An AFM based method for characterization of thermal transport properties of electrically conductive individual nanowires and nanowire-substrate interfaces has been developed. Nanostructures are located by topographic imaging in regular tapping mode and are then subsequently probed by an AFM cantilever tip, with a conductive coating thus establishing electrical contact at different positions on the nanowire followed by current-voltage data acquisition. This experimental approach can be implemented for a system with nanostructures in contact with the surface and, in the other case, suspended between electrodes. These configurations allow for characterization of both thermal conductivity and nano-interface thermal resistance. This work presents the technique along with the subsequent measurements of nano-interface thermal resistance of nanowire-substrate junction using the aforesaid technique.

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