An isothermal thin-film flow over a rotating plate has been simulated using the depth-averaged Eulerian Thin-Film modelling (ETFM) approach. The model setup is based on published experimental and numerical Volume of Fluid (VOF) CFD studies of the same problem to allow for model validation. A range of controlled film inlet heights and mass flow rates are explored together with varied plate rotational speeds ranging from a stationary plate (50rpm) to 200 rpm. While the VOF model has previously been shown to accurately reproduce film thickness, the Eulerian thin-film model is shown to provide predictions of comparable accuracy at a much lower computational cost. The model is also shown to be able to reproduce the film solution’s sensitivity to variations in fluid properties due to changes in inlet temperature. A full 3D domain has been used in this study and the ETFM model is also shown to be able to reproduce azimuthal film thickness variations and surface features similar to those previously observed in experiments.

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