A non-intrusive diagnostic technique, infrared micro-particle image velocimetry (IR-PIV), is developed for measuring flow fields within MEMS devices with micron-scale resolution. This technique capitalizes on the transparency of silicon in the infrared region, and overcomes the limitation posed by the lack of optical access with visible light to sub-surface flow in silicon-based micro-structures. Experiments with laminar flow of water in a circular micro-capillary tube of hydraulic diameter 255 μm demonstrate the efficacy of this technique. The experimental measurements agree very well with velocity profiles predicted from laminar theory. Cross-correlation and auto-correlation algorithms are employed to measure very-low and moderate-to-high velocities, respectively; the former approach is suitable for biomedical applications while the latter would be needed for measurements in electronics cooling. The results indicate that the IR-PIV technique effectively extends the application of regular micro-PIV techniques, and has great potential for flow measurements in silicon-based microdevices.
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ASME 2004 Heat Transfer/Fluids Engineering Summer Conference
July 11–15, 2004
Charlotte, North Carolina, USA
Conference Sponsors:
- Heat Transfer Division and Fluids Engineering Division
ISBN:
0-7918-4693-8
PROCEEDINGS PAPER
Infrared Micro-Particle Image Velocimetry of Fluid Flow in Silicon-Based Microdevices
Suresh V. Garimella,
Suresh V. Garimella
Purdue University, West Lafayette, IN
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Steve T. Wereley
Steve T. Wereley
Purdue University, West Lafayette, IN
Search for other works by this author on:
Dong Liu
Purdue University, West Lafayette, IN
Suresh V. Garimella
Purdue University, West Lafayette, IN
Steve T. Wereley
Purdue University, West Lafayette, IN
Paper No:
HT-FED2004-56385, pp. 399-405; 7 pages
Published Online:
February 24, 2009
Citation
Liu, D, Garimella, SV, & Wereley, ST. "Infrared Micro-Particle Image Velocimetry of Fluid Flow in Silicon-Based Microdevices." Proceedings of the ASME 2004 Heat Transfer/Fluids Engineering Summer Conference. Volume 4. Charlotte, North Carolina, USA. July 11–15, 2004. pp. 399-405. ASME. https://doi.org/10.1115/HT-FED2004-56385
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