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Proceedings Papers

Proceedings Volume Cover
ASME 2002 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 29–October 2, 2002
Montreal, Quebec, Canada
Conference Sponsors:
  • Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-3621-5
In This Volume
Volume 1: 22nd Computers and Information in Engineering Conference

Computers and Information in Engineering

IDETC-CIE 2002; 95-101doi:https://doi.org/10.1115/DETC2002/CIE-34394
IDETC-CIE 2002; 103-109doi:https://doi.org/10.1115/DETC2002/CIE-34395
IDETC-CIE 2002; 111-116doi:https://doi.org/10.1115/DETC2002/CIE-34396
IDETC-CIE 2002; 117-121doi:https://doi.org/10.1115/DETC2002/CIE-34397
IDETC-CIE 2002; 123-128doi:https://doi.org/10.1115/DETC2002/CIE-34398
IDETC-CIE 2002; 129-136doi:https://doi.org/10.1115/DETC2002/CIE-34399
IDETC-CIE 2002; 137-147doi:https://doi.org/10.1115/DETC2002/CIE-34400
IDETC-CIE 2002; 149-152doi:https://doi.org/10.1115/DETC2002/CIE-34401
IDETC-CIE 2002; 153-157doi:https://doi.org/10.1115/DETC2002/CIE-34402
IDETC-CIE 2002; 159-165doi:https://doi.org/10.1115/DETC2002/CIE-34403
IDETC-CIE 2002; 167-176doi:https://doi.org/10.1115/DETC2002/CIE-34404
IDETC-CIE 2002; 177-186doi:https://doi.org/10.1115/DETC2002/CIE-34405
IDETC-CIE 2002; 187-196doi:https://doi.org/10.1115/DETC2002/CIE-34406
IDETC-CIE 2002; 197-203doi:https://doi.org/10.1115/DETC2002/CIE-34407
IDETC-CIE 2002; 205-210doi:https://doi.org/10.1115/DETC2002/CIE-34408
IDETC-CIE 2002; 211-215doi:https://doi.org/10.1115/DETC2002/CIE-34409
IDETC-CIE 2002; 217-224doi:https://doi.org/10.1115/DETC2002/CIE-34410
IDETC-CIE 2002; 225-230doi:https://doi.org/10.1115/DETC2002/CIE-34411
IDETC-CIE 2002; 231-244doi:https://doi.org/10.1115/DETC2002/CIE-34412
IDETC-CIE 2002; 245-252doi:https://doi.org/10.1115/DETC2002/CIE-34413
IDETC-CIE 2002; 253-260doi:https://doi.org/10.1115/DETC2002/CIE-34414
IDETC-CIE 2002; 261-269doi:https://doi.org/10.1115/DETC2002/CIE-34415
IDETC-CIE 2002; 271-279doi:https://doi.org/10.1115/DETC2002/CIE-34418
IDETC-CIE 2002; 281-288doi:https://doi.org/10.1115/DETC2002/CIE-34421
IDETC-CIE 2002; 289-297doi:https://doi.org/10.1115/DETC2002/CIE-34422
IDETC-CIE 2002; 299-304doi:https://doi.org/10.1115/DETC2002/CIE-34426
IDETC-CIE 2002; 305-316doi:https://doi.org/10.1115/DETC2002/CIE-34443
IDETC-CIE 2002; 317-329doi:https://doi.org/10.1115/DETC2002/CIE-34446
IDETC-CIE 2002; 331-336doi:https://doi.org/10.1115/DETC2002/CIE-34449
IDETC-CIE 2002; 337-346doi:https://doi.org/10.1115/DETC2002/CIE-34450
IDETC-CIE 2002; 347-353doi:https://doi.org/10.1115/DETC2002/CIE-34451
IDETC-CIE 2002; 355-363doi:https://doi.org/10.1115/DETC2002/CIE-34453
IDETC-CIE 2002; 365-372doi:https://doi.org/10.1115/DETC2002/CIE-34455
IDETC-CIE 2002; 373-379doi:https://doi.org/10.1115/DETC2002/CIE-34456
IDETC-CIE 2002; 381-390doi:https://doi.org/10.1115/DETC2002/CIE-34457
IDETC-CIE 2002; 391-397doi:https://doi.org/10.1115/DETC2002/CIE-34458
IDETC-CIE 2002; 399-404doi:https://doi.org/10.1115/DETC2002/CIE-34459
IDETC-CIE 2002; 405-410doi:https://doi.org/10.1115/DETC2002/CIE-34460
IDETC-CIE 2002; 411-418doi:https://doi.org/10.1115/DETC2002/CIE-34461
IDETC-CIE 2002; 419-428doi:https://doi.org/10.1115/DETC2002/CIE-34462
IDETC-CIE 2002; 429-443doi:https://doi.org/10.1115/DETC2002/CIE-34463
IDETC-CIE 2002; 445-458doi:https://doi.org/10.1115/DETC2002/CIE-34464
IDETC-CIE 2002; 459-466doi:https://doi.org/10.1115/DETC2002/CIE-34465
IDETC-CIE 2002; 467-479doi:https://doi.org/10.1115/DETC2002/CIE-34466
IDETC-CIE 2002; 481-491doi:https://doi.org/10.1115/DETC2002/CIE-34467
IDETC-CIE 2002; 493-499doi:https://doi.org/10.1115/DETC2002/CIE-34468
IDETC-CIE 2002; 501-508doi:https://doi.org/10.1115/DETC2002/CIE-34469
IDETC-CIE 2002; 509-513doi:https://doi.org/10.1115/DETC2002/CIE-34470
IDETC-CIE 2002; 515-519doi:https://doi.org/10.1115/DETC2002/CIE-34471
IDETC-CIE 2002; 521-531doi:https://doi.org/10.1115/DETC2002/CIE-34472
IDETC-CIE 2002; 533-539doi:https://doi.org/10.1115/DETC2002/CIE-34473
IDETC-CIE 2002; 541-552doi:https://doi.org/10.1115/DETC2002/CIE-34474
IDETC-CIE 2002; 553-559doi:https://doi.org/10.1115/DETC2002/CIE-34475
IDETC-CIE 2002; 561-568doi:https://doi.org/10.1115/DETC2002/CIE-34476
IDETC-CIE 2002; 569-578doi:https://doi.org/10.1115/DETC2002/CIE-34477
IDETC-CIE 2002; 579-587doi:https://doi.org/10.1115/DETC2002/CIE-34478
IDETC-CIE 2002; 589-596doi:https://doi.org/10.1115/DETC2002/CIE-34479
IDETC-CIE 2002; 597-603doi:https://doi.org/10.1115/DETC2002/CIE-34480
Topics: Modeling
IDETC-CIE 2002; 605-616doi:https://doi.org/10.1115/DETC2002/CIE-34481
IDETC-CIE 2002; 617-631doi:https://doi.org/10.1115/DETC2002/CIE-34482
IDETC-CIE 2002; 633-641doi:https://doi.org/10.1115/DETC2002/CIE-34483
IDETC-CIE 2002; 643-653doi:https://doi.org/10.1115/DETC2002/CIE-34484
IDETC-CIE 2002; 655-664doi:https://doi.org/10.1115/DETC2002/CIE-34485
IDETC-CIE 2002; 665-669doi:https://doi.org/10.1115/DETC2002/CIE-34486
IDETC-CIE 2002; 671-677doi:https://doi.org/10.1115/DETC2002/CIE-34487
IDETC-CIE 2002; 679-692doi:https://doi.org/10.1115/DETC2002/CIE-34488
IDETC-CIE 2002; 693-702doi:https://doi.org/10.1115/DETC2002/CIE-34489
IDETC-CIE 2002; 703-714doi:https://doi.org/10.1115/DETC2002/CIE-34490
IDETC-CIE 2002; 715-725doi:https://doi.org/10.1115/DETC2002/CIE-34491
IDETC-CIE 2002; 727-738doi:https://doi.org/10.1115/DETC2002/CIE-34492
IDETC-CIE 2002; 739-746doi:https://doi.org/10.1115/DETC2002/CIE-34493
IDETC-CIE 2002; 747-757doi:https://doi.org/10.1115/DETC2002/CIE-34494
IDETC-CIE 2002; 759-767doi:https://doi.org/10.1115/DETC2002/CIE-34495
IDETC-CIE 2002; 769-783doi:https://doi.org/10.1115/DETC2002/CIE-34496
IDETC-CIE 2002; 785-791doi:https://doi.org/10.1115/DETC2002/CIE-34497
IDETC-CIE 2002; 793-802doi:https://doi.org/10.1115/DETC2002/CIE-34498
IDETC-CIE 2002; 803-812doi:https://doi.org/10.1115/DETC2002/CIE-34500
IDETC-CIE 2002; 813-821doi:https://doi.org/10.1115/DETC2002/CIE-34501
IDETC-CIE 2002; 823-828doi:https://doi.org/10.1115/DETC2002/CIE-34502
IDETC-CIE 2002; 829-833doi:https://doi.org/10.1115/DETC2002/CIE-34503
IDETC-CIE 2002; 835-842doi:https://doi.org/10.1115/DETC2002/CIE-34504
IDETC-CIE 2002; 843-850doi:https://doi.org/10.1115/DETC2002/CIE-34505
IDETC-CIE 2002; 851-856doi:https://doi.org/10.1115/DETC2002/CIE-34506
IDETC-CIE 2002; 857-863doi:https://doi.org/10.1115/DETC2002/CIE-34507
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