The numerical diffusion of the discretization of the convection term is investigated. The quantitative evaluation method for the numerical diffusion is proposed. The method evaluates the influence of the numerical diffusion to the shape and the thickness of the free surface by the rate of dullness and blur, respectively. High-order schemes are compared with each other using the proposed method in a two-dimensional simple flow and a two-dimensional collapsing water column. As a result, Chakravarthy-Osher (CO) method and Compressive Interface Capture Scheme for Arbitrary Meshes (CICSAM) are more accurate than other schemes in a two-dimensional simple flow. In the collapsing water column, CICSAM is more accurate than CO. CICSAM with the anti-diffusion operation is lower than CICSAM in the rate of dullness and blur. It is shown that the proposal quantitative evaluation method is able to quantify the numerical diffusion.
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ASME/JSME 2011 8th Thermal Engineering Joint Conference
March 13–17, 2011
Honolulu, Hawaii, USA
Conference Sponsors:
- Heat Transfer Division
ISBN:
978-0-7918-3892-1
PROCEEDINGS PAPER
Quantitative Evaluation of the Thickness of the Free Surface by the Interface-Tracking Method
Y. Saito,
Y. Saito
Tohoku University, Sendai, Miyagi, Japan
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K. Yasumura,
K. Yasumura
Tohoku University, Sendai, Miyagi, Japan
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M. Shoji,
M. Shoji
Tohoku University, Sendai, Miyagi, Japan
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Y. Matsushita,
Y. Matsushita
Kyushu University, Kasuga, Fukuoka, Japan
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T. Miura,
T. Miura
Tohoku University, Sendai, Miyagi, Japan
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S. Ogasawara,
S. Ogasawara
Hachinohe Institute of Technology, Hachinohe, Aomori, Japan
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M. Daikoku,
M. Daikoku
Hachinohe Institute of Technology, Hachinohe, Aomori, Japan
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M. Shirota,
M. Shirota
Hirosaki University, Hirosaki, Aomori, Japan
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T. Inamura
T. Inamura
Hirosaki University, Hirosaki, Aomori, Japan
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Y. Saito
Tohoku University, Sendai, Miyagi, Japan
K. Yasumura
Tohoku University, Sendai, Miyagi, Japan
M. Shoji
Tohoku University, Sendai, Miyagi, Japan
Y. Matsushita
Kyushu University, Kasuga, Fukuoka, Japan
H. Aoki
Tohoku University, Sendai, Miyagi, Japan
T. Miura
Tohoku University, Sendai, Miyagi, Japan
S. Ogasawara
Hachinohe Institute of Technology, Hachinohe, Aomori, Japan
M. Daikoku
Hachinohe Institute of Technology, Hachinohe, Aomori, Japan
M. Shirota
Hirosaki University, Hirosaki, Aomori, Japan
T. Inamura
Hirosaki University, Hirosaki, Aomori, Japan
Paper No:
AJTEC2011-44100, T10023; 8 pages
Published Online:
March 1, 2011
Citation
Saito, Y, Yasumura, K, Shoji, M, Matsushita, Y, Aoki, H, Miura, T, Ogasawara, S, Daikoku, M, Shirota, M, & Inamura, T. "Quantitative Evaluation of the Thickness of the Free Surface by the Interface-Tracking Method." Proceedings of the ASME/JSME 2011 8th Thermal Engineering Joint Conference. ASME/JSME 2011 8th Thermal Engineering Joint Conference. Honolulu, Hawaii, USA. March 13–17, 2011. T10023. ASME. https://doi.org/10.1115/AJTEC2011-44100
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