The large quantities of measurement information gathered throughout a plant process make the closing of the plant balance nearly impossible without the help of additional tools. For this reason, a variety of plant monitoring tools for closing plant balances have been developed. A major problem with the current tools lies in the non-consideration of redundant process information which is available throughout the plant. The monitoring system ProcessPlus™ is based on the process data reconciliation program VALI 4, which is certified according to the VDI 2048 standard and is using all redundant pieces of information within the process. Plausibility checks and structured quality control serve as the foundation for the system. Among other components, a procedural process image, significant diagnosis and monitoring tools have been developed and now offer a fast and economically ideal support for process optimization. This paper describes the methodology according to VDI 2048 and the benefits gained from the use of an online plant monitoring system by means of examples from day-to-day operations.
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17th International Conference on Nuclear Engineering
July 12–16, 2009
Brussels, Belgium
Conference Sponsors:
- Nuclear Engineering Division
ISBN:
978-0-7918-4352-9
PROCEEDINGS PAPER
Global Balance of Plant Using Process Data Reconciliation According to VDI2048
Magnus Langenstein,
Magnus Langenstein
BTB Jansky GmbH, Leonberg, Germany
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Bernd Laipple
Bernd Laipple
BTB Jansky GmbH, Leonberg, Germany
Search for other works by this author on:
Magnus Langenstein
BTB Jansky GmbH, Leonberg, Germany
Bernd Laipple
BTB Jansky GmbH, Leonberg, Germany
Paper No:
ICONE17-75490, pp. 975-981; 7 pages
Published Online:
February 25, 2010
Citation
Langenstein, M, & Laipple, B. "Global Balance of Plant Using Process Data Reconciliation According to VDI2048." Proceedings of the 17th International Conference on Nuclear Engineering. Volume 2: Structural Integrity; Safety and Security; Advanced Applications of Nuclear Technology; Balance of Plant for Nuclear Applications. Brussels, Belgium. July 12–16, 2009. pp. 975-981. ASME. https://doi.org/10.1115/ICONE17-75490
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