In order to measure the near-field radiative heat transfer between a microsphere and a substrate, we have developed a sensitive technique using a bi-material atomic force microscope (AFM) cantilever. In this paper, we use this technique to measure the near-field radiation between a silica microsphere and substrates made of different materials (semiconductor, metal and polar dielectric materials). The resulting “Conductance-distance” curves show the presence of the near-field radiation enhancement caused by surface phonon-polaritons.
- Nanotechnology Institute
Near-Field Radiation Between a Sphere and Substrates of Different Materials
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Shen, S, Narayanaswamy, A, & Chen, G. "Near-Field Radiation Between a Sphere and Substrates of Different Materials." Proceedings of the ASME 2008 3rd Energy Nanotechnology International Conference collocated with the Heat Transfer, Fluids Engineering, and Energy Sustainability Conferences. ASME 2008 3rd Energy Nanotechnology International Conference. Jacksonville, Florida, USA. August 10–14, 2008. pp. 71-74. ASME. https://doi.org/10.1115/ENIC2008-53004
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