We will discuss a new slotted-plate device to directly measure static yield stresses of complex multiphase systems. Possible wall effects associated with our earlier yield-stress plate instrument have been minimized. Our new setup avoids the disadvantages of the vane instrument. Yield stress values on a variety of systems have been obtained and have been compared with the values obtained via a variety of other methods.
Volume Subject Area:Flows in Manufacturing Processes
Topics:Yield stress, Instrumentation
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