Atomic force microscopes use a probe to interface with matter at the nanoscale through a variety of imaging or manipulation methods. A dual-probe atomic force microscope (DP-AFM) has been proposed for simultaneous imaging and manipulation. One challenge of DP-AFM is probe-to-probe contact, which may occur intentionally such as when locating one probe with the other. This work studies the stability for such interactions where the 1st probe is in the tapping mode (typically used for imaging) and 2nd probe is in the contact mode (typically used for manipulation). A state dependent switched model is proposed for DP-AFM. A theorem is proposed for uniformly ultimately bounded (UUB) stability of switched systems under a sequence nonincreasing condition and applied to the DP-AFM problem.
- Dynamic Systems and Control Division
Uniform Ultimate Boundedness of Probe-to-Probe Dynamics in Dual Probe Atomic Force Microscopy
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Al-Ogaidi, A, & Bristow, D. "Uniform Ultimate Boundedness of Probe-to-Probe Dynamics in Dual Probe Atomic Force Microscopy." Proceedings of the ASME 2014 Dynamic Systems and Control Conference. Volume 1: Active Control of Aerospace Structure; Motion Control; Aerospace Control; Assistive Robotic Systems; Bio-Inspired Systems; Biomedical/Bioengineering Applications; Building Energy Systems; Condition Based Monitoring; Control Design for Drilling Automation; Control of Ground Vehicles, Manipulators, Mechatronic Systems; Controls for Manufacturing; Distributed Control; Dynamic Modeling for Vehicle Systems; Dynamics and Control of Mobile and Locomotion Robots; Electrochemical Energy Systems. San Antonio, Texas, USA. October 22–24, 2014. V001T12A005. ASME. https://doi.org/10.1115/DSCC2014-6307
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