A method for in-process surface normal estimation from point cloud data is presented. The method enables surface normal estimation immediately after coordinates of points are measured. Such an approach allows in-process computational registration, used for collision and occlusion avoidance during dimensional inspection with high-precision point-based range sensors. The most commonly used sensor path for inspection with high-precision point-based range sensors is a raster scan path. A novel neighborhood identification approach for raster scanned point cloud data is presented. Quadratic polynomials are used to model the local geometry of the surface, from which the surface normal is estimated for the point. Implementation of the method through simulations and on a real part shows the normal estimation error to be within 0.1°.
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ASME 2008 9th Biennial Conference on Engineering Systems Design and Analysis
July 7–9, 2008
Haifa, Israel
Conference Sponsors:
- International
Volume 1: Advanced Energy Systems; Advanced and Digital Manufacturing; Advanced Materials; Aerospace
ISBN:
978-0-7918-4835-7
PROCEEDINGS PAPER
In-Process Surface Normal Estimation for Raster Scanned Point Cloud Data
Vijay Srivatsan,
Vijay Srivatsan
University of Michigan, Ann Arbor, MI
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Reuven Katz
Reuven Katz
University of Michigan, Ann Arbor, MI
Search for other works by this author on:
Vijay Srivatsan
University of Michigan, Ann Arbor, MI
Reuven Katz
University of Michigan, Ann Arbor, MI
Paper No:
ESDA2008-59007, pp. 109-116; 8 pages
Published Online:
July 6, 2009
Citation
Srivatsan, V, & Katz, R. "In-Process Surface Normal Estimation for Raster Scanned Point Cloud Data." Proceedings of the ASME 2008 9th Biennial Conference on Engineering Systems Design and Analysis. Volume 1: Advanced Energy Systems; Advanced and Digital Manufacturing; Advanced Materials; Aerospace. Haifa, Israel. July 7–9, 2008. pp. 109-116. ASME. https://doi.org/10.1115/ESDA2008-59007
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