We will discuss a new slotted-plate device to directly measure static yield stresses of complex multiphase systems. Possible wall effects associated with our earlier yield-stress plate instrument have been minimized. Our new setup avoids the disadvantages of the vane instrument. Yield stress values on a variety of systems have been obtained and have been compared with the values obtained via a variety of other methods.
Structure, Multiphase Systems and Yield Stress
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De Kee, D, & Zhu, L. "Structure, Multiphase Systems and Yield Stress." Proceedings of the ASME/JSME 2003 4th Joint Fluids Summer Engineering Conference. Volume 1: Fora, Parts A, B, C, and D. Honolulu, Hawaii, USA. July 6–10, 2003. pp. 2519-2524. ASME. https://doi.org/10.1115/FEDSM2003-45789
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