Micro-Nano-technology (MNT) development efforts for aerospace applications face significant challenges in rapidly and efficiently transitioning aerospace MNT development from the low technology-readiness-level (TRL) stage found primarily in the research and development community to a mid and high TRL within the systems developer community. This paper explores and highlights some opportunities for more efficiently linking these two TRL stages using directed international patent information analysis as a core method. Possible injection of systematic methodologies of patent information analysis at certain points of a project development flow are suggested. Practical case examples in aerospace MNT suggest that such analysis may have significant potential to qualitatively enhance frameworks for accelerated transitioning of aerospace MNT development to the high TRL stage and to commercialization.
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CANEUS 2006: MNT for Aerospace Applications
August 27–September 1, 2006
Toulouse, France
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4254-1
PROCEEDINGS PAPER
Aerospace Micro-Nano-Technology High Technology-Readiness-Level Acceleration Using Directed Patent Information Analysis Available to Purchase
George Kapsalas
George Kapsalas
Registered Patent Agent, Athens, Greece
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George Kapsalas
Registered Patent Agent, Athens, Greece
Paper No:
CANEUS2006-11075, pp. 339-346; 8 pages
Published Online:
August 15, 2008
Citation
Kapsalas, G. "Aerospace Micro-Nano-Technology High Technology-Readiness-Level Acceleration Using Directed Patent Information Analysis." Proceedings of the CANEUS 2006: MNT for Aerospace Applications. CANEUS2006: MNT for Aerospace Applications. Toulouse, France. August 27–September 1, 2006. pp. 339-346. ASME. https://doi.org/10.1115/CANEUS2006-11075
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