Particle image velocimetry (PIV) often employs the cross-correlation function to identify average particle displacement in an interrogation window. The quality of correlation peak has a strong dependence on the signal-to-noise ratio (SNR), or contrast of the particle images. In fact, variable-contrast particle images are not uncommon in the PIV community: Strong light sheet intensity variations, wall reflections, multiple scattering in densely-seeded regions and two-phase flow applications are likely sources of local contrast variations. In this paper, we choose an image pair obtained in a micro-scale mixing experiment with severe local contrast gradients. In regions where image contrast is sufficiently poor, the noise peaks cast a shadow on the true correlation peak, producing erroneous velocity vectors. This work aims to demonstrate that two image pre-processing techniques — local contrast normalization and Difference of Gaussian (DoG) filter — improve the correlation results significantly in poor-contrast regions.
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ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis
July 12–14, 2010
Istanbul, Turkey
Conference Sponsors:
- International
ISBN:
978-0-7918-4919-4
PROCEEDINGS PAPER
Poor-Contrast Particle Image Processing in Microscale Mixing
F. Go¨khan Ergin,
F. Go¨khan Ergin
Dantec Dynamics A/S, Skovlunde, Denmark
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Bo Beltoft Watz,
Bo Beltoft Watz
Dantec Dynamics A/S, Skovlunde, Denmark
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Kaspars Erglis,
Kaspars Erglis
University of Latvia, Riga, Latvia
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Andrejs Cebers
Andrejs Cebers
University of Latvia, Riga, Latvia
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F. Go¨khan Ergin
Dantec Dynamics A/S, Skovlunde, Denmark
Bo Beltoft Watz
Dantec Dynamics A/S, Skovlunde, Denmark
Kaspars Erglis
University of Latvia, Riga, Latvia
Andrejs Cebers
University of Latvia, Riga, Latvia
Paper No:
ESDA2010-24900, pp. 649-653; 5 pages
Published Online:
December 28, 2010
Citation
Ergin, FG, Watz, BB, Erglis, K, & Cebers, A. "Poor-Contrast Particle Image Processing in Microscale Mixing." Proceedings of the ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis. ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis, Volume 5. Istanbul, Turkey. July 12–14, 2010. pp. 649-653. ASME. https://doi.org/10.1115/ESDA2010-24900
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