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Proc. ASME. DSCC2009, ASME 2009 Dynamic Systems and Control Conference, Volume 1, 781-788, October 12–14, 2009
Paper No: DSCC2009-2712
... 17 09 2010 This paper presents an Euler-Bernoulli microcantilever beam model utilized in non-contact Atomic Force Microscopy (AFM) systems. A distributed-parameters modeling is considered for such system. The motions of the microcantilever are studied in a general Cartesian coordinate...