An experimental system for in situ high temperature measurements of spectral emissivity of VHTR materials has been designed and constructed. The design consists of a cylindrical block of silicon carbide with several machined cavities for placement of test samples, as well as a black body cavity. The block is placed inside a furnace for heating to temperatures up to 1000°C. A shutter system allows for selective exposure of any given test sample for emissivity measurements. An optical periscope guides the thermal radiation from the sample to a Fourier Transform Infra Red (FTIR) spectrometer which is used for real-time measurements of spectral emissivity over a wavelength range of 0.8μm to 10μm. To specifically address the needs of VHTR applications, the system has been designed for studies with VHTR grade helium environments and air transients. Inlet and outlet gas compositions are measured using a gas chromatograph, which in conjunction with ex situ analysis of the samples by electron microscopy and x-ray diffraction will allow for the correlation of surface corrosion of the materials and their spectral emissivities under different operating and accident conditions.
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Fourth International Topical Meeting on High Temperature Reactor Technology
September 28–October 1, 2008
Washington, DC, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4855-5
PROCEEDINGS PAPER
System for High Temperature Spectral Emissivity Measurement of Materials for VHTR Applications
Stuart R. Slattery
,
Stuart R. Slattery
University of Wisconsin, Madison, WI
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Tamara L. Malaney
,
Tamara L. Malaney
University of Wisconsin, Madison, WI
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Scott J. Weber
,
Scott J. Weber
University of Wisconsin, Madison, WI
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Mark H. Anderson
,
Mark H. Anderson
University of Wisconsin, Madison, WI
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Kumar Sridharan
,
Kumar Sridharan
University of Wisconsin, Madison, WI
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Todd R. Allen
Todd R. Allen
University of Wisconsin, Madison, WI
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Stuart R. Slattery
University of Wisconsin, Madison, WI
Tamara L. Malaney
University of Wisconsin, Madison, WI
Scott J. Weber
University of Wisconsin, Madison, WI
Mark H. Anderson
University of Wisconsin, Madison, WI
Kumar Sridharan
University of Wisconsin, Madison, WI
Todd R. Allen
University of Wisconsin, Madison, WI
Paper No:
HTR2008-58053, pp. 691-698; 8 pages
Published Online:
July 1, 2009
Citation
Slattery, SR, Malaney, TL, Weber, SJ, Anderson, MH, Sridharan, K, & Allen, TR. "System for High Temperature Spectral Emissivity Measurement of Materials for VHTR Applications." Proceedings of the Fourth International Topical Meeting on High Temperature Reactor Technology. Fourth International Topical Meeting on High Temperature Reactor Technology, Volume 2. Washington, DC, USA. September 28–October 1, 2008. pp. 691-698. ASME. https://doi.org/10.1115/HTR2008-58053
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