During the past decade significant research has been aimed at better understanding for human immunodeficiency virus type 1 (HIV-1), and the use of mathematical modeling to interpret experimental results has made a significant contribution. However, time-delays, which play a critical role in various biological models, are still not amenable to many traditional analysis methods. In this paper, we apply a recently developed approach using the Lambert W function to handle the time delay in a HIV-1 pathogenesis dynamic model. Dominant eigenvalues in the infinite eigenspectrum of these time-delay systems are obtained and used to understand the effects of the parameters of the model on the immune system. Also, the result is extended to analyze the sensitivity of the eigenvalues with respect to the parameters in the HIV-1 model. The research makes it possible to know which parameters are more influential than others, and the obtained information is used to investigate the HIV-1 dynamic system analytically.
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ASME 2008 Dynamic Systems and Control Conference
October 20–22, 2008
Ann Arbor, Michigan, USA
Conference Sponsors:
- Dynamic Systems and Control Division
ISBN:
978-0-7918-4335-2
PROCEEDINGS PAPER
Eigenvalues and Sensitivity Analysis for a Model of HIV-1 Pathogenesis With an Intracellular Delay
Patrick W. Nelson,
Patrick W. Nelson
University of Michigan, Ann Arbor, MI
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A. Galip Ulsoy
A. Galip Ulsoy
University of Michigan, Ann Arbor, MI
Search for other works by this author on:
Sun Yi
University of Michigan, Ann Arbor, MI
Patrick W. Nelson
University of Michigan, Ann Arbor, MI
A. Galip Ulsoy
University of Michigan, Ann Arbor, MI
Paper No:
DSCC2008-2408, pp. 1549-1557; 9 pages
Published Online:
June 29, 2009
Citation
Yi, S, Nelson, PW, & Ulsoy, AG. "Eigenvalues and Sensitivity Analysis for a Model of HIV-1 Pathogenesis With an Intracellular Delay." Proceedings of the ASME 2008 Dynamic Systems and Control Conference. ASME 2008 Dynamic Systems and Control Conference, Parts A and B. Ann Arbor, Michigan, USA. October 20–22, 2008. pp. 1549-1557. ASME. https://doi.org/10.1115/DSCC2008-2408
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