387-391doi:https://doi.org/10.1115/DETC2004-57244
IDETC-CIE 2004; 393-401doi:https://doi.org/10.1115/DETC2004-57249
IDETC-CIE 2004; 403-418doi:https://doi.org/10.1115/DETC2004-57254
IDETC-CIE 2004; 419-430doi:https://doi.org/10.1115/DETC2004-57255
IDETC-CIE 2004; 431-436doi:https://doi.org/10.1115/DETC2004-57257
IDETC-CIE 2004; 437-443doi:https://doi.org/10.1115/DETC2004-57258
IDETC-CIE 2004; 445-452doi:https://doi.org/10.1115/DETC2004-57269
IDETC-CIE 2004; 453-465doi:https://doi.org/10.1115/DETC2004-57271
IDETC-CIE 2004; 467-471doi:https://doi.org/10.1115/DETC2004-57298
IDETC-CIE 2004; 473-479doi:https://doi.org/10.1115/DETC2004-57299
IDETC-CIE 2004; 481-492doi:https://doi.org/10.1115/DETC2004-57300
IDETC-CIE 2004; 493-502doi:https://doi.org/10.1115/DETC2004-57301
IDETC-CIE 2004; 503-512doi:https://doi.org/10.1115/DETC2004-57302
IDETC-CIE 2004; 513-518doi:https://doi.org/10.1115/DETC2004-57306
IDETC-CIE 2004; 519-528doi:https://doi.org/10.1115/DETC2004-57327
IDETC-CIE 2004; 529-540doi:https://doi.org/10.1115/DETC2004-57328
IDETC-CIE 2004; 541-552doi:https://doi.org/10.1115/DETC2004-57331
IDETC-CIE 2004; 553-564doi:https://doi.org/10.1115/DETC2004-57332
IDETC-CIE 2004; 565-572doi:https://doi.org/10.1115/DETC2004-57336
IDETC-CIE 2004; 573-582doi:https://doi.org/10.1115/DETC2004-57339
IDETC-CIE 2004; 583-592doi:https://doi.org/10.1115/DETC2004-57342
IDETC-CIE 2004; 593-603doi:https://doi.org/10.1115/DETC2004-57344
IDETC-CIE 2004; 605-611doi:https://doi.org/10.1115/DETC2004-57350
IDETC-CIE 2004; 613-624doi:https://doi.org/10.1115/DETC2004-57357
IDETC-CIE 2004; 627-635doi:https://doi.org/10.1115/DETC2004-57360
IDETC-CIE 2004; 637-645doi:https://doi.org/10.1115/DETC2004-57363
IDETC-CIE 2004; 647-655doi:https://doi.org/10.1115/DETC2004-57366
IDETC-CIE 2004; 657-664doi:https://doi.org/10.1115/DETC2004-57369
IDETC-CIE 2004; 665-674doi:https://doi.org/10.1115/DETC2004-57370
IDETC-CIE 2004; 675-679doi:https://doi.org/10.1115/DETC2004-57376
Topics: Failure
IDETC-CIE 2004; 681-690doi:https://doi.org/10.1115/DETC2004-57377
IDETC-CIE 2004; 691-701doi:https://doi.org/10.1115/DETC2004-57384
IDETC-CIE 2004; 703-708doi:https://doi.org/10.1115/DETC2004-57391
IDETC-CIE 2004; 709-717doi:https://doi.org/10.1115/DETC2004-57400
IDETC-CIE 2004; 719-727doi:https://doi.org/10.1115/DETC2004-57404
IDETC-CIE 2004; 729-738doi:https://doi.org/10.1115/DETC2004-57405
IDETC-CIE 2004; 739-748doi:https://doi.org/10.1115/DETC2004-57410
IDETC-CIE 2004; 749-765doi:https://doi.org/10.1115/DETC2004-57418
IDETC-CIE 2004; 767-771doi:https://doi.org/10.1115/DETC2004-57421
IDETC-CIE 2004; 771-780doi:https://doi.org/10.1115/DETC2004-57429
IDETC-CIE 2004; 781-790doi:https://doi.org/10.1115/DETC2004-57430
IDETC-CIE 2004; 791-799doi:https://doi.org/10.1115/DETC2004-57437
IDETC-CIE 2004; 801-809doi:https://doi.org/10.1115/DETC2004-57438
IDETC-CIE 2004; 811-817doi:https://doi.org/10.1115/DETC2004-57440
IDETC-CIE 2004; 819-827doi:https://doi.org/10.1115/DETC2004-57442
IDETC-CIE 2004; 829-835doi:https://doi.org/10.1115/DETC2004-57446
IDETC-CIE 2004; 837-845doi:https://doi.org/10.1115/DETC2004-57456
IDETC-CIE 2004; 847-855doi:https://doi.org/10.1115/DETC2004-57457
IDETC-CIE 2004; 857-868doi:https://doi.org/10.1115/DETC2004-57458
IDETC-CIE 2004; 869-873doi:https://doi.org/10.1115/DETC2004-57461
IDETC-CIE 2004; 875-883doi:https://doi.org/10.1115/DETC2004-57462
IDETC-CIE 2004; 885-891doi:https://doi.org/10.1115/DETC2004-57463
IDETC-CIE 2004; 893-905doi:https://doi.org/10.1115/DETC2004-57464
IDETC-CIE 2004; 907-914doi:https://doi.org/10.1115/DETC2004-57467
IDETC-CIE 2004; 915-925doi:https://doi.org/10.1115/DETC2004-57471
IDETC-CIE 2004; 927-934doi:https://doi.org/10.1115/DETC2004-57475
IDETC-CIE 2004; 935-944doi:https://doi.org/10.1115/DETC2004-57478
IDETC-CIE 2004; 945-951doi:https://doi.org/10.1115/DETC2004-57479
IDETC-CIE 2004; 953-962doi:https://doi.org/10.1115/DETC2004-57484
IDETC-CIE 2004; 963-972doi:https://doi.org/10.1115/DETC2004-57486
IDETC-CIE 2004; 973-982doi:https://doi.org/10.1115/DETC2004-57492
IDETC-CIE 2004; 983-992doi:https://doi.org/10.1115/DETC2004-57500
IDETC-CIE 2004; 993-997doi:https://doi.org/10.1115/DETC2004-57507
IDETC-CIE 2004; 999-1010doi:https://doi.org/10.1115/DETC2004-57509
IDETC-CIE 2004; 1011-1019doi:https://doi.org/10.1115/DETC2004-57522
Topics: Design
IDETC-CIE 2004; 1021-1035doi:https://doi.org/10.1115/DETC2004-57527
IDETC-CIE 2004; 1037-1046doi:https://doi.org/10.1115/DETC2004-57528
IDETC-CIE 2004; 1047-1057doi:https://doi.org/10.1115/DETC2004-57529
IDETC-CIE 2004; 1059-1070doi:https://doi.org/10.1115/DETC2004-57533
IDETC-CIE 2004; 1071-1076doi:https://doi.org/10.1115/DETC2004-57539
IDETC-CIE 2004; 1077-1085doi:https://doi.org/10.1115/DETC2004-57540
IDETC-CIE 2004; 1087-1093doi:https://doi.org/10.1115/DETC2004-57574
IDETC-CIE 2004; 1095-1100doi:https://doi.org/10.1115/DETC2004-57576
IDETC-CIE 2004; 1101-1109doi:https://doi.org/10.1115/DETC2004-57582
IDETC-CIE 2004; 1111-1119doi:https://doi.org/10.1115/DETC2004-57593
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