We report in-plane and through-plane conductivity measurements of dense YSZ films varying in thickness from 20 to 200 nm. In-plane measurements were performed on YSZ films grown on silicon wafers coated with SiO2 or Si3N4. Micro-fabricated strips with Pt electrodes in various geometries were used to obtain conductivity as a function of temperature from 200 – 600 °C in a custom-designed micro-probe station. These films have activation energies, which vary from 0.77 to 1.09 eV. Their absolute conductivity is lower compared with other reports. Through-plane and fuel cell measurements were performed by depositing YSZ on a nitrided silicon wafer, then etching through the wafer and depositing porous platinum electrodes on both sides [6,7]. We discuss the electrochemical conduction studies in detail along with fuel cell performance and correlation with electrode microstructure.
- Nanotechnology Institute
Structural and Electrochemical Studies on Thin-Film Yttria-Doped Zirconia Electrolytes for Microscale Solid Oxide Fuel Cells
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Johnson, AC, & Ramanathan, S. "Structural and Electrochemical Studies on Thin-Film Yttria-Doped Zirconia Electrolytes for Microscale Solid Oxide Fuel Cells." Proceedings of the ASME 2008 3rd Energy Nanotechnology International Conference collocated with the Heat Transfer, Fluids Engineering, and Energy Sustainability Conferences. ASME 2008 3rd Energy Nanotechnology International Conference. Jacksonville, Florida, USA. August 10–14, 2008. pp. 23-24. ASME. https://doi.org/10.1115/ENIC2008-53042
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