This article presents a total concentration method for two-dimensional wet chemical etching. The proposed procedure is a fixed-grid approach. It is analogous to the enthalpy method used for modeling melting/solidification problems. The governing equation is formulated using the total concentration of the etchant. It includes the reacted and the unreacted concentrations of the etchant. The proposed governing equation includes the interface condition. The reacted concentration is used to capture the etchant-substrate interface implicitly. Since the grids are fixed, a diffusion problem remains a diffusion problem unlike the moving grid approach where the diffusion problem becomes the convection-diffusion problem due to the mesh velocity. For demonstration purposes, the finite volume method is used to solve for the transient concentration distribution of etchant. In this article, two-dimensional diffusion-controlled wet chemical etching processes are modeled. The results obtained from the proposed total concentration method are compared with available “analytic” solutions and solutions from moving-grid approach.
Skip Nav Destination
ASME 2005 Summer Heat Transfer Conference collocated with the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems
July 17–22, 2005
San Francisco, California, USA
Conference Sponsors:
- Heat Transfer Division and Electronic and Photonic Packaging Division
ISBN:
0-7918-4733-0
PROCEEDINGS PAPER
A Total-Concentration Fixed-Grid Method for Two-Dimensional Diffusion-Controlled Wet Chemical Etching
P. Rath,
P. Rath
Nanyang Technological University, Singapore
Search for other works by this author on:
J. C. Chai,
J. C. Chai
Nanyang Technological University, Singapore
Search for other works by this author on:
H. Y. Zheng,
H. Y. Zheng
Singapore Institute of Manufacturing Technology, Singapore
Search for other works by this author on:
Y. C. Lam,
Y. C. Lam
Nanyang Technological University, Singapore
Search for other works by this author on:
V. M. Murukeshan
V. M. Murukeshan
Nanyang Technological University, Singapore
Search for other works by this author on:
P. Rath
Nanyang Technological University, Singapore
J. C. Chai
Nanyang Technological University, Singapore
H. Y. Zheng
Singapore Institute of Manufacturing Technology, Singapore
Y. C. Lam
Nanyang Technological University, Singapore
V. M. Murukeshan
Nanyang Technological University, Singapore
Paper No:
HT2005-72186, pp. 113-119; 7 pages
Published Online:
March 9, 2009
Citation
Rath, P, Chai, JC, Zheng, HY, Lam, YC, & Murukeshan, VM. "A Total-Concentration Fixed-Grid Method for Two-Dimensional Diffusion-Controlled Wet Chemical Etching." Proceedings of the ASME 2005 Summer Heat Transfer Conference collocated with the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems. Heat Transfer: Volume 3. San Francisco, California, USA. July 17–22, 2005. pp. 113-119. ASME. https://doi.org/10.1115/HT2005-72186
Download citation file:
9
Views
Related Proceedings Papers
Related Articles
An Interfacial Tracking Method for Ultrashort Pulse Laser Melting and Resolidification of a Thin Metal Film
J. Heat Transfer (June,2008)
Related Chapters
Numerical Study on Dynamic Charging Performance of Packed Bed Using Spherical Capsules Containing N-Tetradecane
Inaugural US-EU-China Thermophysics Conference-Renewable Energy 2009 (UECTC 2009 Proceedings)
The Special Characteristics of Closed-Cycle Gas Turbines
Closed-Cycle Gas Turbines: Operating Experience and Future Potential
Short-Pulse Collimated Radiation in a Participating Medium Bounded by Diffusely Reflecting Boundaries
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3