The Very High Temperature Reactor (VHTR) has been selected by the U.S. as the Generation IV technology for the Next Generation Nuclear Plant (NGNP), and both the U.S. and Japan have been developing VHTR concepts based on a prismatic, block-type core design. For these VHTR concepts, the primary coolant (helium) inlet temperature is expected to be in the range 490°C to 590°C and the outlet temperature is expected to be in the range 850°C to 950°C. Passive safety is one of the fundamental requirements for the VHTR, and the VHTR is designed to be passively safe even during Loss of Coolant Accidents (LOCAs) and Loss of Flow Accidents (LOFAs). For the VHTR, these two transient events are referred to as a Low-Pressure Conduction Cooldown (LPCC) and High-Pressure Conduction Cooldown (HPCC), respectively. During both events, the decay heat is conducted through the graphite to the vessel. The heat is transferred from the vessel by thermal radiation and natural convection to a passive Reactor Cavity Cooling System (RCCS). In this paper, we describe parametric studies of LPCC and HPCC events using a 30-degree sector, 3-dimensional ANSYS model of the VHTR, which includes a detailed radiation exchange model between the RPV and RCCS.
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Fourth International Topical Meeting on High Temperature Reactor Technology
September 28–October 1, 2008
Washington, DC, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4854-8
PROCEEDINGS PAPER
Parametric Assessments of High-Pressure and Low-Pressure Conduction Cooldown Events for the VHTR
Nobumasa Tsuji,
Nobumasa Tsuji
Fuji Electric Systems, Kawasaki, Japan
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Masaaki Nakano,
Masaaki Nakano
Fuji Electric Systems, Kawasaki, Japan
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Matt Richards
Matt Richards
General Atomics, San Diego, CA
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Nobumasa Tsuji
Fuji Electric Systems, Kawasaki, Japan
Masaaki Nakano
Fuji Electric Systems, Kawasaki, Japan
Matt Richards
General Atomics, San Diego, CA
Paper No:
HTR2008-58271, pp. 757-766; 10 pages
Published Online:
July 1, 2009
Citation
Tsuji, N, Nakano, M, & Richards, M. "Parametric Assessments of High-Pressure and Low-Pressure Conduction Cooldown Events for the VHTR." Proceedings of the Fourth International Topical Meeting on High Temperature Reactor Technology. Fourth International Topical Meeting on High Temperature Reactor Technology, Volume 1. Washington, DC, USA. September 28–October 1, 2008. pp. 757-766. ASME. https://doi.org/10.1115/HTR2008-58271
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