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Proceedings Papers

Volume 2: 26th Design Automation Conference

26th Design Automation Conference

Design

Distributed Design/Knowledge-Based Design

IDETC-CIE 2000; 91-100doi:https://doi.org/10.1115/DETC2000/DAC-14222
IDETC-CIE 2000; 101-111doi:https://doi.org/10.1115/DETC2000/DAC-14250
IDETC-CIE 2000; 113-120doi:https://doi.org/10.1115/DETC2000/DAC-14501

Genetic Optimization

IDETC-CIE 2000; 121-130doi:https://doi.org/10.1115/DETC2000/DAC-14231
IDETC-CIE 2000; 131-139doi:https://doi.org/10.1115/DETC2000/DAC-14295
IDETC-CIE 2000; 141-149doi:https://doi.org/10.1115/DETC2000/DAC-14526

Dynamic Systems Analysis

IDETC-CIE 2000; 151-156doi:https://doi.org/10.1115/DETC2000/DAC-14490
IDETC-CIE 2000; 157-163doi:https://doi.org/10.1115/DETC2000/DAC-14534

Simulated Annealing/Optimal Layout

IDETC-CIE 2000; 165-170doi:https://doi.org/10.1115/DETC2000/DAC-14224
IDETC-CIE 2000; 171-177doi:https://doi.org/10.1115/DETC2000/DAC-14227
IDETC-CIE 2000; 179-185doi:https://doi.org/10.1115/DETC2000/DAC-14247
IDETC-CIE 2000; 187-196doi:https://doi.org/10.1115/DETC2000/DAC-14254

Multi-Objective/Multi-Disciplinary Design Optimization

IDETC-CIE 2000; 197-205doi:https://doi.org/10.1115/DETC2000/DAC-14233
IDETC-CIE 2000; 207-214doi:https://doi.org/10.1115/DETC2000/DAC-14512
IDETC-CIE 2000; 215-222doi:https://doi.org/10.1115/DETC2000/DAC-14516
IDETC-CIE 2000; 223-232doi:https://doi.org/10.1115/DETC2000/DAC-14527

Compliant and Spatial Mechanisms

IDETC-CIE 2000; 233-241doi:https://doi.org/10.1115/DETC2000/DAC-14225
IDETC-CIE 2000; 243-250doi:https://doi.org/10.1115/DETC2000/DAC-14518
IDETC-CIE 2000; 251-261doi:https://doi.org/10.1115/DETC2000/DAC-14538

Special Session: Intelligent Design

IDETC-CIE 2000; 263-270doi:https://doi.org/10.1115/DETC2000/DAC-14492
IDETC-CIE 2000; 271-273doi:https://doi.org/10.1115/DETC2000/DAC-14493
IDETC-CIE 2000; 275-277doi:https://doi.org/10.1115/DETC2000/DAC-14494
IDETC-CIE 2000; 279-281doi:https://doi.org/10.1115/DETC2000/DAC-14496

Optimization

IDETC-CIE 2000; 283-292doi:https://doi.org/10.1115/DETC2000/DAC-14253
IDETC-CIE 2000; 293-302doi:https://doi.org/10.1115/DETC2000/DAC-14265
IDETC-CIE 2000; 303-310doi:https://doi.org/10.1115/DETC2000/DAC-14273
IDETC-CIE 2000; 311-318doi:https://doi.org/10.1115/DETC2000/DAC-14299
IDETC-CIE 2000; 319-328doi:https://doi.org/10.1115/DETC2000/DAC-14514
IDETC-CIE 2000; 329-342doi:https://doi.org/10.1115/DETC2000/DAC-14520
IDETC-CIE 2000; 343-347doi:https://doi.org/10.1115/DETC2000/DAC-14523
IDETC-CIE 2000; 349-356doi:https://doi.org/10.1115/DETC2000/DAC-14524

Layered Manufacturing

IDETC-CIE 2000; 357-370doi:https://doi.org/10.1115/DETC2000/DAC-14251
IDETC-CIE 2000; 371-377doi:https://doi.org/10.1115/DETC2000/DAC-14262
IDETC-CIE 2000; 379-387doi:https://doi.org/10.1115/DETC2000/DAC-14285

Robust Design — 1

IDETC-CIE 2000; 389-398doi:https://doi.org/10.1115/DETC2000/DAC-14234
IDETC-CIE 2000; 399-410doi:https://doi.org/10.1115/DETC2000/DAC-14239
IDETC-CIE 2000; 411-420doi:https://doi.org/10.1115/DETC2000/DAC-14240
IDETC-CIE 2000; 421-428doi:https://doi.org/10.1115/DETC2000/DAC-14241
IDETC-CIE 2000; 429-438doi:https://doi.org/10.1115/DETC2000/DAC-14263
IDETC-CIE 2000; 439-448doi:https://doi.org/10.1115/DETC2000/DAC-14271
IDETC-CIE 2000; 449-464doi:https://doi.org/10.1115/DETC2000/DAC-14283
IDETC-CIE 2000; 465-481doi:https://doi.org/10.1115/DETC2000/DAC-14297
IDETC-CIE 2000; 483-491doi:https://doi.org/10.1115/DETC2000/DAC-14486
IDETC-CIE 2000; 493-500doi:https://doi.org/10.1115/DETC2000/DAC-14531
IDETC-CIE 2000; 501-507doi:https://doi.org/10.1115/DETC2000/DAC-14536

Surface Modeling

IDETC-CIE 2000; 509-514doi:https://doi.org/10.1115/DETC2000/DAC-14232
IDETC-CIE 2000; 515-521doi:https://doi.org/10.1115/DETC2000/DAC-14268
IDETC-CIE 2000; 523-533doi:https://doi.org/10.1115/DETC2000/DAC-14277
IDETC-CIE 2000; 535-541doi:https://doi.org/10.1115/DETC2000/DAC-14280

Assembly/Disassembly

IDETC-CIE 2000; 543-552doi:https://doi.org/10.1115/DETC2000/DAC-14228
IDETC-CIE 2000; 553-559doi:https://doi.org/10.1115/DETC2000/DAC-14246
IDETC-CIE 2000; 561-570doi:https://doi.org/10.1115/DETC2000/DAC-14498
IDETC-CIE 2000; 571-578doi:https://doi.org/10.1115/DETC2000/DAC-14530

Solid Modeling/Surface Modeling

IDETC-CIE 2000; 579-586doi:https://doi.org/10.1115/DETC2000/DAC-14229
IDETC-CIE 2000; 587-594doi:https://doi.org/10.1115/DETC2000/DAC-14289
IDETC-CIE 2000; 595-604doi:https://doi.org/10.1115/DETC2000/DAC-14290
IDETC-CIE 2000; 605-610doi:https://doi.org/10.1115/DETC2000/DAC-14510

Automotive Design

IDETC-CIE 2000; 611-613doi:https://doi.org/10.1115/DETC2000/DAC-14495
IDETC-CIE 2000; 615-619doi:https://doi.org/10.1115/DETC2000/DAC-14513
IDETC-CIE 2000; 621-630doi:https://doi.org/10.1115/DETC2000/DAC-14533
IDETC-CIE 2000; 631-642doi:https://doi.org/10.1115/DETC2000/DAC-14537

Parametric Design/Geometric Design

IDETC-CIE 2000; 643-655doi:https://doi.org/10.1115/DETC2000/DAC-14259
IDETC-CIE 2000; 657-664doi:https://doi.org/10.1115/DETC2000/DAC-14275
IDETC-CIE 2000; 665-675doi:https://doi.org/10.1115/DETC2000/DAC-14515

Product Family Design

IDETC-CIE 2000; 677-687doi:https://doi.org/10.1115/DETC2000/DAC-14238
IDETC-CIE 2000; 689-699doi:https://doi.org/10.1115/DETC2000/DAC-14252
IDETC-CIE 2000; 701-710doi:https://doi.org/10.1115/DETC2000/DAC-14264
IDETC-CIE 2000; 711-724doi:https://doi.org/10.1115/DETC2000/DAC-14288

Topology Optimization

IDETC-CIE 2000; 725-730doi:https://doi.org/10.1115/DETC2000/DAC-14266
IDETC-CIE 2000; 731-736doi:https://doi.org/10.1115/DETC2000/DAC-14292
IDETC-CIE 2000; 737-742doi:https://doi.org/10.1115/DETC2000/DAC-14535

System Design

IDETC-CIE 2000; 743-752doi:https://doi.org/10.1115/DETC2000/DAC-14236
IDETC-CIE 2000; 753-761doi:https://doi.org/10.1115/DETC2000/DAC-14243
IDETC-CIE 2000; 763-772doi:https://doi.org/10.1115/DETC2000/DAC-14245
IDETC-CIE 2000; 773-780doi:https://doi.org/10.1115/DETC2000/DAC-14282
IDETC-CIE 2000; 781-786doi:https://doi.org/10.1115/DETC2000/DAC-14511
IDETC-CIE 2000; 787-796doi:https://doi.org/10.1115/DETC2000/DAC-14525
Topics: Design
IDETC-CIE 2000; 797-806doi:https://doi.org/10.1115/DETC2000/DAC-14528

Web-Based Design

IDETC-CIE 2000; 807-814doi:https://doi.org/10.1115/DETC2000/DAC-14502
IDETC-CIE 2000; 815-824doi:https://doi.org/10.1115/DETC2000/DAC-14517
IDETC-CIE 2000; 825-830doi:https://doi.org/10.1115/DETC2000/DAC-14522

Solid Freeform Fabrication

IDETC-CIE 2000; 831-837doi:https://doi.org/10.1115/DETC2000/DAC-14269
IDETC-CIE 2000; 839-848doi:https://doi.org/10.1115/DETC2000/DAC-14278
IDETC-CIE 2000; 849-860doi:https://doi.org/10.1115/DETC2000/DAC-14293
IDETC-CIE 2000; 861-868doi:https://doi.org/10.1115/DETC2000/DAC-14296

Concurrent Product/Process Design

IDETC-CIE 2000; 869-877doi:https://doi.org/10.1115/DETC2000/DAC-14220
IDETC-CIE 2000; 879-887doi:https://doi.org/10.1115/DETC2000/DAC-14221
IDETC-CIE 2000; 889-895doi:https://doi.org/10.1115/DETC2000/DAC-14261
IDETC-CIE 2000; 897-904doi:https://doi.org/10.1115/DETC2000/DAC-14276
IDETC-CIE 2000; 905-911doi:https://doi.org/10.1115/DETC2000/DAC-14503
IDETC-CIE 2000; 913-919doi:https://doi.org/10.1115/DETC2000/DAC-14504
IDETC-CIE 2000; 921-928doi:https://doi.org/10.1115/DETC2000/DAC-14532

Crash Analysis

IDETC-CIE 2000; 929-935doi:https://doi.org/10.1115/DETC2000/DAC-14230
IDETC-CIE 2000; 937-943doi:https://doi.org/10.1115/DETC2000/DAC-14244
IDETC-CIE 2000; 945-953doi:https://doi.org/10.1115/DETC2000/DAC-14248
IDETC-CIE 2000; 955-961doi:https://doi.org/10.1115/DETC2000/DAC-14291

Tolerance Analysis

IDETC-CIE 2000; 963-979doi:https://doi.org/10.1115/DETC2000/DAC-14249
IDETC-CIE 2000; 981-990doi:https://doi.org/10.1115/DETC2000/DAC-14294
IDETC-CIE 2000; 991-999doi:https://doi.org/10.1115/DETC2000/DAC-14499
IDETC-CIE 2000; 1001-1008doi:https://doi.org/10.1115/DETC2000/DAC-14507
Topics: Chain

Computer Aided Engineering Tools

IDETC-CIE 2000; 1009-1016doi:https://doi.org/10.1115/DETC2000/DAC-14488
IDETC-CIE 2000; 1017-1022doi:https://doi.org/10.1115/DETC2000/DAC-14506
IDETC-CIE 2000; 1023-1029doi:https://doi.org/10.1115/DETC2000/DAC-14539

Manufacturing

IDETC-CIE 2000; 1031-1039doi:https://doi.org/10.1115/DETC2000/DAC-14508

Reverse Engineering

IDETC-CIE 2000; 1041-1050doi:https://doi.org/10.1115/DETC2000/DAC-14356
IDETC-CIE 2000; 1051-1060doi:https://doi.org/10.1115/DETC2000/DAC-14487
IDETC-CIE 2000; 1061-1070doi:https://doi.org/10.1115/DETC2000/DAC-14540
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