Through measurement of hysteresis and drift in a piezoelectrically driven multi-axis multi-positioner nanomanipulator, we have quantified error over ranges of three primary operating parameters: gain, duty cycle, and actuation time. A total of sixty-nine curves were plotted, and error and drift measured in a single operating plane. All data shown were collected on the Zyvex L-100 nanomanipulator operating in an open-loop programmed method, in both coarse (12mm range, 2–5 μm precision) and fine mode (100 μm range, 10–50 nm precision). In general, the normalized error was reduced at larger actuation distances and in coarse mode. These results may be used to define optimum operating conditions for piezoelectrically actuated nanomanipulators and micromanipulators whereby the goal is to find a balance between speed and accuracy. The results also are intended to allow for optimal control in closed-loop operation and for task-oriented and pick-and-place operations.
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ASME 8th Biennial Conference on Engineering Systems Design and Analysis
July 4–7, 2006
Torino, Italy
ISBN:
0-7918-4249-5
PROCEEDINGS PAPER
Parameterization of a Piezoelectric Nanomanipulation Device
Ravi Patel,
Ravi Patel
Drexel University, Philadelphia, PA
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Benjamin Legum,
Benjamin Legum
Drexel University, Philadelphia, PA
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Yury Gogotsi,
Yury Gogotsi
Drexel University, Philadelphia, PA
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Bradley Layton
Bradley Layton
Drexel University, Philadelphia, PA
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Ravi Patel
Drexel University, Philadelphia, PA
Benjamin Legum
Drexel University, Philadelphia, PA
Yury Gogotsi
Drexel University, Philadelphia, PA
Bradley Layton
Drexel University, Philadelphia, PA
Paper No:
ESDA2006-95147, pp. 939-945; 7 pages
Published Online:
September 5, 2008
Citation
Patel, R, Legum, B, Gogotsi, Y, & Layton, B. "Parameterization of a Piezoelectric Nanomanipulation Device." Proceedings of the ASME 8th Biennial Conference on Engineering Systems Design and Analysis. Volume 2: Automotive Systems, Bioengineering and Biomedical Technology, Fluids Engineering, Maintenance Engineering and Non-Destructive Evaluation, and Nanotechnology. Torino, Italy. July 4–7, 2006. pp. 939-945. ASME. https://doi.org/10.1115/ESDA2006-95147
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