In electrokinetically-driven microfluidic applications, reservoirs are indispensable and have finite sizes. During operating processes, as the liquid level in reservoirs keeps changing as time elapses, a backpressure is generated. Thus, the flow in microfluidic channels actually exhibits a combination of the electroosmotic flow and the time-dependent induced backpressure-driven flow. In this paper, a model is presented to describe the effect of the finite reservoir size on electroosmotic flow in a rectangular microchannel. Important parameters that describe the effect of finite reservoir size on flow characteristics are discussed. A new concept termed as “effective pumping period” is introduced to characterize the reservoir size effect. The proposed model identifies the mechanisms of the finite-reservoir size effects and is verified by experiment using the micro-PIV technique. The results reported in this study can be used for facilitating the design of microfluidic devices.
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ASME 2007 5th International Conference on Nanochannels, Microchannels, and Minichannels
June 18–20, 2007
Puebla, Mexico
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4272-X
PROCEEDINGS PAPER
Deviation of Electroosmotic Flow From Plug-Like Profile: The Effect of Reservoir Size
Deguang Yan,
Deguang Yan
Nanyang Technological University, Singapore
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Chun Yang,
Chun Yang
Nanyang Technological University, Singapore
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Xiaoyang Huang
Xiaoyang Huang
Nanyang Technological University, Singapore
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Deguang Yan
Nanyang Technological University, Singapore
Chun Yang
Nanyang Technological University, Singapore
Xiaoyang Huang
Nanyang Technological University, Singapore
Paper No:
ICNMM2007-30023, pp. 169-175; 7 pages
Published Online:
May 28, 2009
Citation
Yan, D, Yang, C, & Huang, X. "Deviation of Electroosmotic Flow From Plug-Like Profile: The Effect of Reservoir Size." Proceedings of the ASME 2007 5th International Conference on Nanochannels, Microchannels, and Minichannels. ASME 5th International Conference on Nanochannels, Microchannels, and Minichannels. Puebla, Mexico. June 18–20, 2007. pp. 169-175. ASME. https://doi.org/10.1115/ICNMM2007-30023
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